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    • 专利摘要:
    The invention is a method of observation of a sample by imaging, and in particular imaging without a lens, according to which a sample is placed between a laser diode and an image sensor. The laser diode is powered by a supply current whose intensity is less than or equal to a critical value. The critical intensity is determined during preliminary steps, during which the intensity is initially greater than a threshold, said laser threshold, of the laser diode, an image formed by the image sensor is observed. The intensity is decreased until an attenuation of interference fringes is observed on the image formed by the image sensor, the critical intensity corresponding to the intensity at which this attenuation is optimal.
    公开号:FR3046238A1
    申请号:FR1563320
    申请日:2015-12-24
    公开日:2017-06-30
    发明作者:Pierre Blandin
    申请人:Commissariat a lEnergie Atomique CEA；Commissariat a lEnergie Atomique et aux Energies Alternatives CEA；
    IPC主号:
    专利说明:

    Method of observation of a sample by imaging without a lens
    Description
    TECHNICAL AREA
    The technical field of the invention is related to the observation of a sample, in particular a biological sample, by imaging without a lens.
    PRIOR ART The observation of samples, and in particular biological samples, by imaging without a lens has been developing significantly over the past ten years. This technique makes it possible to observe a sample by placing it between a light source and an image sensor without having an optical magnification lens between the sample and the image sensor. Thus, the image sensor collects an image of a light wave transmitted by the sample.
    This image is formed of interference figures between the light wave emitted by the source and transmitted by the sample, and diffraction waves, resulting from the diffraction by the sample of the light wave emitted by the source. These interference patterns are sometimes called diffraction patterns, or designated by the term "diffraction pattern". The image formed on the image sensor can be processed by a digital propagation algorithm to estimate optical properties of the sample. Such algorithms are well known in the field of holographic reconstruction. For this, the distance between the sample and the image sensor being known, we apply a holographic reconstruction algorithm, taking into account this distance.
    The publication Garcia-Sucerquia J., "Digital in-line holography microscopy," Applied Optics, Vol. 45, No. 5, February 10, 2006, describes the observation of particles, for example biological particles, with the aid of a laser beam, as well as the application of reconstruction algorithms to images formed on a sensor CCD.
    Document WO2008090330 has shown that by replacing the laser light source with a spatially filtered light emitting diode, it was possible to obtain a usable image of biological samples, in this case cells, by imaging without a lens. The device described in this document makes it possible to associate, with each cell, an interference figure whose morphology makes it possible to identify the type of cell. Other publications followed, confirming the interest of such a technology, for example the application US2012 / 0218379. Imaging without a lens now appears as a simple and inexpensive alternative to a conventional microscope. Moreover, its field of observation is much larger than can be that of a microscope. It is understandable that the application prospects related to this technology are important.
    The inventors propose a method of observation of an improved sample compared to the methods described above, making it possible to obtain images whose signal-to-noise ratio is improved compared to the prior art.
    SUMMARY OF THE INVENTION
    A first object of the invention is a method of observation of a sample, comprising the following steps: a) illumination of said sample with the aid of a laser diode, able to emit an incident light wave, said laser diode being powered by a supply current, such that a laser effect is obtained when an intensity of said supply current exceeds an intensity called threshold intensity; b) acquisition, with the aid of an image sensor, of an image of the sample, the sample being arranged between the laser diode and the image sensor, each image being representative of a light wave transmitted by the sample under the effect of said illumination; the method being characterized in that the intensity of the supply current of said laser diode is less than or equal to a so-called critical intensity, said critical intensity being determined, prior to step a) according to the following preliminary steps: i) placing said laser diode so that the incident light wave it emits propagates to the image sensor; ii) supplying said laser diode with a so-called initial supply current whose intensity is greater than or equal to said threshold intensity, and acquisition of an image, called an initial image, by said image sensor, said initial image comprising transverse interference fringes extending through the image; iii) modifying the intensity of said feed stream and acquiring an image by the image sensor, this step being repeated until an image is acquired on which said interference fringes are attenuated relative to to said initial image, the intensity of the current then corresponding to said critical intensity.
    By attenuated interference fringes, it is meant that these interference fringes are not visible or, when they are visible, are attenuated with respect to those of the initial image. Two adjacent transverse interference fringes on the initial image may be characterized by a contrast indicator representing a contrast between said interference fringes. Attenuation corresponds to a reduction of said contrast indicator by at least 25% or more.
    The method may comprise any of the following features, taken alone or in technically feasible combinations:
    Said critical intensity is lower than said threshold intensity. It can be between 0.5 times the threshold intensity and the threshold intensity, and preferably between 0.7 times or 0.8 times the threshold intensity and the threshold intensity.
    In the preliminary steps i) to iii), a reference sample, representative of said observed sample, is arranged between the image sensor and the laser diode. Alternatively, during preliminary steps i) to iii), no sample is disposed between the image sensor and the laser diode. The sample comprises a diffractive element capable of forming a diffraction wave under the effect of illumination by said light wave, such that the image sensor is exposed to a wave, called the exposure wave, comprising the incident light wave transmitted by the sample, as well as said diffraction wave. The sample may in particular comprise a liquid, such as a biological liquid in which particles bathe, the thickness of the sample being for example between 50 pm and 2 cm. The sample may also be a fabric slide whose thickness is less than 50 μm.
    During step b), the intensity of the supply current is between 0.5 times the threshold intensity and said threshold intensity, or even between 0.5 times the threshold intensity and 0.9 times the threshold intensity. Preferably, this intensity is between 0.7 and 0.9 to 0.95 times the threshold intensity.
    The laser diode emits in the visible spectral range.
    Another object of the invention is a method of observation of a sample, comprising the following steps: a) illumination of said sample with the aid of a laser diode, capable of producing a light wave, called incident light wave, propagating towards the sample; b) acquiring, with the aid of an image sensor, an image of the sample formed in a detection plane, the sample being placed between the laser diode and the image sensor, each image being representative of a light wave transmitted by the sample under the effect of said illumination, the method being characterized in that at said laser diode is associated a threshold intensity, corresponding to an intensity of a feed current of the diode beyond which a laser effect is obtained, and that during the illumination of the sample, the laser diode is powered by a supply current whose intensity is strictly less than the threshold intensity, and for example between 0.5 times the threshold intensity and said threshold intensity.
    Preferably, the intensity is between 0.7 times the threshold intensity and 0.9 to 0. 95 times the threshold intensity. Other advantages and features will emerge more clearly from the following description of particular embodiments of the invention, given by way of non-limiting examples, and represented in the accompanying drawings in which:
    FIGURES
    FIG. 1 represents an example of a device for observing a sample.
    FIG. 2A represents an evolution of the light power emitted by a laser diode as a function of the intensity of the supply current of said laser diode. FIG. 2B shows an evolution of the light spectrum of a laser diode as a function of the intensity of the supply current of the laser diode. FIG. 2C represents an evolution of the coherence length of the light wave emitted by said laser diode as a function of the intensity of the supply current of the laser diode.
    FIGS. 3A, 3B, 3C, 3D, 3E, 3F represent images of a sample obtained using the device described with reference to FIG. 1, considering different intensities of the supply current of the laser diode allowing the illumination of the sample.
    FIG. 4A represents the evolution of the radial profile of a diffraction pattern present in FIGS. 3A, 3B, 3C, 3D, 3E and 3F as a function of the intensity of the supply current of the laser diode.
    FIG. 4B represents the evolution of the standard deviation of the profile represented in FIG. 4A as a function of the intensity of the supply current of the laser diode.
    FIGS. 5A and 5B represent images obtained using the device represented in FIG. 1, without a sample interposed between the laser diode and the sample, the intensity of the supply current of the laser diode being respectively increased to two. different values, respectively below and above a so-called threshold intensity.
    FIG. 5C represents an evolution of a coefficient of variation representative of a background of images obtained with the aid of the device represented in FIG. 1, a fluidic chamber filled with liquid being interposed between the laser diode and the sample, this coefficient of variation evolving as a function of the intensity of the supply current of the laser diode.
    FIGS. 6A, 6B, 6C, 6D, 6E and 6F represent, as a function of a reconstruction distance, the intensity of pixels extending along a line in a reconstructed image, the latter being obtained by applying a reconstruction algorithm holographic respectively on images, acquired by the image sensor, of two balls obtained using different intensities of the power supply current of the laser diode.
    FIG. 7A represents an image of a sample obtained with a device of the prior art, the light source being a light-emitting diode. FIG. 7B represents an image of a sample made with a device according to the invention, the intensity of the laser diode being judiciously adjusted.
    DESCRIPTION OF PARTICULAR EMBODIMENTS
    FIG. 1 represents an exemplary device that is the subject of the invention. A laser diode 11 is capable of producing a light wave 12, referred to as an incident light wave, in the direction of a sample 10, along an axis of propagation Z. In this example, the laser diode is a diode marketed by Civillaser, emitting at a wavelength close to 405 nm. Thus, the laser diode emits in the visible spectral range. Sample 10 may be a biological sample that it is desired to characterize. The sample 10 may also comprise a medium 14, solid or liquid, comprising particles 13 to be characterized. It may for example be biological particles in a culture medium, or in a body fluid. By biological particle is meant a cell, a bacterium or other microorganism, a fungus, a spore, etc. The term particles may also refer to microbeads, for example metal microbeads, glass microbeads or organic microbeads, commonly used for work in biological protocols. It may also be insoluble droplets bathed in a liquid medium, for example lipid droplets in an oil-in-water emulsion. Thus, the term particle refers to both endogenous particles, initially present in the sample examined, and exogenous particles, added to this sample prior to analysis. In general, a particle has a size advantageously less than 1 mm, or even less than 500 μm, and preferably a size of between 0.5 μm and 500 μm. The thickness ε of the sample 10 makes it possible to transmit a portion of the incident light 12 to the image sensor 20, forming a transmitted light wave 22. When the sample is a liquid comprising particles, the thickness ε can be between a few tens of microns and a few millimeters, or even centimeters, depending on the attenuation of the incident light by the sample.
    In another example, the sample may be a thin tissue slide, or anatomopathology slide, having a thin layer of tissue deposited on a transparent slide. By thin thickness is meant a thickness preferably less than 100 μm, and preferably less than 10 μm, typically a few micrometers.
    The distance Δ between the laser diode and the sample is preferably greater than 1 cm. It is preferably between 2 and 30 cm. Preferably, the laser diode, seen by the sample, is considered as point. This means that its diameter (or diagonal) is preferably less than one-tenth, better one-hundredth of the distance between the sample and the laser diode. Thus, preferably, the light arrives at the sample in the form of plane waves, or can be considered as such.
    The device comprises an image sensor 20, able to form an image according to a detection plane P20. In the example shown, it is a matrix photodetector comprising a matrix of pixels, CCD type or a CMOS. CMOS are the preferred image sensors because the pixel size is smaller, which allows to acquire images whose spatial resolution is more favorable. The image sensor comprises a matrix of pixels 17, above which a transparent protection window 18 is arranged. In this example, the transparent protection window 18 is placed at 125 μm from the matrix of pixels 17 and its thickness. is 400 pm. The distance between the pixel matrix 17 and the protection window 18 is generally between a few tens of pm to 150 or 200 pm. In this example, the detector is an 8-bit CMOS sensor comprising 3884 x 2764 pixels, with an inter-pixel pitch of 1.67 μm. The detection plane P2o preferably extends perpendicularly to the propagation axis Z of the incident light wave 12. The image sensors whose inter pixel pitch is less than 3 μm are preferred, in order to improve the resolution space of the image.
    In this example, the distance d between the sample 10 and the pixel array 17 of the image sensor 20 is less than 2 cm, and preferably less than 1 cm. It is for example of the order of 5 mm. The proximity of the sample 10 and the image sensor 20 provides a wide field of view. Alternatively, it is possible to bring the sample closer to the laser diode, in which case the field of view decreases. However, such a configuration makes it possible to obtain more detailed information on the sample.
    Note the absence of magnification optics between the image sensor 20 and the sample 10. This does not prevent the possible presence of microlenses focusing at each pixel of the image sensor 20, the latter n having no function of magnifying the image.
    Under the effect of the incident light wave 12, the sample 10 can generate a diffracted wave 23, capable of producing, at the level of the detection plane P20, interference, in particular with the light wave 22 transmitted by the sample. These interferences give rise, on the image 25 acquired by the image sensor 20, to a plurality of elementary diffraction patterns 26, each elementary diffraction figure comprising a central zone and several concentric diffraction rings, each ring constituting a fringe circular interference. Each elementary diffraction pattern is due to a diffractive object 13 in the sample, in this case a particle. The light wave 24 to which the image sensor 20 is exposed comprises: a component 23 resulting from the diffraction of the incident light wave 12 by the sample; a component 22 resulting from the transmission of the incident light wave 12 by the sample.
    These two components generate interference on the image acquired by the image sensor, these interferences being in the form of elementary diffraction patterns 26. Examples of elementary diffraction patterns will be presented later, in connection with FIGS. 3A. at 3F, or 7A and 7B. Generally, each diffractive element in the sample may be associated with an elementary diffraction pattern 26. The closer the sample 10 is to the laser diode 11, the more the elementary diffraction patterns 26 are detailed, the number of identifiable rings on the image sensor being higher. The closer the sample 10 is to the image sensor 20, the larger the field of view, leading to the observation of a larger number of elementary diffraction patterns 26 on the same image 25.
    A processor 30, for example a microprocessor, is able to process each image acquired by the image sensor 20. In particular, the processor is a microprocessor connected to a programmable memory 32 in which is stored a sequence of instructions to perform the image processing operations and calculations described in this description. The processor 30 can also be connected to a screen 34.
    An example of image processing is the application of a holographic reconstruction algorithm, making it possible to reconstruct an image 28, called the reconstructed image, from the image 25 acquired by the image sensor. This type of algorithm is conventional and will be discussed later in the description, with reference to FIGS. 6A to 6F.
    The laser diode 11 is connected to an electric circuit 11c, enabling the laser diode to be fed with an electric current. The laser diode 11 comprises an active zone, made of a semiconductor material. Beyond a certain intensity value, called the laser threshold intensity is, a laser emission is observed. This laser threshold intensity is corresponds to an injection of electrons sufficient to obtain a laser effect in the active zone of the laser diode.
    The laser diode used is intended to be powered by a supply current whose nominal intensity is equal to 150 mA. The inventors measured the optical power delivered by the laser diode with the aid of an optical power meter, as a function of the intensity i of the supply current. Three measurements were made, at three different times 1,2 and 3, by varying the intensity i of the supply current, on either side of the nominal current, between 15 mA and 170 mA. The curves obtained are shown in FIG. 2A. There is a variation in the optical power characteristic of a laser diode. Each curve has: a first part, in which the injection of charges into the active zone is insufficient. According to this first mode of operation, the emission of light by the laser diode is said to be spontaneous, and the emitted light power is proportional to the density of charge carriers injected into the active zone, that is to say at the same time. intensity i of the supply current; a second part, in which the charge injection is sufficient to significantly increase the efficiency of the laser diode, resulting in an appearance of so-called stimulated light emission. According to this second operating regime, or laser operating regime, a laser effect is obtained and the optical power increases linearly with the intensity i, with an amplification effect resulting in an increase in the slope of the curve. The nominal intensity in the laser diode, equal to 150 mA, corresponds to this operating regime.
    A transition between the first and second operating regimes appears between 125 mA and 135 mA, without a precise value being established. Indeed, the properties of the laser diode fluctuate, in particular as a function of temperature. Moreover, there is a so-called transient operating regime T between the two operating modes previously mentioned, in which the emission of the diode is stimulated, without compensating for certain losses of the diode. The evolution of the optical power with the intensity is no longer linear, because of said losses. In the curves shown, this transient regime extends between intensities t of the supply current of between 120 and 135 mA. It can then be considered that the threshold current value ts, corresponding to a supply current of the diode said laser threshold current, is 140 mA.
    In this description, the threshold intensity is the intensity beyond which amplification of the stimulated light occurs, which corresponds to the minimum intensity of the laser operating regime (regime //) described above. As can be seen in FIG. 2A, this threshold intensity is the intensity beyond which the optical power, resulting from the laser effect, increases linearly with the intensity of the supply current of the laser diode. . At each value of the intensity i, the emission spectrum of the light wave 12 produced by the laser diode 11 has also been determined with the aid of a spectrometer. The different spectra are shown in FIG. 2B. Each spectrum has an emission peak centered on a central wavelength λ0 of 401 nm. What is expected is an enlargement of the emission peak when the intensity i of the supply current is lower than the threshold value h-
    The coherence length Lc of the light wave 12 produced by the laser diode 11 can be determined by the following expression: ## EQU1 ## where λ denotes the wavelength.
    This expression is valid provided that the peak of the emission spectrum is comparable to a Gaussian distribution, which is the hypothesis adopted in this example.
    The coherence length Lc reflects the fact that if two objects, behaving as secondary light sources, for example reflective or diffracting objects, are spaced a distance less than the coherence length, the light waves emitted by these objects form interference.
    FIG. 2C represents the coherence length Lc of the light wave 12 emitted by the laser diode as a function of the intensity i of the supply current. This coherence length is small, of the order of a few tens of microns, and less than 50 microns (micrometers), or even 20 microns, when the intensity i of the feed current is lower than the threshold intensity is. Beyond the intensity threshold is, the coherence length reaches or exceeds 100prn, and can not be determined with great accuracy because of the spectral resolution of the spectrometer used.
    The coherence length Lc is a parameter determining the ability of an observed sample to form detectable interferences. In the example shown in FIG. 1, the sample comprises a transparent liquid 14, or which can be considered as such, in which particles 13 are immersed. These particles are diffracting and cause the appearance of diffraction patterns 26 on images. 25 formed by the image sensor 20.
    The inventors have studied the effect of a variation of the intensity i of the feed current of the laser diode 11 on the images acquired by the image sensor 20. FIGS. 3A, 3B, 3C, 3D, 3E and 3F represent respectively images of a sample while the intensity i of the power supply current of the laser diode is respectively 41 mA, 67 mA, 92 mA, 110 mA, 126 mA, 135 mA. In these figures, elementary diffraction patterns 26 appear, most of which can be associated with a particle 13 present in the sample 10. In this example, the sample consists of a mixture of latex beads of diameters 3 μm and 6 μm. arranged in a PBS salt buffer, the acronym for Phosphate Buffered Saline, meaning phosphate buffered saline. On each of these images, the exposure time has been adjusted so that the average gray level of each image is similar, so that these images are comparable despite the evolution of the illumination power. It can be observed that as the intensity of the feed current increases, the number of rings composing each diffraction pattern tends to increase, which is expected since these rings correspond to circular interference fringes. Thus, the information in the image is richer. Moreover, as indicated in connection with the prior art, such diffraction patterns can be holographically reconstructed, and it is recognized that the results of such a reconstruction are improved when the number and contrast of diffraction rings increase.
    Another observation is the appearance of transverse interference fringes 29, substantially rectilinear, and extending across the image when the intensity of the feed current is greater than or close to the threshold intensity is. The appearance of these transverse interference fringes significantly degrades the signal-to-noise ratio of the image. In contrast to the concentric interference fringes, forming the elementary diffraction patterns 26, localized in portions of an image formed by the image sensor 20, the transverse interference fringes 29 extend across the entire surface. 'picture. They constitute a noise affecting both the zones of the image having elementary diffraction patterns 26, as well as the zones of the image, forming the background of the image, devoid of elementary diffraction patterns. These transverse fringes can be rectilinear, elliptical or circular. The term transverse refers to the fact that they affect the entire image 25, extending from one edge to the other of this image.
    On each image 25, an elementary diffraction pattern 26 has been selected, a mean radial profile of which has been established. By mean radial profile is meant an amplitude profile obtained by determining an average of different elementary profiles, each elementary profile being formed along an axis 27 extending between the center of the selected diffraction pattern and an end of said figure. For the same diffraction pattern 26, several axes 27 are considered, as shown in FIG. 3A, on which the axes 27 are represented in the form of white dotted lines. The elementary figure 26 selected on each image is framed by a white dashed frame. FIG. 4A represents the average radial profile obtained on each of the images 3A to 3F. It can be seen that the higher the intensity i, the higher the number of rings.
    The standard deviation of each radial profile shown in FIG. 4A was determined. FIG. 4B illustrates the evolution of this standard deviation as a function of the intensity i of the supply current of the laser diode 11. This indicator is representative of the contrast of the selected diffraction pattern, taking into account all the rings. diffraction patterns. It reaches a maximum at i = 121 mA and then decreases when the intensity exceeds this value. The higher the contrast of a diffraction pattern, the more identifiable this figure is and the better the quality of a reconstructed image based on this diffraction pattern. FIGS. 3A to 3F, as well as FIGS. 4A and 4B show that there is an optimum intensity range of the diode supply current, between 60 mA and 125 mA, in which the contrast of the diffraction figures 26 is high. They also show that beyond 130 mA, the appearance of interference fringes, affecting the entire image 25, considerably increases the noise level of the image. In addition, this noise is non-stationary, which makes it difficult to eliminate. Thus, it is important to use the laser diode by adapting its feed current so that its intensity i is high enough that the diffraction patterns are contrasted, and have a sufficient number of diffraction rings, while being below a critical intensity intensity ic, beyond which appear interference fringes extending through the image acquired by the image sensor 20. In this example, it is found that the optimal range the intensity of the supply current extends between 60 mA and 135 mA, ie about 0.5 times the threshold intensity is and said threshold intensity is, and seems particularly optimal between 80 mA and 120 mA, that is between 0.6 times and 0.9 times said threshold intensity is.
    FIGS. 5A and 5B show images obtained by the image sensor 20 without interposing the sample 10 between the image sensor 20 and the laser diode 11, the intensity i of the supply current being respectively equal to 120 mA , or below the threshold intensity is, and 140 mA, is greater than or equal to the threshold intensity. The appearance of the interference fringes is observed when the intensity exceeds a critical value ic, the latter being less than or equal to the threshold intensity is. It seems that too much coherence length is detrimental to the quality of the images acquired by the sensor. It is therefore preferable to adjust the intensity i of the supply current of the laser diode so that the coherence length of the light wave 12 emitted by the laser diode is less than 100 μm, or even less than 80 μm. or 50 pm. The inventors attribute the appearance of such interference fringes to spurious reflections occurring between the pixel array 17, and the detector protection window 18, about 100 μm apart from said pixel array. Such fringes may also appear when the sample has two parallel interfaces separated by this order of magnitude. Typically, the thickness ε of an observed sample is between 20 μm and 200 μm, or even 500 μm.
    The inventors have evaluated the evolution of a coefficient of variation CV of images acquired by the image sensor 25 by varying the intensity i of the supply current of the laser diode 11 between 70 mA and 150 mA. sample 10 consisting of a fluidic chamber of thickness ε = 100 μιτι, filled with a salt buffer, without diffracting particle. By coefficient of variation CV of an image is meant the standard deviation of the image divided by the average of said image. The exposure time of each image has been adjusted so that the average intensity of each image is constant, in order to compensate for the variation of the illumination power of the diode. This coefficient of variation has been calculated by excluding certain parts of the image having parasitic diffraction patterns. It is therefore representative of the "background" of each image, that is to say of the zone devoid of any diffraction patterns. FIG. 5C represents the evolution of this coefficient of variation CV as a function of the intensity i of the supply current of the laser diode. Stability is observed between 70 mA and 120 mA, followed by a significant increase reflecting the appearance of a structuring of the image, that is to say the interference fringes previously mentioned in connection with FIGS. 3F. and 5B.
    The inventors have found that by placing a sample between the image sensor and the laser diode, the critical intensity could vary. It therefore seems that the appearance of the interference fringes is also dependent on the sample placed between the laser diode 11 and the image sensor 20.
    As a result, the intensity i of the feed current of the laser diode 11 is preferably adjusted on a case-by-case basis, by performing the following preliminary steps: acquisition of an initial image, under the nominal conditions of using the laser diode, that is to say by adopting an intensity i of the supply current greater than the threshold intensity is, so that the light wave 12 emitted by the laser diode is obtained by laser effect . This image has transversal interference fringes making it unsuitable for holographic reconstruction; variation of the intensity i of the supply current of the laser diode and in particular reduction of this intensity, and acquisition of an image by the image sensor, this step being repeated until a significant attenuation of the fringes of transversal interference. When such attenuation is observed, it is considered that the intensity of the supply current of the laser diode corresponds to said critical intensity ic. The intensity i of the feed current of the laser diode 11, suitable for the observation of a sample by imaging without a lens, is then determined as a function of this critical intensity ic. It can be equal to this critical intensity, or slightly lower, for example between 0.8 ic and ic. It is considered that this intensity i must preferably be close to the critical intensity. Beyond this, the interference fringes appear. Beyond that, the optical power decreases. By being placed below the critical intensity, for example below 0.9 ic 0 0 95 ic, one avoids possible fluctuations of the critical intensity, for example under the effect of drifts of the laser diode, for example thermal drifts. Such a "safety margin" can be useful.
    The steps mentioned above are qualified as preliminary steps, because they are implemented before the observation of a sample. They are preferably carried out by placing a so-called reference sample 10ref, representative of the samples to be observed later. They can also be implemented without sample, the image sensor 20 being placed directly opposite the laser diode 11, without an interposed sample.
    Two consecutive interference fringes may be characterized by an ind contrast indicator, representing a difference between a maximum intensity level Smax, representative of a light fringe and a minimum intensity level Smin, representative of a dark fringe. adjacent to said clear fringe. The contrast indicator can be obtained by a simple difference Smax - Smin, or by normalizing this difference by a sum Smax + S.
    Jmin-
    Thus, the contrast indicator can be expressed as follows:
    expression (3) corresponding to a usual definition of contrast. The critical intensity ic is reached when the interference fringes no longer appear significantly on the image acquired by the image sensor, or they are attenuated sufficiently significantly. Thus, a so-called significant attenuation corresponds to a decrease in the ind contrast indicator, relative to the transverse interference fringes, of 25%, or even 50%, or even 80% or more, between the initial image and the image obtained at critical intensity.
    As previously mentioned, each image acquired by the image sensor can be holographically reconstructed, to convolute said image by a propagation operator h (x, y, z). The propagation operator h (x, y, z) has the function of describing a propagation of light between the image sensor 20 and a coordinate point (x, y, z). The principles of holographic reconstruction are described, for example, in Ryle et al, "Digital in-line holography of biological specimens", Proc. Of SPIE Vol.6311 (2006). A holographic reconstruction makes it possible to determine a complex expression U (x, y, z) of the light wave 24, to which the detector is exposed, at any point of coordinates (x, y, z) of space, and in a plane at a distance | z | of the image sensor. It is then possible to determine the amplitude u (x, y, z) and the phase cp (x, y, z) of this light wave according to the expressions:
    The operators abs and arg designating respectively the module and the argument.
    Digital reconstruction can be based on the Fresnel diffraction model. In this example, the propagation operator is the Fresnel-Helmholtz function, such that:
    where λ is the wavelength,
    where x 'and y' denote the coordinates in the plane of the image sensor; S (x ', y') represents the intensity of the image acquired by the image sensor at the coordinates x 'and y'; x and y denote the coordinates in the reconstruction plane, the latter being situated at a distance λ from the image sensor; z designates the coordinate of the reconstructed image along the propagation axis Z of the incident light wave.
    The inventors obtained an image 25, with the aid of the device represented in FIG. 1, by arranging two latex beads of diameter 6 μιη side by side, at the bottom of a fluid chamber of thickness 100 μm, filled with a previously defined PBS saline buffer. The image 25 was acquired by the image sensor 20 by modulating the intensity i of the power supply current of the laser diode 11, between 41 mA and 135 mA.
    This image was the subject of a holographic reconstruction, according to the principles explained above, considering a value of z equal to the distance between the image sensor and said beads. The images 6A, 6B, 6C, 6D, 6E and 6F show the intensity of the pixels of the reconstructed images 28 as a function of the reconstruction distance | z |. More precisely, each image represents a distribution of the intensity of the pixels located along a line passing through the two balls, as a function of the reconstruction distance | z |, the intensity i of the power supply current of the laser diode 11 amounting respectively to 41 mA, 67 mA, 92 mA, 110 mA, 126 mA and 135 mA. The dotted line corresponds to a reconstruction distance equal to the distance between the detector and the balls. It is observed that FIG. 6E, corresponding to i = 126 mA, is optimal, given that the images 6D (i = 110 mA) or 6C (i = 92 mA) also allow a clear separation of the balls on the reconstructed image 28. The image 6F (t = 135 mA) allows a satisfactory separation, but is affected by a high background noise in the rest of the image, due to the presence of the transverse interference fringes previously described.
    FIGS. 7A and 7B show images acquired with the aid of an image sensor when the light source is respectively a blue light-emitting diode, and a laser diode whose intensity is equal to the critical intensity ic, in this case 125 mA. The diffraction patterns formed in FIG. 7B include more identifiable diffraction rings than those formed in FIG. 7A. The use of a laser diode, subject to adjustment of the intensity of its power supply, makes it possible to obtain a more accurate observation of a sample. The invention may be implemented in the analysis of a body fluid, for purposes of detecting and / or identifying particles that make up said fluid. It can also allow the characterization of thin biological tissue slides. Apart from biology, the invention may be applied to the detection and / or identification of particles in industrial fluids, in the food industry, or in solid matrices.
    权利要求:
    Claims (9)
    [1" id="c-fr-0001]
    1. Method for observing a sample (10), comprising the following steps: a) illumination of said sample with the aid of a laser diode (11), able to emit an incident light wave (12) propagating towards the sample, said laser diode being fed with a supply current, such that a laser effect is obtained when an intensity of said supply current (i) exceeds a so-called threshold intensity (ts); b) acquiring, with the aid of an image sensor (20), an image (25) of the sample, the latter being disposed between the laser diode (11) and the image sensor (20). ), each image being representative of a light wave (24) transmitted by the sample under the effect of said illumination; the method being characterized in that the intensity (i) of the supply current of said laser diode is less than or equal to a critical intensity (ic), said critical intensity being determined, prior to step a) according to the following preliminary steps: i) placing said laser diode (11) so that the incident light wave (12) it emits propagates to the image sensor (20); ii) supplying said laser diode (11) with an initial said feed current whose intensity is greater than or equal to said threshold intensity (is), and acquisition of an image, called said initial image, by said sensor of said image, said initial image having transverse interference fringes; iii) modifying the intensity of said feed stream and acquiring an image by the image sensor (20), this step being repeated until the acquisition of an image having attenuated transverse interference fringes relative to said initial image, the intensity of the supply current then corresponding to said critical intensity (Ic).
    [2" id="c-fr-0002]
    A method of observing a sample (10) according to claim 1, wherein said critical intensity (cc) is less than said threshold intensity (ts).
    [3" id="c-fr-0003]
    The method of observing a sample (10) according to claim 2, wherein said critical intensity is between 0.7 times the threshold intensity (ts) and said threshold intensity (ts), or between 0.8 times the intensity. threshold (is) and said threshold intensity (is).
    [4" id="c-fr-0004]
    4. A method of observing a sample according to any one of the preceding claims, wherein on the initial image, two adjacent transverse interference fringes are characterized by a contrast indicator (ind), representative of a contrast between said interference fringes, said critical intensity corresponding to a reduction of said contrast indicator by a factor greater than 25%.
    [5" id="c-fr-0005]
    5. A method of observing a sample (10) according to any one of the preceding claims, wherein during the preliminary steps i) to iii), a reference sample, representative of said observed sample, is arranged between the sensor of image (20) and the laser diode (11).
    [6" id="c-fr-0006]
    6. A method of observing a sample (10) according to any one of claims 1 to 4 wherein in the preliminary steps i) to iii), no sample is disposed between the image sensor (20). and the laser diode (11).
    [7" id="c-fr-0007]
    7. A method of observing a sample (10) according to any one of the preceding claims, wherein the sample (10) comprises a diffractive element (13) capable of forming a diffraction wave (23) under effect of illumination by said light wave (12), such that the image sensor is exposed to a wave, said exposure wave (24), having the incident light wave transmitted (22) by the sample, as well as said diffraction wave (23).
    [8" id="c-fr-0008]
    8. A method of observing a sample (10) according to claim 1, wherein during step b) the intensity of the current supply (i) is between 0.5 times the threshold intensity and said intensity threshold (is).
    [9" id="c-fr-0009]
    9. A method of observing a sample (10) according to claim 1, wherein during step b) the intensity of the current supply (i) is between 0.5 times the threshold intensity (is) and 0.9 times said threshold intensity or between 0.7 times the threshold intensity and 0.9 times said threshold intensity.
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    法律状态:
    2016-12-29| PLFP| Fee payment|Year of fee payment: 2 |
    2017-06-30| PLSC| Publication of the preliminary search report|Effective date: 20170630 |
    2018-01-02| PLFP| Fee payment|Year of fee payment: 3 |
    2019-12-30| PLFP| Fee payment|Year of fee payment: 5 |
    2020-12-28| PLFP| Fee payment|Year of fee payment: 6 |
    2021-12-31| PLFP| Fee payment|Year of fee payment: 7 |
    优先权:
    申请号 | 申请日 | 专利标题
    FR1563320|2015-12-24|
    FR1563320A|FR3046238B1|2015-12-24|2015-12-24|METHOD FOR OBSERVING A SAMPLE BY IMAGING WITHOUT LENS|FR1563320A| FR3046238B1|2015-12-24|2015-12-24|METHOD FOR OBSERVING A SAMPLE BY IMAGING WITHOUT LENS|
    JP2018532589A| JP6832355B2|2015-12-24|2016-12-22|A method for observing a sample by lensless image processing|
    EP16829278.7A| EP3394591B1|2015-12-24|2016-12-22|Observation method of a sample by imaging without a lens|
    PCT/FR2016/053648| WO2017109428A1|2015-12-24|2016-12-22|Method for observing a sample by lensless imaging|
    KR1020187020921A| KR20180097679A|2015-12-24|2016-12-22|Method for observing a sample by lensless imaging|
    CN201680079063.8A| CN108496070B|2015-12-24|2016-12-22|Method for observing a sample by lens-free imaging|
    US16/065,527| US11221290B2|2015-12-24|2016-12-22|Method for observing a sample by lensless imaging|
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