• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    A Brillouin retroreflective analysis measurement system, comprising a laser emission device (10) configured to emit an incident wave (v0) and a reference wave (v0-vB), the incident wave having an incident frequency (v0) and the reference wave having a reference frequency (v0-vB), the reference frequency (v0-vB) being shifted from the incident frequency (v0) by a predetermined value (vB). The system is configured to: project the incident wave (v0) into the optical fiber (25); receive back a retroreflected wave (v0-vS); generating a composite wave (v0-S, 0-B) combining the retroreflected wave (v0-vS) and the reference wave (v0-vB); and determining at least one property relating to the fiber by analysis of a Brillouin spectrum of the composite wave (v0-S, O-B). Advantageously, the incident wave and the reference wave come from a vertical cavity-emitting laser source (12) which is part of the laser emission device.
    公开号:FR3041425A1
    申请号:FR1558913
    申请日:2015-09-22
    公开日:2017-03-24
    发明作者:Aghiad Khadour；Jean-Louis Oudar
    申请人:Centre National de la Recherche Scientifique CNRS；Institut Francais des Sciences et Technologirs des Transports de lAmenagement et des Reseaux；
    IPC主号:
    专利说明:

    FIELD OF THE INVENTION The invention relates to a Brillouin retroreflective analysis measurement system of the type comprising a laser emission device configured to emit an incident wave and a reference wave, the incident wave having an incident frequency and the reference wave having a reference frequency, the reference frequency being shifted from the incident frequency by a predetermined value, the system being configured to, when connected to at least a first end of an optical fiber: - project the wave incident in said first end of the fiber; receiving back, at the first end of the fiber, a retroreflected wave; generating a composite wave combining at least the retroreflected wave and the reference wave; determining at least one property relating to the fiber by analyzing a Brillouin spectrum of the composite wave.
    The fiber-related property determined by Brillouin spectrum analysis of the composite wave may be any property of the fiber whose variations vary (or affect) the Brillouin spectrum of the retroreflected wave emitted by the fiber. For example, the temperature at which the fiber is carried, and / or the shape of the fiber (and therefore its deformation), are properties of the fiber whose variations vary (or affect) the Brillouin spectrum of the retroreflected wave. .
    In a manner known per se, the Brillouin spectrum analysis of a wave is a treatment or a set of treatments for determining information based on at least the frequency components called 'Brillouin' present in the wave considered.
    BACKGROUND
    For several years have been developed measurement systems by Brillouin retroreflection analysis by optical heterodyning of the type indicated above. These systems notably make it possible to acquire temperature and / or deformation information relating to objects, in particular large objects such as for example structures.
    In this case, in a manner known per se, a system of the type presented above is used connected to an optical fiber arranged in the studied object. It then allows to project a wave, said incident wave, in the optical fiber. The analysis of the retroreflected wave received back at the output of this fiber makes it possible to determine certain temperatures and / or deformations of the studied object. The retroreflected wave has, due to the Brillouin scattering, frequency components offset with respect to the frequency of the incident wave, as shown in FIG. 1: In the case where the incident wave is essentially a monochromatic wave of frequency vO, the retroreflected wave has, in addition to the vO component, at least two frequency components called Stokes and anti-Stokes, respectively offset by a difference + vS and - vS with respect to the frequency vO; this gap is called the Brillouin frequency offset.
    The optical heterodyning technique consists of mixing the retroreflected wave with the reference wave and analyzing the beat frequency obtained between these two waves.
    The frequency vO-vB or vO + vB of the reference wave (vO-vB in FIG. 1) is preferably chosen so as to be close to that of one or other of the Stokes and anti-Stokes components. (vO-vS or vO + vS). As a result, the composite wave obtained by combining the retroreflected wave with the reference wave has a beat whose frequency Δν, advantageously, is relatively low. For example, the beat frequency may be in a frequency band below 1 GHz.
    As the beat frequency is rather low, advantageously it can be measured using electronic / optoelectronic components inexpensive and simple to implement.
    The known measuring systems of the type indicated above are essentially divided into two families.
    In the first family, the incident wave and the reference wave are produced from a single laser source. The frequency offset between these two waves is obtained by a frequency translation unit, such as an acousto-optic modulator. This solution makes it possible to perform optical heterodyning with a low frequency, but with a very low efficiency, because there is no phase relationship between the optical components that make the beat.
    In the second family, the incident wave and the reference wave are produced from two distributed feedback laser sources, or distributed laser laser DFB.
    Such a system is for example presented by the document US2015 / 0003834 A1. However, the arrangement proposed, with two DFB lasers, has the disadvantage of its complexity and its price, related to the presence of two laser sources; it also presents the problem that the coupling proposed for the two DFB lasers is also relatively complex, expensive, and causes significant energy losses.
    In addition, such an arrangement leads to having frequency fluctuations between the waves emitted by the two lasers, as well as variations in the energy transported by the waves (amplitude noise).
    This arrangement is therefore not very efficient to achieve a measurement system by Brillouin retroreflective analysis.
    PRESENTATION OF THE INVENTION The objective of the invention is therefore to overcome the drawbacks of the measurement systems presented above, and to propose a measurement system making it possible to acquire information by Brillouin retroreflective analysis, such as temperature and temperature information. / or deformation, which can be implemented for long periods (up to several tens of years), little intrusive, providing information of preference in real time, low cost, on one or more objects possibly distributed on a long distance (greater than one kilometer, for example).
    This objective is achieved by means of a Brillouin retroreflective analysis measurement system of the type presented in the introduction, in which the incident wave and the reference wave come from a vertical cavity-emitting dual-frequency laser source emitting from the surface. This laser source is a natural part of the laser emission device.
    Such a laser source may for example be of the type described by the document Class-A dual-chip VECSEL at telecom wavelenath. by M.Syamsundar et al., OPTICS Magazine LETTERS / Vol.39, No. 19, October 1, 2014, pages 5586-5589.
    Advantageously, the use of such a source ensures the optical coherence of the incident wave and the reference wave.
    Preferably, the laser source is a continuous source.
    In one embodiment, the incident wave is pretreated between its emission by the laser emission device and its projection in the optical fiber. This treatment can consist, for example, in transmitting the incident wave in the form of time pulses, in order to allow the measurement of a position in the fiber to which the retroreflected wave is emitted by optical time domain reflectometry (OTDR 'English Optical Time Domain Reflectometry').
    Similarly, the reference wave may optionally be pretreated between its emission by the laser emission device and its combination with the retroreflected wave. The invention can be implemented in a very wide spectral range.
    In a preferred embodiment, the wavelength of the incident wave is between 1.3 μm and 1.8 μm, and preferably between 1.5 μm and 1.6 μm. The wavelength of the incident wave may in particular be 1.55 μm. This wavelength corresponds to a frequency shift of the order of 11 GHz. A wavelength of 1.3 pm corresponds to a frequency shift of the order of 12 GHz, which is also a frequency in which the optical fibers have good transmission characteristics.
    When the wavelength of the incident wave is between 1.3 μm and 1.8 μm, preferably the value of the frequency difference (vB) between the incident wave (vO) and the reference wave ( vO-vB) is in the range 10-12 GHz. Indeed, when the wavelength of the incident wave is close to 1.55 pm, the Brillouin frequency shift vS between the reference wave vO and Stokes components vO-vS and Anti-Stokes vO + vS of the retroreflected wave is of the order of 11 GHz.
    In one embodiment, the measurement system is configured to allow retroreflection analysis in 'Spontaneous Brillouin' mode. In this embodiment, the retroreflected wave is a retroreflected wave in the fiber following the injection of the incident wave, independently of any other wave possibly present in the fiber. The incident wave is then projected at the first end of the fiber and the retroreflected wave is received at this same first end of the fiber.
    Conversely, the measurement system can also be configured to allow retroreflection analysis in 'stimulated Brillouin' mode. The measurement system is then configured to also project a second wave to the second end of the fiber. The optical fiber is crossed by two contrapropagative waves coming from its two ends; the meeting of these two waves gives rise to a wave, called retroreflected wave, which includes the Brillouin spectral components and is received at the first end of the fiber (the one where the incident wave is injected into the fiber). The invention also relates to a temperature and / or deformation sensor, comprising at least one measuring system as described above, and at least one optical fiber to which said system is connected, said at least one property determined by the system comprising a temperature and / or a deformation of a portion of the fiber. The invention also relates to the use of a temperature and / or deformation sensor as defined above for measuring a temperature or a deformation of an object on and / or in which the optical fiber is disposed. The object can be for example a work of art, an industrial part, a part of vehicle (wing of plane ..), etc.
    One or possibly several optical fibers are then placed on the surface and / or inside the object and connected to the measurement system according to the invention.
    Thanks to these optical fibers placed on or in the object under consideration, the measurement system then makes it possible to measure the temperature and / or the deformation thereof.
    BRIEF DESCRIPTION OF THE DRAWINGS The invention will be better understood and its advantages will appear better on reading the detailed description which follows, of embodiments shown by way of non-limiting examples. The description refers to the accompanying drawings, in which: FIG. 1 already described is a schematic diagram showing the variations of intensity, as a function of frequency, of an incident wave, of Stokes and anti-Stokes components of a retroreflected wave, and a reference wave; FIG. 2 is a schematic view of a measurement system in a first embodiment of the invention, allowing spontaneous Brillouin Brillouin retroreflection analysis; FIG. 3 is a diagrammatic view of a measurement system in a second embodiment of the invention, allowing a stimulated Brillouin Brillouin retroreflective analysis; and FIG. 4 is a schematic view of a laser source that can be used in a measurement system according to the invention.
    DETAILED DESCRIPTION OF THE INVENTION
    Spontaneous Brillouin
    Referring to Figure 2, a measurement system 100 by Brillouin retroreflective analysis according to the invention will now be presented. In this embodiment, the measurement system 100 is based on spontaneous spontaneous Brillouin retroreflection occurring spontaneously in a fiber to which the measurement system is connected, in response to sending an incident wave vO.
    The measurement system 100 associated with the optical fiber 25 constitutes a temperature and strain sensor 150 within the meaning of the invention. In the example shown, the fiber 25 is placed inside an object 1000; the sensor 150 thus makes it possible to measure the temperature and the deformations of the object 1000.
    The measurement system 100 comprises a laser emission device 10, a first optical mixer 20, a second optical mixer 30, an optical detector 40, an electronic frequency analyzer 50, and a synchronization system 15.
    In the system 100, the laser emission device 10 is a device for producing an incident wave vO and a reference wave vO-vB, both substantially monochromatic (for simplicity, the waves are named after their main frequency component, namely in this case vO and vO-vB). The frequency difference vB between the two waves v0 and v0-vb is equal to the Brillouin frequency offset. This Brillouin frequency offset has a fixed value, which essentially depends on the wavelength of the incident wave. For a wavelength of 1.55 μm, the Brillouin frequency offset is 11 GHz (in the case of silica-based optical fibers).
    The transmission device 10 comprises a laser source 12 configured to emit a primary incident wave vOA, a beam splitter cube 14 and an electro-optical modulator 16.
    The laser source 12 is a vertical cavity-emitting dual-frequency laser source (VECSEL), which will be described below in relation to FIG. 4. The primary incident wave vOA is the superposition of two waves of different frequencies, namely the incident wave, of frequency v0 (v0 is the incident frequency) and the reference wave, of frequency v0-vb (v0-vb is the reference frequency). The incident wave and the reference wave have different polarizations; this property is used to separate them. The wavelengths λ of the incident wave vO and of the reference wave vO-vB are both of the order of 1.55 μm.
    To separate these two waves, a beam splitter cube 14 is interposed on the beam of the primary incident wave vOA. It separates this beam into two beams respectively constituting the incident wave v0 and the reference wave vO-vB.
    In order to make it possible to determine the distance at which the temperature or the deformation of the fiber is measured by time domain optical reflectometry (OTDR), the incident wave vO is emitted by the laser emission device 10 in the form of successive pulses.
    In order to produce these pulses, the transmission device 10 comprises an electro-optical modulator 16. This electro-optical modulator 16 is configured to modulate the incident wave v0 and to deliver it in the form of successive pulses. The incident wave v0 thus shaped is transmitted to a first input A of the first mixer 20. The first mixer 20 transmits this wave to a second input B of the first mixer 20, which is connected to a first end 22 of the optical fiber 25 that one wishes to test. Part of the incident wave v0 is thus transmitted in the optical fiber 25.
    The second end of the optical fiber 25 is denoted 24. At the first end 22 of the optical fiber 25, the first mixer 20 collects back, in its second input B, the wave retroreflected by the optical fiber.
    This retroreflected wave has different frequency components. It includes in particular the two specific Stokes and anti-Stokes frequency components of the Brillouin spectrum. These components are shifted, with respect to the frequency of the incident wave v0, respectively of + vS and -vS. The exact value of this shift is a function of the temperature of the fiber 25, as well as the deformations thereof, and possibly other parameters.
    In the system 100, the temperature and / or the deformation of the fiber is measured by analysis of the 'anti-Stokes' component of the retroreflected wave. For this reason, the retroreflected wave is denoted v0-vS (conventionally, since it includes frequencies other than the frequency v0-vS, in particular the frequency v0 + vS). The retroreflected wave vO-vS is collected by the first mixer 20 and transmitted via an output C thereof to a first input A of the second mixer 30. The reference wave vO-vB is also transmitted to a second input B of the second mixer 30.
    The second mixer 30 then produces a composite wave referenced v0-S, 0-B in which the retroreflected wave vO-vS and the reference wave vO-vB are combined and superimposed. The composite wave v0-S, 0-B has a beat due to the interference between the vO-vS retroreflected wave and the vO-vB reference wave. The composite wave v0-S, O-B produced by the second mixer 30 is transmitted to an optical receiver 40. The latter, which may for example be a photodiode, converts the light wave that it receives into an electronic signal. S whose frequency is the beat frequency of the optical signal it receives.
    This electronic signal is transmitted to an electronic frequency analyzer 50. This determines a desired information relating to the optical fiber, from the frequency of the anti-Stokes component present in the composite wave transmitted to the optical receiver 40 and by continued, present in the electronic signal transmitted by it to the frequency analyzer 50. The analyzer 50 is typically an oscilloscope. This is synchronized with the pulse period of the electronic signal, in order to visually present the intensity variations thereof. The analysis of the composite wave v0-S, 0-B (via the signal S) makes it possible to spatially locate the events affecting the tested optical fiber. It is thus possible to quantify the deformations and / or the temperature increases affecting the fiber 25.
    In addition, the synchronization of the pulses produced by the modulator 16 is ensured by the synchronization system 15. For this purpose, it is connected to the frequency analyzer 50. From the information of the analyzer 50, it transmits control signals to the modulator 16 to regulate the operation thereof. The frequency analyzer 50 may comprise a frequency / voltage converter, which converts the frequency into a proportional voltage, and a signal processing computer, which determines a temperature and / or a deformation of the fiber from the voltage produced by the converter. The computer used for the signal processing can then be used to drive the synchronization system 15, which controls the transmission of the laser pulses emitted by the modulator 16.
    The first mixer 20 and / or the second mixer 30 may be a fiber optic coupler or an optical circulator.
    Stimulated Brillouin
    Referring to FIG. 3, a Brillouin retroreflective analysis measurement system 200 corresponding to a second embodiment of the invention will now be presented.
    This measurement system 200 is based on stimulated Brillouin retroreflection, which occurs in the fiber in response to sending an incident wave, but while the fiber is already being used to transmit the vO-vB reference wave. , the reference wave vO-vB being projected into the fiber in the opposite direction to the projection direction of the incident wave vO in the fiber.
    The measurement system 200 associated with the optical fiber 25 constitutes a temperature and deformation sensor 250 within the meaning of the invention.
    Unless otherwise indicated, the measuring system 200 and the temperature and strain sensor 250 are respectively identical to the measuring system 100 and the temperature and strain sensor 150.
    Also, the elements of the measuring system 200 having a structure or function identical or similar to the corresponding elements of the measurement system 100 bear the same reference numeral as these.
    The measurement system 200 comprises a laser emission device 10, a first optical mixer 20, an optical detector 40, an electronic frequency analyzer 50, and a synchronization system 15.
    These components are identical to those of the device 100.
    To illustrate that the first optical mixer 20 may be either a circulator or a coupler, the first optical mixer 20 in FIG. 2 is shown as a circulator, while in FIG. of coupler.
    The measurement system 200 does not include a second mixer 30 because the superposition of the retro-reflective wave vO-vS and reference wave vO-vB is directly in the fiber 25.
    Indeed, in this embodiment the reference wave vO-vB is injected into the second end 24 of the fiber 25, instead of being injected into one of the inputs of a second optical mixer (referenced 30 in FIG. the measurement system 100, and non-existent in the system 200).
    As a result, at the first end 22 of the optical fiber 25, the wave emitted by the fiber is the superposition of the retroreflected wave vO-vS and the reference wave vO-vB: this wave thus constitutes the wave composite v0-S, 0-B described in connection with the measuring system 100 described above. As in the measurement system 100, this composite wave v0-S, 0-B is transmitted to the optical detector 40 for analysis. The analysis of the Brillouin spectrum of the composite wave v0-S, 0-B makes it possible to determine the sought-after properties of the fiber, namely its deformation and its temperature.
    Advantageously, the use of time domain optical reflectometry (which is an optional improvement of the invention) makes it possible to determine the position on the fiber 25 to which the deformation and temperature information thus determined corresponds.
    Referring to FIG. 4, the laser source 12 used in the previously presented embodiments will now be presented.
    This source is a laser source of the 'VECSEL' type, that is to say a source composed of an external cavity surface-emitting semiconductor (VECSEL: vertical-external-cavity surface-emitting-laser). The specific characteristic of this source is that it makes it possible to emit at the output a wave constituted mainly by the superposition of two waves separated in frequency and polarized orthogonally. In this case, the frequency offset is about 11GHz.
    The source 12 comprises an active semiconductor structure 12A, the temperature of which is controlled by means of a Peltier 12B device.
    Optical pumping is provided by a 12C laser source.
    The semiconductor structure 12A is sized to emit a wave having a wavelength equal to 1.55 μm.
    The optical cavity 12D of the laser source 12 is arranged between the active structure 12A and a concave dielectric mirror 12E. Inside the 12D optical cavity, two elements are installed: - a 12F birefringent blade. This blade 12F induces an optical path difference as well as a spatial separation of the two orthogonal polarization waves, which promote the two-frequency and bipolarized emission (ordinary wave 'o', and extraordinary V) by reducing the coupling between the two modes. The 12F blade may be a birefringent yttrium vanadate (YV04) plate. a 12G Fabry-Perot etalon (consisting of a silica plate): It ensures a stable single-frequency laser operation on each polarization, around the targeted wavelength (1.55 μm in the embodiment shown).
    The two waves share the same laser cavity, and are subject to the same thermal and mechanical fluctuations, which ensures their very high coherence, and allows for a very efficient optical heterodyning.
    The total length of the cavity is set to provide a free spectral range greater than 13 GHz.
    The laser system has a fiber output, i.e. the laser output is injected into an optical fiber.
    Although the present invention has been described with reference to specific exemplary embodiments, it is obvious that various modifications and changes can be made to these examples without departing from the general scope of the invention as defined by the claims. In addition, individual features of the various embodiments mentioned can be combined in additional embodiments.
    In addition, there are several related techniques used to measure the Brillouin spectrum: B-OTDR (for Brillouin OTDR), Brillouin Optical Time Domain Analyzer (B-OTDA), Brillouin Optical Coherent Domain Analyzer (B-OCDA), Brillouin Optical Frequency Domain Analyzer (B-OFDA), etc. All these techniques are derived from the time domain optical OTDR technique previously described. The invention can be implemented regardless of which of these techniques is used. Therefore, the description and drawings should be considered in an illustrative rather than restrictive sense.
    权利要求:
    Claims (6)
    [1" id="c-fr-0001]
    A Brillouin retroreflective analysis measurement system, comprising a laser emission device (10) configured to emit an incident wave (vO) and a reference wave (vO-vB), the incident wave having an incident frequency ( vO) and the reference wave having a reference frequency (vO-vB), the reference frequency (vO-vB) being shifted from the incident frequency (vO) by a predetermined value (vB), the system being configured for when connected to at least a first end (22) of an optical fiber (25); projecting the incident wave (vO) into said first end (22) of the fiber (25); - receive back, at the first end of the fiber, a retroreflected wave (vO-vS); generating a composite wave (v0-S, 0-B) combining at least the retroreflected wave (v0-vS) and the reference wave (vO-vB); determining at least one property relating to the fiber by analysis of a Brillouin spectrum of the composite wave (v0-S, O-B); the system being characterized in that the incident wave and the reference wave come from a vertical cavity dual-frequency laser source (12) emitting from the surface forming part of the laser emission device (10).
    [2" id="c-fr-0002]
    2. Measuring system according to claim 1, wherein the wavelength of the incident wave (vO) is between 1.3 μm and 1.8 μm.
    [3" id="c-fr-0003]
    The measurement system of claim 1 or 2, configured to project a wave only at the first end (22) of the fiber.
    [4" id="c-fr-0004]
    4. Measuring system according to claim 1 or 2, further configured to also project a wave (vO-vB) to the second end (24) of the fiber.
    [5" id="c-fr-0005]
    A temperature and / or strain sensor, comprising at least one measuring system (100) according to any one of claims 1 to 4, and at least one optical fiber (25) to which said system is connected, said at least one property determined by the system comprising a temperature and / or a deformation of a portion of the fiber.
    [6" id="c-fr-0006]
    Use of a temperature and / or strain sensor according to claim 5 for measuring a temperature or deformation of an object (1000) on and / or wherein the optical fiber (25) is disposed.
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    优先权:
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    FR1558913A|FR3041425B1|2015-09-22|2015-09-22|MEASUREMENT SYSTEM AND TEMPERATURE AND / OR DEFORMATION SENSOR THROUGH BRILLOUIN RETROREFLEXION ANALYSIS|FR1558913A| FR3041425B1|2015-09-22|2015-09-22|MEASUREMENT SYSTEM AND TEMPERATURE AND / OR DEFORMATION SENSOR THROUGH BRILLOUIN RETROREFLEXION ANALYSIS|
    CA2999827A| CA2999827A1|2015-09-22|2016-09-21|Measurement system and temperature and/or shape change sensor using brillouin back-reflection analysis|
    US15/762,355| US10697807B2|2015-09-22|2016-09-21|Measurement system and temperature and/or shape change sensor using brillouin scattering analysis|
    PCT/FR2016/052393| WO2017051119A1|2015-09-22|2016-09-21|Measurement system and temperature and/or shape change sensor using brillouin back-reflection analysis|
    EP16785199.7A| EP3353502B1|2015-09-22|2016-09-21|Measurement system and temperature and/or shape change sensor using brillouin back-reflection analysis|
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