• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    The present invention relates to a test method of a detection sensor disposed opposite a target attached to a drive shaft intended to be mounted in a motor vehicle. The method comprises the steps of generating (E1) a crimped voltage test signal, amplifying (E2) high states of said generated test signal, filtering (E3) the amplified test signal to obtain a test signal. in voltage having high states whose voltage is greater than a predetermined high state detection threshold and low states whose voltage is lower than a predetermined low state detection threshold and high state detection (E4) and low states of the filtered test signal to test the sensor.
    公开号:FR3047318A1
    申请号:FR1650738
    申请日:2016-01-29
    公开日:2017-08-04
    发明作者:David Mirassou
    申请人:Continental Automotive GmbH；Continental Automotive France SAS；
    IPC主号:
    专利说明:

    The present invention relates to the field of detection sensor tests for a motor vehicle and more particularly relates to a method and a system for testing a sensor for detecting a target attached to a drive shaft of a motor vehicle. The invention finds particular application in the detection of a target attached to a crank shaft, a camshaft or a transmission shaft of a motor vehicle.
    In a motor vehicle, it is known to use sensors called "detection" to determine the position of a drive shaft or its rotational speed. Such a shaft may for example be a crank shaft, a camshaft or a drive shaft of a motor vehicle.
    The sensor is mounted opposite a target coaxially fixed on the drive shaft. This target is in a known manner in the form of a ring made of a ferromagnetic material and comprising a succession of teeth and depressions.
    Still in known manner, the sensor comprises an electrical supply connector by which it is supplied with DC voltage, for example 5 V, to operate in the vehicle, an electrical output connector and a ground connector.
    In order to determine the position or the speed of the shaft, the sensor comprises an integrated circuit configured to measure the magnetic field variations generated by the passage of teeth and troughs of the target in front of the sensor.
    The sensor thus generates a digital output signal representing the passages of the teeth and troughs characterizing the position or the speed of rotation of the shaft. This signal is supplied via the output connector to a vehicle computer which analyzes it to determine the position or speed of rotation of the shaft.
    In order to enable such a sensor to meet electromagnetic compatibility standards, it is known to attenuate the sensor supply signal by mounting a filter circuit in the sensor, between the connectors and the integrated circuit.
    Furthermore, it is known to perform tests on this type of sensor using a test device that communicates information with the sensor via a test protocol.
    The tests performed on the sensor may consist in collecting samples of the sensor output signal representing the periodic variations of the magnetic field generated by the rotation of the target in front of the sensor at a given speed, for example several samples per period of the signal.
    In order to send test commands to the sensor, the test device generates a test signal including test information that is sent to the sensor power line. Thus, when the sensor is used in the vehicle in operation, it is powered by a DC voltage supply signal, for example of a value of the order of 5 V, but when the sensor must be tested by the device test, it delivers on the sensor supply line a pulse voltage test signal defined by a test protocol and representative of the test information.
    As illustrated in FIG. 1, this test signal (denoted "VG" in the figure) can consist of exchanging bit information of type 0 or 1, for example encoded in pulse width in the form of high states EH of width 1/3 to represent the binary value 1 alternating with low states EB of width 2/3 to represent the binary value 0. In Figure 1, the high states EH have a value of the order of 17 V and the low states EB have a value of around 6 V so that they can easily be distinguished from each other. However, these values being able to vary, the sensor detects a high state EH of the test signal when it exceeds a predetermined high state detection threshold SDH (of 14 V in FIG. 1). Similarly, a low state EB may be detected when the value of the test signal is below a predetermined low state detection threshold SDB (of 9 V in FIG. 1).
    When it is desired to test the sensor for rotational speeds of the high shaft, for example greater than 500 RPM, it is necessary to deliver a test signal whose frequency is high enough to allow to collect several samples per signal period. representative of magnetic field variations, for example at least 20 kHz.
    However, at such frequencies, the test signal can be significantly attenuated by the filter circuit (the filtered test signal is denoted "VR" in FIG. 1) so that it can not cross the detection threshold of high predetermined states SDH. In this case, the sensor can not determine if binary test information is contained in the test signal, which prevents the test device from collecting the samples and therefore has a major disadvantage. The object of the invention is to overcome at least part of these disadvantages by proposing a simple, reliable and efficient solution for testing detection sensors at high frequencies. To this end, the invention firstly relates to a method of testing a detection sensor disposed opposite a target attached to a drive shaft intended to be mounted in a motor vehicle, said sensor detection being configured to measure the magnetic field variations generated by the passage of the target in front of the sensor and to generate an output signal representative of said variations, said method comprising the steps of: • generating a crosstalk voltage test signal comprising high states whose value is greater than a predetermined high state detection threshold and low states whose value is below a predetermined high state detection threshold, the high states and low states encoding test information for collecting data relating to the output signal of the sensor, • amplification of the high states of said generated test signal, • wire tracing the amplified test signal to obtain a filtered test signal having high states whose voltage is higher than the predetermined high state detection threshold and low states whose voltage is below the predetermined low state detection threshold, and • detection of the high and low states of the filtered test signal to test the sensor.
    Thus, with the method according to the invention, the amplification of the high states of the generated test signal makes it possible to ensure that the high states of the filtered test signal are greater than the predetermined high state detection threshold so that the sensor can interpret correctly the binary information contained in the test signal generated.
    Preferably, the filtering being characterized by a predetermined filtering coefficient, the amplification is performed by an amplification coefficient equal to the inverse of the predetermined filtering coefficient.
    More preferably, the method further comprises a step of collecting and analyzing data relating to the output signal generated by the sensor. The invention also relates to a system for testing a target detection sensor fixed on a drive shaft intended to be mounted in a motor vehicle, said system comprising: a generation module configured to generate a test signal crimped voltage transistor comprising high states whose value is greater than a predetermined high state detection threshold and low states whose value is below a predetermined high state detection threshold, the high states and the low states encoding test information for collecting data relating to the output signal of the sensor, • an amplification module electrically connected to the generation module for receiving a test signal generated by said generation module and configured to amplify the high states of said test signal received, • a drive shaft on which a target is mounted, and • a detection sensor isposed opposite said target and electrically connected to the amplification module to receive a test signal amplified by said amplification module, said sensor comprising a filter circuit configured to filter said amplified test signal and an integrated circuit configured to measure the magnetic field variations generated by the passage of the target in front of the sensor, for generating an output signal representative of said variations and for detecting, beyond the predetermined high state detection threshold, high states of a filtered test signal by the filter circuit and, below a predetermined low state detection threshold, low states of the test signal filtered by the filter circuit for testing the sensor.
    Preferably, the filter circuit is characterized by a predetermined filtering coefficient and the amplification module is configured to amplify the generated test signal by an amplification coefficient equal to the inverse of the predetermined filtering coefficient.
    In a preferred embodiment, the amplification module comprises an operational amplifier receiving on its negative input the generated test signal and a filter circuit, identical to the filter circuit of the integrated circuit of the sensor, the input of which is connected to the output of the operational amplifier and whose output is connected to the positive input of the operational amplifier.
    Preferably, the amplification module further comprises a current amplification sub-module disposed between the output of the operational amplifier and the input of the filter circuit of the amplification module.
    More preferably, the filter circuit of the sensor consists of a resistor and a capacitance.
    Advantageously, the system further comprises a management module configured to receive and analyze data relating to the output signal of the sensor to determine the operating state. The invention also relates to a motor vehicle comprising a test system in which are mounted the drive shaft and the detection sensor. Other features and advantages of the invention will become apparent from the following description given with reference to the appended figures given by way of non-limiting examples and in which identical references are given to similar objects. FIG. 1 (prior art) schematically illustrates a generated test signal sent to a detection sensor for testing and the test signal thus received filtered by the sensor, as a function of time. - Figure 2 schematically illustrates an embodiment of the system according to the invention. - Figure 3 is a partial view of the system of Figure 1, the amplification module and the filter circuit have been detailed. FIG. 4 schematically illustrates a test signal generated as a function of time and the corresponding filtered test signal in the system of FIG. 3. FIG. 5 schematically illustrates a test signal generated as a function of time, the corresponding amplified test signal and the corresponding filtered test signal in the system of Figure 3. - Figure 6 illustrates an embodiment of the method according to the invention.
    The test system according to the invention makes it possible to test a sensor for detecting a target fixed on a drive shaft for a motor vehicle, in particular by enabling the collection of data relating to the output signal delivered by said sensor, such as, for example the value of the magnetic field measured by the sensor. For this purpose, with reference to FIG. 2, the system 1 comprises a drive shaft 10 on which a target 12 is mounted, a detection sensor 20 arranged opposite said target 12, a generation module 30 and a amplification module 40.
    The tests may be performed with a detection sensor 20 mounted on a test bench facing a target 12 of a test drive shaft 10 for simulating the operation of a drive shaft of a motor vehicle or well with a sensor sensor 20 already mounted in a motor vehicle. In the latter case, the drive shaft 10 may, for example, be a crank shaft, a camshaft or a transmission shaft.
    In order to perform these tests, it is necessary to generate a test signal as will be described below. This test signal is a crimped voltage signal comprising alternating high states with low states of the test signal representative of test information enabling the sensor 20 to collect data relating to its output signal.
    In the nonlimiting example illustrated in FIG. 4, this VG slot voltage test signal comprises high states EH at 17 V and low states EB at 6 V. The high states EH are coded in pulse width in order to transmitting binary information, for example 1 when the width of the test signal generated VG high EH is one third of period, and 0 when the width of the test signal generated VG high EH is two thirds period. The drive shaft 10 comprises a target 12 associated with the detection sensor 10.
    In the example illustrated in FIG. 2, the target 12 is in the form of a metal ring fixed integrally with the drive shaft 10.
    This target 12 comprises at its periphery a plurality of teeth T2, T3 (three teeth in this non-limiting example) whose height hi, h2, h3, the length U to 13 and the spacings (troughs) Ci to C3, respectively, can vary significantly.
    These lengths and variable spacings constitute, in a manner known per se, a coding, measured by the sensor 20 and decoded by the central computer. The operation of such a target plus sensor assembly 12 is described below.
    When the target 12 is rotated (arrow F) by the drive shaft 10, the sensor 20 perceives a series of variations of the magnetic field representative of the length à to 13 of the teeth Ή, T2, T3 passing in front of it and their spacing C15 C2, C3.
    This operation being known, it will not be further detailed here.
    Still with reference to FIG. 2, the detection sensor 20 is arranged facing the target 12 and is electrically connected to the amplification module 40 so as to receive an amplified test signal (VA in FIGS. 3 and 5) by said module amplification 40 as will be described below.
    In this non-limiting example, the detection sensor 20 comprises a ferromagnetic element 21 making it possible to generate a magnetic field near the target 12. The rotation of the target 12 modulates this magnetic field as a function of the passage of the teeth T1, T2, T3 and troughs C1, C2, C3.
    The detection sensor 20 also comprises a magnetic field detection module 22, a power supply connector 23, an output connector 24 and a ground connector 25. This detection module 22 comprises, for example, a Hall effect cell enabling detecting the magnetic field variations generated by the target 12 and outputting an output signal representative of said variations.
    The magnetic field detection module 22 also comprises a filter circuit 26 and an integrated circuit 28 (see FIG.
    The filter circuit 26 is configured to receive and to filter the amplified test signal VA by the amplification module 40 to obtain a filtered test signal VF (with reference to FIGS. 4 and 5). By the terms "filtering" and "filtering" is meant that attenuates the high-frequency signals, such a filtering making it possible to attenuate the high-frequency external disturbances present on the power connector 23 in a manner known per se. For this purpose, the filter circuit 26 comprises a resistor R1 and a capacitor C1. The resistor R1 is connected on the one hand to the supply connector 23 of the sensor 20 and on the other hand the capacitor C1. The capacitor C1 is connected on the one hand to the resistor R1 and on the other hand to the ground connector 25. By way of nonlimiting example, the value of the resistor R1 may be 47 Ohm and the value of the capacitor C1 can be 470 nF.
    The filtering circuit 26 is characterized by a predetermined filtering coefficient corresponding, for example, to a reduction by a predetermined factor, as a function of the values of the resistor R1 and of the capacitor C1, of the maximum amplitude of the signal received at the input of the filter. .
    The integrated circuit 28 is firstly configured to measure the magnetic field variations generated by the passage of the target 12 in front of the sensor 20 and to generate an output signal representative of the variations of the measured magnetic field, this output signal being delivered via the output connector 24.
    During operation of the vehicle, the output signal is delivered to a computer of the vehicle (not shown) which analyzes it in order, for example, to determine the position or speed of rotation of the shaft 10.
    In the test phase, with reference to FIGS. 4 and 5, the integrated circuit 28 is configured to detect, beyond a predetermined high state detection threshold SDH, high states EH of the filtered test signal VF by the circuit for filtering 26 and, below a predetermined low state detection threshold SDB, EB low states of the filtered test signal VF by the filter circuit 26.
    More specifically, the integrated circuit 28 is configured to detect the high states EH of the filtered test signal VF by the filter circuit 26 when the voltage value of the test signal exceeds a predetermined high state detection threshold SDH, for example of the in the order of 14 V. Thus, when the voltage value of the filtered test signal VF is greater than the predetermined high state detection threshold SDH, the integrated circuit 28 detects a high state EH and can determine the value of the binary information (0 or 1) depending on whether the width of the high state is one-third or two-thirds of the signal period.
    Similarly, the integrated circuit 28 is configured to detect the low states EB of the filtered test signal VF by the filter circuit 26 when the voltage value of the signal VF is lower than a predetermined low-level detection threshold SDB, for example of the order of 9 V. Thus, when the voltage value of the filtered test signal VF is lower than the predetermined detection threshold of low state SDB, the integrated circuit 28 detects a low state EB and can determine the value of the binary information (0 or 1) according to whether the width of the low state EB is one third or two thirds of the signal period and thus ensure the correct interpretation of the binary information contained in the filtered test signal VF by the integrated circuit 28.
    Such detection enables the integrated circuit 28 to determine the bit information contained in the filtered test signal VF in order to collect data relating to the output signal to provide them to a management module (not shown). This management module is configured to analyze this received data in order to determine the operating state.
    The integrated circuit 28 is configured to collect the output signal data from encoded test messages in a received test signal and filtered by the filter circuit 26.
    The generation module 30 is configured to generate a VG slot voltage test signal comprising high states EH whose value is greater than a predetermined high state detection threshold SDH and low states EB whose value is less than one. predetermined high state detection threshold SDB, the high states EH and the low states EB encoding test information for collecting data relating to the output signal of the sensor 20, as described above.
    The amplification module 40 is arranged between the generation module 30 and the sensor 20. It is electrically connected to the generation module 30, in order to receive a test signal generated VG by the said generation module 30, and to the sensor 20 via the power line 23, to provide it with an amplified test signal VA. For this purpose, the amplification module 40 is configured to amplify the high states EH of said generated test signal VG received from the generation module 30 with a sufficiently high coefficient or amplification factor to ensure that the high states EH of the test signal will always be higher than the predetermined high state detection threshold SDH of the sensor 20 when the amplified test signal VA has been filtered by the filtering circuit 26 of the sensor 20 so that the integrated circuit 28 can correctly decode the binary information contained in the filtered test signal VF for collecting data relating to the output signal of the sensor 20.
    Preferably, as illustrated in FIG. 3, the amplification module 40 comprises an operational amplifier 410 and a filtering circuit 420. The operational amplifier 410 is powered by two supply voltages Vcc and Vee in a manner known per se, for example 40 V and 40 V respectively. The operational amplifier 410 receives on its positive input the test signal generated VG by the generation module 30.
    The filter circuit of the amplification module 40 consists of a resistor R2 disposed between the negative input and the output of the operational amplifier 410 and a capacitor C2 arranged between the negative input of the operational amplifier 410. is the mass M.
    The resistance values R2 and capacitance C2 of the filtering circuit 420 of the amplification module 30 are identical to the resistance values R1 and capacitance C1 of the filtering circuit 26 of the sensor 20 in order to simulate the filtering of the signal amplified by the operational amplifier 410 in a loop making it possible to ensure that the amplification coefficient of the test signal generated by the generation module 30 is sufficient for the high states EH of the test signal filtered by the filtering circuit 26 of the sensor 20 to be greater than at the predetermined high state detection threshold SDH.
    It will be noted that it is also possible to use resistance values R2 and capacitance C2 of the filter circuit 420 of the amplification module 30 different from the resistance values R1 and capacitance C1 of the filtering circuit 26 of the sensor 20, but producing a identical filtering. To do this, the time constant of the two filter circuits 26, 420 must be the same. The time constant T of a filter circuit RC being equal to R * C, it will be possible to choose a value pair (R2, C2) having the same time constant as R1 * C1, ie R2 * C2 = R1 * C1 .
    To ensure that the amplification coefficient of the test signal generated by the generation module 30 is sufficient for the high states EH of the test signal filtered by the filter circuit 26 of the sensor 20 to be greater than the detection threshold of predetermined high state SDH, the amplification of the generated test signal VG is performed, at least on a portion of the high states EH, with an amplification coefficient at least equal to the inverse of the predetermined filtering coefficient.
    In the embodiment illustrated in FIG. 3, the amplification module 40 furthermore comprises an optional assembly 430 consisting of an NPN type transistor Q1 and a superimposed PNP type transistor Q2. This arrangement 430, arranged between the operational amplifier 410 and the filter circuit 420, is connected on the one hand to the supply voltage Vcc and on the other hand to the reference voltage Vee as illustrated in FIG. mounting 430 makes it possible to increase the maximum value of the output current of the operational amplifier in order to supply a greater current to the filtering circuit 26 of the sensor 20 to enable fast charging and discharging of the capacitor C1, and thus of the edges of the rapid transition of the filtered test signal VF between low states EB and high states EH. The voltage gain of this transistor is equal to 1 in order not to modify the value of the output voltage of the amplification module 40.
    The method according to the invention makes it possible to test the detection sensor from a crimped voltage test signal comprising test information coded in high states EH whose value is greater than the predetermined high state detection threshold SDH of the sensor 20 and low states EB whose value is below the predetermined high state detection threshold SDB of the sensor 20.
    The method will be described in particular with reference to FIGS. 4 and 5. For the sake of clarity, FIG. 4 only shows the generated test signal VG and the filtered test signal VF while FIG. 5 illustrates the generated test signal VG, the signal amplified test VAand the filtered test signal VF.
    The generation module 30 first generates a test signal VG in a step E1 (see FIG. 6) and transmits it to the amplification module 40.
    The amplification module 40 then amplifies the generated test signal VG, in a step E2, in particular its high states EH, as illustrated in FIG. 5, and then transmits the thus amplified test signal VA to the sensor 20 via its power supply line 23. .
    The filtering circuit 26 of the sensor 20 receives and filters, in a step E3, the amplified test signal VA received from the amplification module 40 so as to obtain a filtered test signal VF having high states EH whose voltage value is higher at the predetermined high state detection threshold SDH and low states EB whose voltage value is below the predetermined low state detection threshold SDB, as illustrated in FIG. 4.
    The filtered test signal VF is then supplied to the integrated circuit 28 which decodes it, in a step E4, to obtain the test information contained in said filtered test signal VF in order to collect data relating to the output signal of the sensor and to supply them to the management module that analyzes these data to determine the operating state of the sensor 20, in a step E5.
    It is furthermore specified that the present invention is not limited to the examples described above and is capable of numerous variants accessible to those skilled in the art.
    权利要求:
    Claims (10)
    [1" id="c-fr-0001]
    1. A method of testing a detection sensor (20) arranged opposite a target (12) fixed on a drive shaft (10) intended to be mounted in a motor vehicle, said detection sensor (20) being configured to measure the magnetic field variations generated by passing the target (12) past the sensor (20) and to generate an output signal representative of said variations, said method comprising the steps of: • generating (E1) of a crimped voltage test signal (VG) comprising high states (EH) whose value is greater than a predetermined high state detection threshold (SDH) and low states (EB) whose value is below a threshold predetermined high state detection (SDB), the high states (EH) and the low states (EB) encoding test information for collecting data relating to the output signal of the sensor (20), • amplification (E2) high states of said sig nal generated test (VG), • filtering (E3) of the amplified test signal (VA) so as to obtain a filtered test signal (VF) having high states whose voltage is higher than the predetermined high state detection threshold (SDH) ) and low states whose voltage is below the predetermined low state detection threshold (SDB), and • detection (E4) of the high and low states of the filtered test signal (VF) to test the sensor (20). ).
    [2" id="c-fr-0002]
    2. Method according to claim 1, wherein, the filtering (E3) being characterized by a predetermined filtering coefficient, the amplification (E2) is performed with an amplification coefficient equal to the inverse of the predetermined filtering coefficient. .
    [3" id="c-fr-0003]
    3. Method according to one of claims 1 and 2, further comprising a step (E5) for collecting and analyzing data relating to the output signal generated by the sensor (20).
    [4" id="c-fr-0004]
    4. System (1) for testing a detection sensor (20) of a target (12) fixed on a drive shaft (10) intended to be mounted in a motor vehicle, said system (1) comprising: A generation module (30) configured to generate a crimped voltage test signal (VG) comprising high states (EH) whose value is greater than a predetermined high state detection threshold (SDH) and low states (EB) whose value is below a predetermined high state detection threshold (SDB), the high states (EH) and the low states (EB) encoding test information for collecting output signal data of the sensor (20), • an amplification module (40) electrically connected to the generation module for receiving a test signal generated by said generation module and configured to amplify the high states of said received test signal; training (10) on which is m has a target (12), and • a detection sensor (20) disposed opposite said target (12) and electrically connected to the amplification module (40) to receive an amplified test signal (VA) by said module amplifier (40), said sensor (20) comprising a filter circuit (26) configured to filter said amplified test signal (VA) and an integrated circuit (28) configured to measure the magnetic field variations generated by the passage of the target (12) in front of the sensor (20), for generating an output signal representative of said variations and for detecting, beyond the predetermined high state detection threshold (SDH), high states of a filtered test signal ( VF) by the filter circuit (26) and, below a predetermined low state detection threshold (SDB), low states of the filtered test signal (VF) by the filter circuit (26) for testing the sensor (20).
    [5" id="c-fr-0005]
    The test system (1) according to claim 4, wherein the filtering circuit (26) is characterized by a predetermined filtering coefficient and the amplifying module (40) is configured to amplify the generated test signal (VG). an amplification coefficient equal to the inverse of the predetermined filtering coefficient.
    [6" id="c-fr-0006]
    6. Test system according to one of claims 4 and 5, wherein the amplification module (40) comprises an operational amplifier receiving on its negative input the generated test signal and a filter circuit, identical to the filter circuit of the sensor integrated circuit, the input of which is connected to the output of the operational amplifier and whose output is connected to the positive input of the operational amplifier.
    [7" id="c-fr-0007]
    The test system according to any one of claims 4 to 6, wherein the amplification module (40) further comprises a current amplification sub-module disposed between the output of the operational amplifier and the amplifier. input of the filter circuit of the amplification module (40).
    [8" id="c-fr-0008]
    8. Test system according to any one of claims 4 to 7, wherein the filter circuit (26) of the sensor (20) consists of a resistor (R1) and a capacitance (C1).
    [9" id="c-fr-0009]
    The test system of any one of claims 4 to 8, further comprising a management module configured to receive and analyze sensor output signal data (20) to determine its operating status. .
    [10" id="c-fr-0010]
    10. Motor vehicle comprising a test system according to any one of claims 4 to 9, wherein are mounted the drive shaft (10) and the detection sensor (20).
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    同族专利:
    公开号 | 公开日
    KR20180108736A|2018-10-04|
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    CN108885226A|2018-11-23|
    WO2017129212A1|2017-08-03|
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    US20190064207A1|2019-02-28|
    US10627423B2|2020-04-21|
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    CN111537815A|2020-04-03|2020-08-14|中国第一汽车股份有限公司|Electromagnetic compatibility testing method, device, system and storage medium|
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    优先权:
    申请号 | 申请日 | 专利标题
    FR1650738A|FR3047318B1|2016-01-29|2016-01-29|METHOD AND DEVICE FOR TESTING A DETECTION SENSOR FOR A MOTOR VEHICLE|
    FR1650738|2016-01-29|FR1650738A| FR3047318B1|2016-01-29|2016-01-29|METHOD AND DEVICE FOR TESTING A DETECTION SENSOR FOR A MOTOR VEHICLE|
    KR1020187024780A| KR20180108736A|2016-01-29|2016-12-21|Method and device for testing automotive detection sensors|
    US16/073,093| US10627423B2|2016-01-29|2016-12-21|Method and device for testing a detection sensor for a motor vehicle|
    PCT/EP2016/002150| WO2017129212A1|2016-01-29|2016-12-21|Method and device for testing a detection sensor for a motor vehicle|
    CN201680084015.8A| CN108885226B|2016-01-29|2016-12-21|Method and device for testing a detection sensor for a motor vehicle|
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