专利摘要:
The invention relates to a device (1) for estimating a parameter of a polymer material. According to the invention, the device is characterized by at least one infrared source (101), able to send to the polymer material a first infrared radiation (111), having at least one line of prescribed wavelength corresponding to the detection at least one aging tracer of the polymeric material (M), at least one infrared detector (102), adapted to receive a second infrared radiation, which is reflected by the polymeric material (M) in response to the sending of the first infrared radiation (111), a unit for determining the parameter of the polymeric material (M) as a function of the at least one line of wavelength prescribed in the second infrared radiation (112).
公开号:FR3059104A1
申请号:FR1661235
申请日:2016-11-18
公开日:2018-05-25
发明作者:Alejandro Ribes Cortes;Mohamed Ben Chouikha
申请人:Electricite de France SA;Universite Pierre et Marie Curie Paris 6;
IPC主号:
专利说明:

Holder (s): ELECTRICITE DE FRANCE Public limited company, UNIVERSITE PIERRE ET MARIE CURIE (PARIS 6) Public establishment.
Extension request (s)
Agent (s): REGIMBEAU.
154) DEVICE AND METHOD FOR ESTIMATING A PARAMETER OF A POLYMERIC MATERIAL.
FR 3 059 104 - A1 (ü / J The invention relates to a device (1) for estimating a parameter of a polymer material.
According to the invention, the device is characterized by at least one infrared source (101), capable of sending a first infrared radiation (111) to the polymer material, having at least one line of prescribed wavelength, corresponding to the detection at least one tracer for aging the polymer material (M), at least one infrared detector (102), capable of receiving a second infrared radiation, which is reflected by the polymer material (M) in response to the sending of the first infrared radiation (111), a unit for determining the parameter of the polymeric material (M) as a function of the at least one line of wavelength prescribed in the second infrared radiation (112).
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The invention relates to a device for estimating a parameter of a polymer material.
One field of application of the invention relates to polymers used for coating walls or pipes, in particular in nuclear power plants for the production of electricity.
The present invention relates to the measurement of one or more parameters on materials which can be, in a nonlimiting manner:
- The polymer coatings, typically the paints constituting the paints,
- Polymer components such as, for example, fluid transport pipes,
-Electric cables.
Such paints or components are found in the industrial environment, for example nuclear power generation sites where severe temperature and humidity conditions are encountered which these paints and components must withstand. In the safety benchmark applicable to nuclear power plants, it is required that the sealing properties of surface coatings such as polymer paints applied to the interior walls of the concrete forming the enclosures of reactor buildings, withstand severe temperature conditions and humidity. Peeling or tearing off such coverings can lead to clogging and clogging the emergency spraying circuit known by the acronym AES injecting water by spraying in droplets inside the enclosure of the reactor building during, for example operating tests or in the event of an accident which has led to the release of hot water leading to a significant increase in pressure and temperature inside the enclosure, causing the linings to be torn off, situation for which the AES backup system is designed.
These requirements relate more generally to all polymer-based materials, for example so-called high-density polymer tubes or pipes, where the circulating fluids can be at high temperatures. Here the relevant control must be done on the inner surface of said tube. Another example where monitoring is required is that of electrical cables, also of polymer composition, where degradation is synonymous with loss of electrical insulation.
The requirements according to the regulatory and safety benchmarks specific to each industry require the operator to monitor the condition of surface coatings, such as paints, and certain components such as pipes and cables. As soon as they are of polymeric structure, a suitable control method must be implemented.
In the case for example of coatings applied in a nuclear power plant, on the internal walls of the buildings of nuclear power plants which must provide a sealing function, it is well known that visual checks do not make it possible to estimate as a parameter a real state of aging such as for example cracks or puffs, with regard to the criterion sought. Indeed, either cracks or puffiness appear and the diagnosis of advanced deterioration is immediately pronounced, or none of these symptoms appear and the operator cannot comment. Even if no degradation is visible to the naked eye, it may already have arisen within the microstructure of the thin layer of the coating, a sign of deterioration, synonymous with a loss of characteristics. such as waterproofing. Under these conditions, it has been shown that the coating, although healthy in appearance, will not withstand the test of a large transient of temperature and humidity, which can peel off the coatings applied to further constitute penalizing waste for the operator.
The challenge is therefore to anticipate such situations through the relevant evaluation of a state of aging, even before the appearance of the first weaknesses.
Thus, the operator is looking for a method of measuring degradation, which anticipates maintenance needs with regard to previously defined degradation criteria and a previously fixed maintenance program.
It is known, for the control of coatings, to produce control briquettes during the production phase of the paints. The witness briquettes are painted with the polymer coating, then stored in cupboards inside the building concerned. This method is based on the assumption that the aging of the briquettes will be representative of the aging of the protective coatings. In a programmed manner, the control briquettes are checked in an analysis laboratory. This involves regular transport (round trip) of the control briquettes between their storage location and the analysis laboratory. Several drawbacks are encountered:
Briquettes are sometimes lost or damaged during transport. Coring in the concrete of a wall, for example of a nuclear power plant building, is then necessary to replace the control briquettes. This operation requires fairly heavy maintenance actions because the holes created by the cores must be filled and repainted.
The state of aging of the briquette coating is not entirely representative of that of the entire building.
Another problem may be to check that a specific polymer is present. For example, in the environment indicated above, it may be desired to check that the product forming, for example, a seal, does indeed consist of a polymeric material specified in specifications, in reactor buildings in the environment indicated above. above or in other environments, and more generally other industrial buildings in such varied environments.
The present invention aims to overcome the drawbacks of the state of the art and to solve the problem indicated above in order to allow a parameter of a polymer material to be estimated.
To this end, a first object of the invention is a device for estimating at least one parameter of a polymer material, characterized in that the device comprises:
at least one infrared source, capable of sending a first infrared radiation to the polymer material, having at least one emission spectral line having at least one prescribed wavelength, corresponding to the detection of at least one aging tracer of the polymer material, at least one infrared detector, capable of receiving a second infrared radiation, which is reflected by the polymer material in response to the sending of the first infrared radiation, a unit for determining the parameter of the polymer material as a function of the at least a line having the wavelength prescribed in the second infrared radiation.
According to one embodiment of the invention, the first infrared radiation has at least one emission spectral zone containing the spectral line having the at least one prescribed wavelength, corresponding to the detection of the at least one aging tracer of the polymeric material.
According to one embodiment of the invention, the parameter is the presence and / or content of the at least one aging tracer in the polymer material.
According to one embodiment of the invention, the parameter is an identification of the polymer.
According to one embodiment of the invention, the at least one infrared source is capable of sending the first infrared radiation to the polymer material in the form of one or more time pulses.
According to one embodiment of the invention, the time pulse or pulses are rectangular.
According to one embodiment of the invention, control means are provided for switching on the at least one infrared detector in a synchronous manner with the time pulse (s).
According to one embodiment of the invention, the device comprises a control means for carrying out several first measurements of the second infrared radiation during a first prescribed time width included in or equal to a respective time width of at least one of the pulses, for calculating an estimate of a first value representative of the first measurements, the parameter being calculated from at least the first value.
According to one embodiment of the invention, the device comprises a control means for carrying out several second measurements of the second infrared radiation during a second prescribed time width included in or equal to a respective time width between two successive pulses, to calculate an estimate of a second value representative of the second measurements, the parameter being calculated at least from the difference between the first value and the second value.
According to one embodiment of the invention, the device further comprises at least one manual control member for triggering the sending of the first infrared radiation by the at least one infrared source.
According to an embodiment of the invention, the at least one infrared source is at least one infrared light-emitting diode or at least one laser source.
According to one embodiment of the invention, the at least one spectral line of prescribed wavelength is chosen in the wavelength interval ranging from 2 μm to 10 μm, that is to say in an interval of wave number from 1000 cm ' 1 to 5000 cm' 1 .
According to one embodiment of the invention, at least two spectral lines of distinct prescribed wavelengths are provided as spectral line.
According to one embodiment of the invention, the at least one spectral line of prescribed wavelength is chosen in at least one of the wavelengths 10 pm, 9.5 pm, 7.2 pm, 6 pm, 3.5 pm.
According to one embodiment of the invention, the first infrared radiation has at least one emission spectral zone containing the spectral line having the at least one prescribed wavelength, corresponding to the detection of the at least one aging tracer of the polymer material, the width at half height of the at least one emission spectral zone containing the at least one line of prescribed wavelength is less than or equal to 1 μm.
According to one embodiment of the invention, the device comprises at least one filter or filtering unit or circuit for the suppression or attenuation of a DC component in a signal, having been supplied by the infrared detector from the second infrared radiation.
According to one embodiment of the invention, the determination unit is configured to calculate the parameter of the polymer material as a function at least of the amplitude of a detection signal obtained from the infrared detector and from the second radiation infrared received in a spectral region around the at least one prescribed wavelength corresponding to the at least one spectral line
According to one embodiment of the invention, the determination unit is configured to calculate the parameter of the polymer material as a function of the amplitude of a detection signal obtained from the infrared detector and from the second received infrared radiation. in a spectral region around the at least one prescribed wavelength corresponding to the at least one spectral line, with respect to the amplitude of a transmission signal used to control the at least one infrared source to send the first infrared radiation having the at least one spectral line at the at least one wavelength prescribed in the first infrared radiation.
According to one embodiment of the invention, the device comprises a cooling module, for cooling the at least one infrared detector and / or a cooling module, for cooling the at least one infrared source.
According to one embodiment of the invention, the device comprises a thermostat and an electronic automatic temperature stabilization unit which is connected to the cooling module, to maintain the at least one infrared detector and / or the at least one infrared source at a temperature prescribed by the thermostat.
According to one embodiment of the invention, the device has the form of a pistol comprising a grip handle connected to a sighting module comprising at a front end remote from the handle the at least one infrared source and the at least one detector infrared, the gun comprising at least one manual control member for triggering the sending of the first infrared radiation by the at least one infrared source, the manual control member being located near an area of the gun connecting the handle to the aimed.
According to one embodiment of the invention, the at least one source and / or the at least one infrared detector are covered by at least one external unit, the at least one source and / or the at least one infrared detector being able to emitting the first and second infrared radiation and receiving the second infrared radiation through the outer block which is transparent to them and which is turned towards the polymeric material.
According to one embodiment of the invention, the device comprises a support guard against the polymer material, the external block having an external distal surface, which is both oriented towards the polymer material and which is set back with respect to an outer distal surface of the guard, also facing the surface of the polymeric material.
A second object of the invention is a method for estimating at least one parameter of a polymer material, characterized in that one sends by at least one infrared source, to the polymer material a first infrared radiation characterized by at least a spectral emission line having at least a prescribed wavelength, corresponding to the detection of the at least one aging tracer of the polymer material, a second infrared radiation is received by at least one infrared detector, which is reflected by the material polymer in response to the sending of the first infrared radiation, the parameter of the polymer material is determined by a determination unit as a function of the at least one spectral line of wavelength prescribed in the second infrared radiation.
The invention will be better understood on reading the description which follows, given solely by way of nonlimiting example with reference to the appended drawings, in which:
the figure 1-a represents a general modular block diagram of the estimation device according to an embodiment of the invention, the figure 1-b represents a part of the estimation device according to an embodiment of the invention, the figure 2 is a modular block diagram of an acquisition part of the measurements of the estimation device according to an embodiment of the invention, FIG. 3 represents the variations of the infrared spectral reflectance of a polymer, as a function of the inverse of the wavelength on the abscissa, FIG. 4 represents a timing diagram of a control signal from an infrared source of the estimation device according to an embodiment of the invention, FIG. 5 represents a timing diagram of measurements performed by the infrared detector of the estimation device according to one embodiment of the invention, FIG. 6 is a modular block diagram of the estimation device according to one embodiment of the invention tion.
We describe below embodiments of the device 1 for estimating a parameter of a polymer material M and a method of estimating a parameter of a polymer material M implemented using of this device 1. This parameter can be the presence of at least one aging tracer and / or the content of at least one aging tracer and / or the identification of the polymer material M.
In the figures, the device 1 for estimating the parameter comprises one or more infrared source (s) 101, one or more infrared detector (s) 102 and a unit 2 for determining the parameter.
In general, according to the invention, the infrared source (s) 101 send to the polymer material M a first infrared radiation 111 having one or more spectral line (s) of emission of prescribed wavelength (s), corresponding to the detection of at least one aging tracer for the polymer material.
According to one embodiment, each infrared source is with a narrow band of emission wavelength containing the prescribed wavelength, called of interest or also peak of interest, corresponding to the aging tracer of the polymer material M.
According to one embodiment, the infrared source emits only in at least one emission spectral zone (or band) containing the emission spectral line or around the emission spectral line having the prescribed wavelength of infrared radiation corresponding to the detection of the aging tracer of the polymer material M.
According to one embodiment, the infrared source 101 is an infrared light-emitting diode. Such a diode emits in the aforementioned emission spectral zone, located around the aforementioned line. This emission spectral area can for example be represented by a Gaussian centered on the spectral line corresponding to the maximum energy emitted. The diode can therefore be characterized by the line and the band in which the line is located.
According to another embodiment, the infrared source 101 is a laser source. Such a laser source is substantially monochromatic. In this case, the source emits only at the prescribed wavelength, or in an emission spectral zone of substantially zero width around the aforementioned line.
According to one embodiment, the device 1 can comprise a surface 1010 in which or under which the source (s) 101 and / or the infrared detector (s) 102 are located and which is intended to be facing the polymer material M to be tested. In one embodiment, the source (s) 101 and / or the infrared detector (s) 102 are covered by at least one external block 1011, which is transparent to the first and second infrared radiation (s) ) 111 and 112 and arranged so that the distal face 1013 of the outer block is as close as possible to the surface 200 of the polymer material M without being in contact with the latter. This external unit 1011 makes it possible to transmit the radiation 111 from the infrared source (s) 101 to the material M and from the material M to the infrared detector (s) without alterations, other than the modifications of paths of the first and second infrared radiation (s) 111 and 112 due to the refraction ίο according to the laws of geometric optics as shown in Figure 1-b for this embodiment. The thin volume 1014 left vacant between the distal face 1013 and the surface 200 of the polymer material M limits the disturbances caused by the presence of air on the measurement by interacting with the infrared radiation (s) 111 and / or 112 and prevents the oxygen contained in the air from attenuating the radiation by absorption at specific wavelengths. This block can for example be made of germanium.
The infrared detector (s) 102 are configured to receive a second infrared radiation 112, which is reflected by the polymeric material M (by the surface 200 thereof) in response to the sending of the first infrared radiation 111 from the infrared source (s) 101.
The device 1 comprises a unit 2 for determining the parameter of the polymer material M as a function of the at least one spectral emission line having the wavelength prescribed in the second infrared radiation 112.
In the case of at least one emission spectral zone (or band) containing the emission spectral line or around the emission spectral line, as for example in the case of a diode as source 101, and in the absence of any other source of radiation, the energy of the second radiation is included in the band associated with the diode which performs the emission. The infrared detector 102 does not know the concept of band but integrates only the energy which comes from the source, such as the diode for example. It is thus thus created a band at the reception.
According to one embodiment, the unit 2 determines the parameter of the polymer material M as a function of the presence and / or the amplitude of a second signal obtained from the infrared detector 102 and from the second infrared radiation 112 at the prescribed wavelength (s) corresponding to the spectral line (s).
The determination unit 2 can be configured to calculate the parameter of the polymer material M as a function of the calculated ratio of the amplitude of the second signal obtained from the infrared detector 102 and from the second infrared radiation 112 to the at least one length. waveform corresponding to the at least one spectral line, divided by the amplitude of a first signal used to control the at least one infrared source 101 to send the first infrared radiation 111 having the at least one spectral line to the at minus a prescribed wavelength.
According to one embodiment of the invention, the at least one spectral line R1, R2, R3, R4, R5 of prescribed wavelength is chosen in the wavelength interval ranging from 2 μm to 10 μm, i.e. in the wavelength range from 1000 cm ' 1 to 5000 cm' 1 . According to one embodiment of the invention, the width at mid-height of the at least one spectral region B1, B2, B3, B4, B5 of emission containing the at least one line RI, R2, R3, R4, R5 of prescribed wavelength is less than or equal to 1 µm. According to one embodiment of the invention, the width at half-height (FWM) of the at least one emission spectral region B1, B2, B3, B4, B5 containing the at least one line RI, R2, R3, R4, R5 of prescribed wavelength is greater than or equal to 0.2 pm and less than or equal to 1 pm. For example, this the width at half height of the at least one emission spectral area B1, B2, B3, B4, B5 containing the at least one line RI, R2, R3, R4, R5 of prescribed wavelength can be equal to 0.2 pm.
According to one embodiment of the invention, the at least one spectral line RI, R2, R3, R4, R5 of prescribed wavelength is chosen in at least one of the wavelengths described below, in particular at 6 pm and / or 9.5 pm and / or at 3.5 pm and / or 7.2 pm and / or at 10 pm, respectively, corresponding respectively to lines of interest RI, R2, R3, R4, R5 for the determination of a parameter of the polymer material M.
According to one embodiment, in the case where the parameter is the presence of an aging tracer and / or the content of at least one aging tracer, this presence and / or this content are determined from the line (s) RI, R2, R3 R4, R5 at the prescribed wavelength (s) in the second infrared radiation 112, and optionally infrared emission spectral band (s) Bl , B2, B3, B4, B5 respectively around the line (s) RI, R2, R3 R4, R5.
In the case where the parameter is the identification of the polymeric material M, the unit 2 may also include comparison means for comparing the at least one spectral band (B1, B2, B3, B4, B5) of emission around line (s) (RI, R2, R3, R4, R5) of prescribed wavelength in the second infrared radiation 112 to at least one prerecorded spectral signature of at least one predetermined polymer, to identify the polymer material M with respect to said predetermined polymer.
In the case where the parameter is the identification of the polymer material M, the unit 2 also includes comparison means for comparing
- on the one hand, the detection signal from the infrared detector (s) 112 (or response (s) from the infrared detector (s)), obtained from the second infrared radiation 112, in the band (s) around the line (s) at the prescribed wavelength (s) (for example in amplitude of the detection signal and prescribed wavelength (s) ( s),
- on the other hand one or more characteristic values (amplitude of the detection signal and prescribed wavelength (s)) of spectral line (s) or spectral signatures, which have been prerecorded in a memory of unit 2 and which have been predetermined for one or more polymeric material (s) having known identification (s) (composition for example), to determine whether the line (s) (s) spectral (s) of the second infrared radiation 112 correspond to the characteristic values or to the spectral signatures of known identifications.
In the text, the values given in pm are wavelengths each included in an emission band of infrared radiation, the values given in cm ' 1 are numbers of waves defined as the inverse of a length of wave and more use among chemists, the first being more use among manufacturers of optical equipment, optoelectronics. Similarly, the use of the word line expressed by an R will correspond to a spectral line of wavelength dimensioned in pm emitted in an emission band B of infrared radiation, the use of the word peak or peak of interest expressed by a P will correspond to a spectral peak of wave number dimensioned in cm ′ 1 characteristic of a component of interest of a polymer material M.
The estimation device 1 can be used for all polymers (in particular paints, neoprenes, electric cables, etc.). In particular the spectral line at 6 pm corresponds to the oxidation of all the polymers which is revealed via the carbonyl. In fact, the carbonyl manifests around 1700 cm -1 forming a peak of interest PI corresponding in the following to a first line RI of wavelength prescribed at about 6 pm included in its emission band B1. for example, the aging of neoprenes is also due to other causes (its charge degrades) which appear between approximately 1000 cm ' 1 and approximately 1100 cm' 1 and we observe it thanks to a second line R2 of length d 'wave prescribed at about 9.5 pm, or 1050 cm' 1 forming a peak of interest P2. A third line R3 is located at a wavelength prescribed at around 3.5 μm, corresponding to a peak of interest P3 located at around 2900 cm -1 . Beyond 3000 cm ' 1 , other causes of aging are observed, applicable to different modes of aging of all, or of certain polymers. For example, there is a spectral line of prescribed wavelength with its associated band by mode of aging.
For example, the carbonyl concentration is an aging tracer which can be determined using the Beer-Lambert law. This physical parameter, which will act as a tracer of aging, is directly responsible for oxidative degradation.
Whatever the type of component or epoxy coating, as soon as it is of polymeric structure, the generation of the first aging occurs at the scale of the structure of the material, at the molecular level. Experiments have shown that an analysis of the infrared reflectance spectra, according to a statistical processing by functional boxplot which graphically represents the statistical curves of the infrared reflectance (density of presence on the ordinate) according to FIG. 3, made it possible to reveal peaks d interest in which deterioration of polymers appears.
The functional Boxplot method is a statistical method derived from the box mustache, applicable to functions and not to a set of scalars.
These peaks are made to correspond to lines at infrared frequencies where the statistical dispersion of the curves obtained by functional boxplot is wide, especially towards the peak P2 at approximately 1050 cm −1 and the peak P4 at approximately 1350 cm −1 corresponding to the second line spectral R2 and to a fourth spectral line R4 respectively of wavelength prescribed at approximately 9.5 pm and 7.2 pm respectively. The detector 102 placed in these regions of the spectrum makes it possible to characterize the aging. According to one embodiment, each peak of interest or line of interest corresponds to a spectral zone where the relevant information is found for the detection of the aging tracer and for the estimation of the parameter. This relevant information could be found by statistical analysis via the Functional BoxPlot method.
In the case of polymers, the analysis relates to the spectrum of the reflectance after emission of IR wave in the band of the middle infrared; it is from this reflectance that the singularities are observed after a statistical analysis.
Figure 3 shows an example of a functional boxplot. It represents the variations in the reflectance of the infrared radiation 111, 112 on the ordinate as a function of the inverse of the wavelength on the abscissa in cm ' 1 . In FIG. 3, a distinction is made between the quartiles of the density function, namely:
1) In black the median curve,
2) In dark gray all the curves between the 25% and 75% functional quartiles, i.e. 50% of the central data,
0 3) In light gray all the curves between 5% and 95%, ie the data limits without outliers (in English: outliers).
In this figure 3, the outliers are not shown.
Thus, Figure 3 shows, marked with arrows, the lines RI, R2, R3, R4, R5 corresponding to peaks of interest. In particular, Figure 3 shows the fifth line
5 spectral R5 at approximately a fifth peak P5 of interest at 1000 cm -1 , corresponding to a prescribed wavelength of approximately 10 μm, and the second spectral line R2 at approximately the second peak of interest P2 at approximately 1050 cm ' 1 corresponding to a prescribed wavelength of about 9.5 pm correspond to the peaks of silica and to that of hydrolyzed silica respectively.
According to one embodiment, an infrared source is characterized by a spectral band B where the emission occurs, this band is around a spectral line R where, in general, the energy of the emission is maximum.
The spectral band emitted by the infrared source (s) can be chosen around one or more of the spectral line (s) RI, R2, R3, R4, R5. In particular, at least two distinct spectral lines can be chosen.
According to one embodiment, said spectral lines of interest are monitored after processing the parasitic signals caused by the temperature of the materials radiating in these spectral bands and causing a very significant noise which must be erased.
Thus, it suffices to carry out infrared shots in the narrow wavelength spectral bands around one or more of the above lines and to measure the relative density of the reflectance to characterize aging.
The preferred domain chosen for the projected beam and therefore the measurement of its reflectance is preferably situated in the wavelength interval [1000 cm ′ 1 ; 4000 cm ' 1 ] as shown in the example of FIG. 3, which corresponds to the associated wavelength interval [2.5 pm; 10 pm]. This choice results from the fact that from 10 pm the measurement means become expensive, and that below 2.5 pm there is no relevant observation.
According to one embodiment, there are as many infrared sources 101 emitting around the prescribed wavelengths spectral lines as there are peaks or lines of interest.
According to one embodiment, the infrared source 101 is directive for emitting the first infrared radiation in a first determined direction towards the polymer material M. For example, in the case of a diode for the source 101, the diode may include a lens . For a given source 101, the detector 102 will ideally be placed so that the reflection of the second infrared radiation 112 measured has a reflection angle equal to the angle of incidence of the first infrared radiation 111 sent and where all the energy emitted (or almost) is found in the second reflected infrared radiation 112; we are therefore looking for a specular reflection from which the reflectance will come.
Of course, the reflection of the polymer material M could also be diffuse, in the half-space delimited by the surface 200 of the polymer material, in which the device 1 is located.
According to one embodiment, the at least one infrared detector 102 is capable of receiving an infrared reflectance spectrum of the polymeric material M in response to the first infrared radiation (s) 111 sent by the one or more infrared source (s) 101. According to one embodiment, the at least one infrared detector 102 is capable of receiving in the second infrared radiation 112 the spectral line (s) RI, R2, R3, R4, R5 at or at the prescribed wavelengths. According to one embodiment, the at least one infrared detector 102 is capable of receiving in the second infrared radiation 112 the band or bands B1, B2, B3, B4, B5 located around the spectral line or lines RI, R2, R3, R4, R5 at the prescribed wavelength (s). The reception wavelength band of the infrared detector 102 comprises for example at least the prescribed wavelength (s) and / or the spectral line (s) RI, R2, R3, R4, R5 of prescribed wavelength (s) and / or the band (s) of wavelengths emitted by the infrared source (s) 101. The at least one infrared detector 102 may for example be broadband in reception wavelength. According to one embodiment, the at least one infrared detector 102 is placed in the specular and / or diffuse reflection of the material M. The at least one infrared detector 102 is a photo-detector which may for example be of the photodiode or photoconductive type . For example, the infrared detector 102 is able to generate an electric photo-current as a function of the second infrared radiation 112. Acquisition electronics make it possible to acquire the analog signal coming from the infrared detector 102.
According to one embodiment, the infrared source (s) 101 are capable of sending the first infrared radiation 111 in the form of one or more temporal pulse (s) i to the polymer material M, i + 1, i + 2, which can for example be rectangular (s), as shown in FIG. 4. According to one embodiment, the device 1 comprises a module 12 for controlling the source or sources 101 by a signal of impulse control, which may for example be rectangular and / or periodic with a prescribed repetition frequency f R , so that the source or sources emit the first infrared radiation lll in the form of one or more time pulses, for example rectangular and / or periodic .
The successive time pulses i, i + 1, i + 2 emitted by the infrared source 101 may for example each have a temporal width (first ON state of the infrared source 101) respective ii, tî + i and tî + 2 prescribed, and have respective beginnings Ai, A i + i and A i + 2 of successive pulses i, i + 1, i + 2 which are temporally spaced by the durations 1) and T i + i respectively. Between the pulses i, i + 1, i + 2 being in the ON state, the source 101 is in the second OFF state (for example low or off) different from the first ON state (for example high or on), this state OFF between successive pulses i and i + 1 having a duration Tî-tî.
According to one embodiment, the pulses i, i + 1, i + 2 can be repeated with a prescribed period T, each duration 1) then being equal to the period T = T; = Ti + i, corresponding to a repetition frequency f R = l / T. According to one embodiment, the respective time widths ii, Tî + i and tî + 2 of the pulses can be equal to the same time width τ = τ, = τ, + ι = Ti + 2 .
For example, Tî + i <Ί) and Tî + 2 <1)
Of course, the respective time widths ii, tî + i and tî + 2 could be different from each other. Of course, the durations 1) and T i + i could be different from each other.
This characteristic makes it possible to detect the line (s) of wavelength (s) prescribed in the second infrared radiation 112 received from the polymer material M, even in the presence of the thermal radiation of this polymer material M. This thermal radiation is due to the temperature of the measured sample (polymer material M) and is continuously emitted with an energy which can be up to about a thousand times greater than that of the second infrared radiation 112 reflected by this polymer material M in a strip. narrow spectral around the spectral line (s) of prescribed wavelength, which therefore disturbs the detection of this second radiation 112 and the measured reflectance.
According to one embodiment, the device 1 comprises at least one manual control member 103 for triggering the sending of the first infrared radiation 111 by the at least one infrared source 101, for example according to a time pulse or a burst of the time pulses i , i + 1, i + 2. According to one embodiment, the manual control member 103 can be prestressed by a prestressing member (for example a spring or the like) to return to a first non-actuating position which does not trigger the sending of the first infrared radiation 111 by the source 101, from its second manual actuation position triggering the sending of the first infrared radiation 111 by the source 101, the control member being movable between one and the other of these first and second positions. The user must thus keep the control member 103 pressed in the second manual actuation position to trigger the sending of the first infrared radiation 111 by the source 101. The manual control member 103 may be of the button or trigger type .
According to one embodiment, the infrared detector (s) 102 are controlled synchronously with the source (s) 101, as shown in FIGS. 4, 5 and 6. The device 1 or the unit 2 may include control means for switching on the at least one infrared detector 102 in a synchronous manner with the time pulse (s) (i, i + 1, i + 2).
According to one embodiment, the control module 12 is connected both to the source (s) 101 and to the infrared detector (s) 102, so that the infrared detector (s) (s) 102 is switched on during the time pulses i, i + 1, i + 2 (being in the first ON state of time width ij), as represented for example in FIG. 5 by the points representing the values measured, and either off (second OFF state different from first ON state) between time pulses i, i + 1, i + 2.
According to one embodiment, the control module 12 is connected both to the source (s) 101 and to the infrared detector (s) 102, so that the infrared detector (s) (s) 102 is switched on during the time pulses i, i + 1, i + 2 (being in the first ON state of time width ij), as represented for example in FIG. 5 by the points representing the values measured, and is also switched on (second OFF state different from the first ON state) between the time pulses i, i + 1, i + 2, as shown by way of example in FIG. 5. According to a mode In one embodiment, the infrared detector 102 performs several measurements of the second infrared radiation 112 received (represented by the dots in FIG. 5) during each time pulse i, i + 1, i + 2.
As shown in FIG. 5, according to one embodiment, the device 1 comprises a control means 21 for carrying out several first measurements 300 of the second infrared radiation 112 during a first prescribed time width γη comprised in or equal to the width respective time τ, from the first ON state of the pulse i (so we have γη <τ,), to calculate an estimate of a first value Αή_ 0Λί representative of the first measurements 300 made during the prescribed time width γη, the parameter being calculated from the first value Αή_ 0Λί .
According to one embodiment, the device 1 comprises a control means 21 for carrying out several second measurements 301 of the second infrared radiation 112 during a second prescribed time width γ, 2 included in or equal to the respective time width Tî-tî of the second state OFF between pulse i and the following pulse i + 1 or between the respective time width Tm-tm of the second state OFF between pulse i and the preceding pulse i-1 (we therefore have γ, 2 <Tj- ii or γ, 2 <Tm-tm), to calculate an estimate of a
0 second value M ^ opp representative of the second measurements 301 during the second prescribed temporal width γ; 2 , the parameter being calculated from the second value M ^^ p.
According to one embodiment, the parameter is calculated from the first value Αή_ 0Λί and the second value M._ OFF , for example from the
5 difference calculated between the first value Αή_ 0Λί and the second value M ^^ p. This compensates for the zero offsets of the 300 measurements from the ON state with respect to the OFF state.
According to one embodiment, the first value Αή_ 0Λί is calculated from a selection of the first measurements 300 having less than a prescribed deviation from this first value AÏ ; ._ OJV . According to one embodiment, the second value M ^ opp is calculated from a selection of the second measurements 301 having less than a prescribed deviation from this second value M ^ opp. This eliminates the outliers (or "outliers", represented by crosses in Figure 5) among measures 300 and 301. According to one embodiment, the multiple measures of Figure 5, acquired during a pulse i, are used to reduce electronic noise, since a statistical treatment is applied to these measurements. According to one embodiment, the first value M t _ ON can for example be a median of the first measurements 300, a robust estimate of the mean of the first measurements 300 or another central estimate (non-Gaussian). According to one embodiment, the second value M ^ opp can for example be a median of the second measures 301, a robust estimate of the mean of the second measures 301 or another central estimate (non-Gaussian). According to one embodiment, a frequency processing (by the filter 11) is applied to the first value M t _ ON , or to the calculated difference between the first value M t _ ON and the second value M ^ opp free from the thermal noise of the polymer sample M.
We describe below embodiments of the determination unit 2, with reference to FIGS. 2 and 6.
According to one embodiment, the device 1 comprises extraction means for extracting from the second infrared radiation 112 received from the infrared detector (s) 102 the response of the polymer material M to the spectral line (s) prescribed wavelength (s) sent by the infrared source (s) 101 and / or to the band (s) around the spectral line (s) . These extraction means include for example one or more of the elements described below.
According to one embodiment, the device 1 comprises at least one circuit and / or filter 11 for suppressing or attenuating a continuous component in a signal, having been supplied by the infrared detector 102 from the second infrared radiation 112 All bodies with a temperature above absolute zero emit as a function of temperature, radiation which follows Planck's law defining the monochromatic emittance of the black body as a function of the wavelength and its absolute temperature. At room temperature the emission range is below the range of long red waves and it is invisible to the human eye. The emissivity of an object indicates the amount of radiated infrared energy. Objects measured by the device 1 tend to emit this thermal radiation in the wavelength range from 1 to 20 µm. Therefore, the second infrared radiation 112 received by the infrared detector 102 will be composed of a continuous component and an alternative component (the second infrared radiation 112 of response to the first infrared radiation 111 having the spectral line (s) (s) prescribed).
According to one embodiment, the circuit and / or the filter 11 is at least one circuit and / or at least one high-pass filter of the device 1 and / or at least one bandpass filter of the device 1. This makes it possible not to pass only the spectrum of the useful signal and eliminate the thermal radiation corresponding to the continuous component of the spectrum. The decomposition into Fourier series of the second infrared radiation 112 present gives a spectrum consisting of a continuous component representing the average value of the signal and a series of harmonics whose amplitude varies with the frequency in sin (x) / x . For example, the high pass filter can be first order. A first-order high-pass filter having a cutoff frequency of 1 / (2T), where T is the repetition period of the time pulses, makes it possible to considerably attenuate the DC component. On the other hand, the DC component of the restored signal depends on the attenuation of the filter. This problem is not important in our case because the amplitude of the rectangular signal can be determined by the difference between the high pulses and the low pulses. An amplifier, not shown, can be provided downstream of the filter 11. An amplifier 10 and a high-pass filter 11 can be provided, for recovering from the filtered signal the rectangular signal generated by the radiation 111 from the sources.
A test bench was set up to validate the proposed pulsed acquisition architecture. In a single-channel prototype constructed by way of nonlimiting example, a source 102 formed by a light-emitting diode was controlled by a rectangular pulse control signal with a repetition frequency f R of 4 kHz and a duty cycle of 20%. The bench consists of the infrared detector, a light emitting diode and a transimpedance amplifier. The objective was to generate, in the photo-detector (infrared detector), a rectangular signal sufficiently smaller than the signal generated by the temperature. We used an LED emitting a rectangular signal. The photo-current from the detector is then sent to the transimpedance amplifier. The measurement of the DC component gives a photo-current of the order of 40A which would correspond to the signal created by thermal radiation. The signal was then filtered (high pass) and amplified in order to reconstruct the AC component generated by the LED. An attenuation of 12dB, a cut-off frequency of 0.3 Hz, and a gain of lpA / V makes it possible to restore a signal (rectangular pulses with repetition frequency f R of 4 kHz and duty cycle 20%) more than 1000 times smaller than the continuous background. This measure validates the pulsed architecture for the single-channel prototype.
Thus, according to one embodiment, the device according to the invention takes into account the treatment of noise caused by thermal radiation. According to one embodiment, the solution consists in emitting pulsed shots according to a rectangular signal of amplitude and of prescribed wavelength and of prescribed repetition frequency f R , signals of which the reflection measured by the detector 102 will be treated temporally by a Fourier development, which will have the effect of eliminating noise from thermal radiation.
According to one embodiment, the device 1 comprises a cooling module 13, for example of the Peltier type, for cooling the infrared detector (s) 102 and / or a cooling module 13 ′, for example of the type Peltier to cool the source (s) 101. This allows the source 101 and the detector 102 to be cooled to a stable temperature. In particular, a Peltier cooling module is small, which allows the device 1 to be more compact.
A Peltier type cooling module 13, 13 ’is composed of a stack of thermo-elements. A thermo-element consists of two semiconductor components. When direct current is imposed on the terminals of the Peltier type cooling module 13, 13 ’, heat absorption occurs. The absorbed heat is then transmitted to the hot part of the component, which has the effect of transmitting heat from one side to the other of the module 13, 13 ’.
According to one embodiment, the device 1 comprises a thermostat and an electronic unit 9 for automatic temperature stabilization or temperature controller (based on a proportional, integrative and differential type regulator), which is connected to the module (s). ) 13, 13 ′ of cooling, for example of the Peltier type, to maintain the at least one infrared detector (102) and / or the at least one infrared source (101) at a temperature prescribed by the thermostat. For example, the temperature controller 9 regulates the temperatures of the LED source 101 and of the detector 102 typically around a given setpoint at -30 ° C.
Unit 9 can be analog or digital and be embedded in a system on chip (System On Chip SOC), for example a micro-controller, a programmable logic circuit (Field Programmable Gâte Array FPGA), or a dedicated integrated circuit (Application Specifies Integrated Circuit - ASIC).
According to one embodiment, the device 1 comprises an amplifier 10 downstream of the circuit and / or of the filter 11 to amplify the filtered signal. This amplifier 10 can be a transimpedance amplifier.
According to one embodiment, the device 1 comprises an analog-digital converter 5 downstream of the amplifier 10. An electronic system for the command and control of the analog-digital converter 5 is provided. The analog-digital converter 5 makes it possible to generate the digital signal corresponding to the reflectance of the polymer material M at each prescribed wavelength.
According to one embodiment, the device 1 comprises means 107 for processing and storing data, for determining the parameter from at least the importance of the line (s) of wavelength (s) prescribed (s) in the detection signal of the infrared detector (s), obtained from the second infrared radiation 112, or from the importance of the response of the infrared detector (s) in bands around the line (s) of wavelength prescribed in the second infrared radiation 112. In the example described above, the means 107 for processing and storing data determine the parameter from of the digital signal (s) supplied by the analog-digital converter 5, which respectively corresponds to this amplitude according to the respective line (s) and prescribed wavelength (s) respective. According to one embodiment, the means 107 for processing and storing data can comprise a processing module by Fourier transform, instead of or in addition to the circuit and / or filter 11. In addition, these means 107 for processing and data storage may include the control means 21 for performing the measurements in the aforementioned manner and for selecting the measurements in the aforementioned manner.
According to one embodiment, the device 1 comprises means 109 for downloading computer programs, which may include software programs implementing an on-board algorithm for the above-mentioned determination. The means 107, 109 may comprise an electronic charging system for this purpose such as a microcontroller, an FPGA, an ASIC, etc.
According to one embodiment, the device 1 includes a guard 110 for positioning the infrared source 101 and the infrared detector 102 in front of and / or near an area S of the polymer material M which must receive the first infrared radiation 111 and reflect the second infrared radiation 112. According to one embodiment, the guard 110 is arranged so that the outer block 1011 is at a distance from the surface 200 of the polymer material M, when the guard 110 is positioned against the surface 200 of the polymer material M. For example, the outer block 1011 has an outer distal surface 1013, which is both oriented towards the surface 200 of the polymer material M and which is set back relative to the outer distal surface 113 of the guard 110, also turned towards the surface 200 of the polymer material M. For example, the angle of incidence of the first infrared radiation 111 on the surface 200 of the polymer material M to be tested r can be greater than or equal to 10 degrees or 20 degrees and less than or equal to 60 or 70 degrees and can be ensured by positioning the guard 110 and / or the external block 1011 against this surface 200. For example, the angle of reflection of the second infrared radiation 112 on the surface 200 of the polymer material M to be tested can be greater than or equal to 10 degrees or 20 degrees and less than or equal to 60 or 70 degrees and can be ensured by the positioning of the guard 110 and / or of the external block 1011 against this surface 200. For example, the distance between the infrared source (s) 101 and the surface 200 of the polymer material M to be tested can be greater than or equal to 1 mm and less than or equal at 10 cm and can be ensured by positioning the guard 110 against this surface 200. For example, the distance between the infrared detector (s) 102 and the surface 200 of the polymer material M to be tested can be greater or equal to 1 mm and less than or equal to 10 cm and can be ensured by positioning the guard 110 against this surface 200.
According to one embodiment, the device 1 has the form of a pistol 100 comprising a grip handle 14 connected to a sighting module 15 comprising at a front end 16 remote from the handle 15 the source 101 and the detector 102 (and / or the application surface 1010 and the guard 110 in front of and next to the source 101 and the detector 102). The control member 103 is for example close to a zone 17 of the gun 100 connecting the handle 14 to the aiming module 15. This handle thus also makes it possible to introduce the device 1 into pipes or against an interior surface of a tube. Of course, the device 1 can have any other shape, such as the shape of a pen or the like.
According to one embodiment, the device 1 comprises means 104 for indicating information, which may be visual and / or audible, and which may be information indicating the parameter such as for example the presence of the tracer (s) of aging or information indicating the absence of the aging tracer (s), and / or information indicating the content of the aging tracer (s) and / or information indicating the identification of the polymer material M. The means 104 indication can be or include for example a screen 104 display. Other operating characteristics of the device 1 can be indicated by the indication means 104.
According to one embodiment, the device 1 can comprise a control interface 105 which can be other than the control member 103 and which can for example be a control keyboard 105, for example on a rear surface 18 remote from the source 101 and of detector 102, for example of zone 17.
According to one embodiment, the device 1 comprises autonomous means of electrical supply 106, for supplying energy to the aforementioned elements, including at least the source 101, the detector 102 and the unit 2. These autonomous means of electrical supply 106 are for example with or without rechargeable battery or accumulator, removable or not. According to one embodiment, the device 1 is portable.
According to one embodiment, the device 1 comprises communication means 108 for transmitting to the outside information indicating the parameter, which may be information indicating the presence of the aging tracer (s) or information indicating the absence of the aging tracer (s), and / or information indicating the content of the aging tracer (s) and / or information indicating the identification of the polymer material M. The communication means 108 can be communication up and / or down to a remote unit or a remote platform, such as a mobile terminal (cell phone or other), a server or other.
According to one embodiment, the unit 2 of the device 1 comprises one or more microcontrollers, FPGA, ASIC 19 for controlling the various aforementioned elements.
For example, the microcontroller 19 performs the following timing:
A - measurement orders by pressing the trigger 103,
B - command to set the temperature setpoint of the source 101 and of the detector 102,
C - command to send ON / OFF pulses for source 101,
D - command to receive and store measurements from converter 5,
E - frequency processing command by Fourier to suppress noise due to ambient temperature -> source 101 following return to C (for implementing steps C, D, E etc.)
F- Once the signals from all the sources 101 have been received: sending of the measurements (5 example 4 measurements for 4 sources) to the processing module 107 to convert the measurements into relevant data, characterizing the aging or the polymer material.
For example, to carry out a sequence of measurements, the device 1 or gun 100 is placed on a wall of a polymer material M by applying the guard 110 to position and wedge the gun 100 against the surface 200 of the material M to be tested. Then, we press the control unit 103 or the trigger 103 according to a fixed protocol. Thus it is possible to practice several shots and to proceed to the processing and storage of the data by the means 107, said measurements having been previously displayed on the control screen 104 with a visual or audible indicator acknowledging or not the measurement.
An operator equipped with the device 1 can carry out, easily and in a short time, measurements of the parameter of the material at different locations. For example, it can conduct a control campaign inside a reactor building of a nuclear power plant. Various M polymer materials could be checked
0 with the same device 1. The results of the measurements and / or the diagnosis of aging or identification can be displayed in situ and in real time on device 1.
权利要求:
Claims (24)
[1" id="c-fr-0001]
1. Device (1) for estimating at least one parameter of a polymer material, characterized in that the device comprises:
at least one infrared source (101), capable of sending a first infrared radiation (111) to the polymer material, having at least one emission spectral line (RI, R2, R3, R4, R5) having at least a length d prescribed wave, corresponding to the detection of at least one aging tracer for the polymer material (M), at least one infrared detector (102), capable of receiving a second infrared radiation (112), which is reflected by the polymer material (M) in response to the sending of the first infrared radiation (111), a unit (2) for determining the parameter of the polymer material (M) as a function of the at least one line (RI, R2, R3, R4, R5 ) having the wavelength prescribed in the second infrared radiation (112).
[2" id="c-fr-0002]
2. Device according to claim 1, characterized in that the first infrared radiation (111) has at least one spectral zone (B1, B2, B3, B4, B5) of emission containing the spectral line (RI, R2, R3, R4, R5) having the at least one prescribed wavelength, corresponding to the detection of the at least one aging tracer of the polymer material (M).
[3" id="c-fr-0003]
3. Device according to claim 1, characterized in that the parameter is the presence and / or content of the at least one aging tracer in the polymer material.
[4" id="c-fr-0004]
4. Device according to claim 1, characterized in that the parameter is an identification of the polymer.
[5" id="c-fr-0005]
5. Device according to any one of the preceding claims, characterized in that the at least one infrared source (101) is capable of sending the first infrared radiation (111) in the form of one or more to the polymer material (M) several time pulses (i, i + 1, i + 2).
[6" id="c-fr-0006]
6. Device according to claim 5, characterized in that the time pulse (s) (i) (i, i + 1, i + 2) are rectangular.
[7" id="c-fr-0007]
7. Device according to claim 5 or 6, characterized in that there is provided control means for switching on the at least one infrared detector (102) in a synchronous manner with the time pulse (s) ( s) (i, i + 1, i + 2).
[8" id="c-fr-0008]
8. Device according to any one of claims 5 to 7, characterized in that the device (1) comprises a control means (21) for carrying out several first measurements (300) of the second infrared radiation (112) during a first width prescribed time (γη) included in or equal to a respective time width (ii) of at least one of the pulses (i), for calculating an estimate of a first value (A /, _ OJV ) representative of the first measurements (300 ), the parameter being calculated from at least the first value (A /, _ OJV ).
[9" id="c-fr-0009]
9. Device according to claim 8, characterized in that the device (1) comprises a means (21) for controlling to perform several second measurements (301) of the second infrared radiation (112) during a second prescribed time width (γι 2 ) included in or equal to a respective time width (Tj-Ti) between two successive pulses (i, i + 1), to calculate an estimate of a second value (M ^ pp) representative of the second measurements (301), the parameter being calculated at least from the difference between the first value (A /, _ OJV ) and the second value (M._ OFF ).
[10" id="c-fr-0010]
10. Device according to any one of the preceding claims, characterized in that the device (1) further comprises at least one member (103) for manual control to trigger the sending of the first infrared radiation by the at least one infrared source. (101).
[11" id="c-fr-0011]
11. Device according to any one of the preceding claims, characterized in that the at least one infrared source (101) is at least one infrared light-emitting diode or at least one laser source.
[12" id="c-fr-0012]
12. Device according to any one of the preceding claims, characterized in that the at least one line (RI, R2, R3, R4, R5) of prescribed wavelength is chosen from the wavelength interval going from 2 pm to 10 pm.
[13" id="c-fr-0013]
13. Device according to any one of the preceding claims, characterized in that it is provided as a line at least two lines (RI, R2, R3, R4, R5) of distinct prescribed wavelengths.
[14" id="c-fr-0014]
14. Device according to any one of the preceding claims, characterized in that the at least one line of prescribed wavelength (RI, R2, R3, R4, R5) is chosen in at least one of the lengths of wave 10 pm, 9.5 pm, 7.2 pm, 6 pm and 3.5 pm.
[15" id="c-fr-0015]
15. Device according to any one of the preceding claims, characterized in that the first infrared radiation (111) has at least one spectral region (B1, B2, B3, B4, B5) of emission containing the spectral line (RI, R2, R3, R4, R5) having the at least one prescribed wavelength, corresponding to the detection of the at least one aging tracer of the polymer material (M), the width at half height of the at least one spectral zone (B1, B2, B3, B4, B5) of emission containing the at least one line (RI, R2, R3, R4, R5) of prescribed wavelength is less than or equal to 1 pm.
[16" id="c-fr-0016]
16. Device according to any one of the preceding claims, characterized in that the device (1) comprises at least one filter or circuit or filtering unit (11) for the suppression or attenuation of a DC component in a signal , having been supplied by the infrared detector (102) from the second infrared radiation.
[17" id="c-fr-0017]
17. Device according to any one of the preceding claims, characterized in that the determination unit (2) is configured to calculate the parameter of the polymeric material (M) as a function at least of the amplitude of a detection signal obtained from the infrared detector (102) and from the second infrared radiation (112) received in a spectral region around the at least one prescribed wavelength corresponding to the at least one line (RI, R2, R3, R4 , R5).
[18" id="c-fr-0018]
18. Device according to any one of the preceding claims, characterized in that the determination unit (2) is configured to calculate the parameter of the polymer material (M) as a function of the amplitude of a detection signal obtained at from the infrared detector (102) and from the second infrared radiation (112) received in a spectral zone around the at least one prescribed wavelength corresponding to the at least one line (RI, R2, R3, R4, R5 ), relative to the amplitude of a transmission signal used to control the at least one infrared source (101) to send the first infrared radiation (111) having the at least one line (RI, R2, R3, R4 , R5) at at least one wavelength prescribed in the first infrared radiation (111).
[19" id="c-fr-0019]
19. Device according to any one of the preceding claims, characterized in that the device (1) comprises a cooling module (13), for cooling the at least one infrared detector (102) and / or a module (13 ') cooling, to cool the at least one infrared source (101).
[20" id="c-fr-0020]
20. Device according to claim 19, characterized in that the device (1) comprises a thermostat and an electronic unit (9) for automatic temperature stabilization which is connected to the cooling module (13, 13 '), to maintain the at at least one infrared detector (102) and / or the at least one infrared source (101) at a temperature prescribed by the thermostat.
[21" id="c-fr-0021]
21. Device according to any one of the preceding claims, characterized in that the device (1) has the form of a pistol (100) comprising a grip handle (14) connected to a sighting module (15) comprising a front end (16) remote from the handle (15) the at least one infrared source (101) and the at least one infrared detector (102), the gun (100) comprising at least one member (103) of manual control for triggering sending the first infrared radiation (111) by the at least one infrared source (101), the manual control member (103) being located near an area (17) of the gun (100) connecting the handle (14) ) to the aiming module (15).
[22" id="c-fr-0022]
22. Device according to any one of the preceding claims, characterized in that the at least one source (101) and / or the at least one infrared detector (102) are covered by at least one external block (1011), the at at least one source (101) and / or the at least one infrared detector (102) being capable of emitting the first and second infrared radiation (111) and receiving the second infrared radiation (112) through the external unit (1011) which is transparent to them and which faces the polymer material (M).
[23" id="c-fr-0023]
23. Device according to claim 22, characterized in that the device (1) comprises a guard (110) bearing against the polymeric material (M), the external block (1011) having an external distal surface (1013), which is both oriented towards the polymer material (M) and which is set back with respect to a
5 outer distal surface (113) of the guard (110), also facing the surface (200) of the polymer material (M).
[24" id="c-fr-0024]
24. Method for estimating at least one parameter of a polymer material (M), characterized in that at least one infrared source (101) is sent to the polymer material a first infrared radiation (111) characterized by at least one emission spectral line (RI, R2, R3, R4, R5) having at least one prescribed wavelength, corresponding to the detection of the at least one aging tracer of the polymer material (M), we receive by at least one infrared detector (102) a second infrared radiation (112), which is reflected by the polymeric material (M) in response to the sending of the first infrared radiation (111), is determined by a unit (2) determining the parameter of the polymer material (M) as a function of the at least one spectral line (RI, R2, R3, R4, R5) of wavelength prescribed in the second infrared radiation (112).
1/6
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同族专利:
公开号 | 公开日
RU2765694C2|2022-02-02|
ZA201903754B|2020-12-23|
FR3059104B1|2020-12-11|
US20190353590A1|2019-11-21|
JP2019537014A|2019-12-19|
RU2019117539A3|2021-01-29|
CN110214267A|2019-09-06|
US11137352B2|2021-10-05|
KR20190100192A|2019-08-28|
EP3542148A1|2019-09-25|
CA3043331A1|2018-05-24|
WO2018091631A1|2018-05-24|
RU2019117539A|2020-12-18|
TW201827809A|2018-08-01|
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2018-05-25| PLSC| Publication of the preliminary search report|Effective date: 20180525 |
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2021-10-06| PLFP| Fee payment|Year of fee payment: 6 |
优先权:
申请号 | 申请日 | 专利标题
FR1661235A|FR3059104B1|2016-11-18|2016-11-18|DEVICE AND METHOD FOR ESTIMATING A PARAMETER OF A POLYMERIC MATERIAL|
FR1661235|2016-11-18|FR1661235A| FR3059104B1|2016-11-18|2016-11-18|DEVICE AND METHOD FOR ESTIMATING A PARAMETER OF A POLYMERIC MATERIAL|
CN201780071690.1A| CN110214267A|2016-11-18|2017-11-17|For estimating the mancarried device and method of Polymer Parameters|
CA3043331A| CA3043331A1|2016-11-18|2017-11-17|Portable device and method for estimating a parameter of a polymer|
US16/461,635| US11137352B2|2016-11-18|2017-11-17|Portable device and method for estimating a parameter of a polymer|
KR1020197017393A| KR20190100192A|2016-11-18|2017-11-17|Portable Devices and Methods for Estimating Parameters of Polymers|
EP17804503.5A| EP3542148A1|2016-11-18|2017-11-17|Portable device and method for estimating a parameter of a polymer|
RU2019117539A| RU2765694C2|2016-11-18|2017-11-17|Portable device and method for assessing polymer parameter|
TW106139905A| TW201827809A|2016-11-18|2017-11-17|Portable device and method for estimating a parameter of a polymer material|
JP2019527247A| JP2019537014A|2016-11-18|2017-11-17|Portable device and method for estimating parameters of polymer material|
PCT/EP2017/079543| WO2018091631A1|2016-11-18|2017-11-17|Portable device and method for estimating a parameter of a polymer|
ZA2019/03754A| ZA201903754B|2016-11-18|2019-06-11|Portable device and method for estimating a parameter of a polymer|
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