• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    An ultrashort laser pulse time duration or time profile system comprising a single-shot optical autocorrelator comprising a wavefront division optical component (10, 11), a nonlinear optical crystal (20) disposed such that a first divided wavefront and a second divided wavefront are superimposed in the nonlinear optical crystal (20), an optical system (22) forming an image of the nonlinear optical crystal on a detection system (30), a filtering device (21, 23) arranged between the nonlinear optical crystal (20) and the detection system (30) and configured to detect, on the one hand, an interferometric autocorrelation trace one-order one-shot at the double optical frequency (2ω) and, secondly, at least one other one-way interferometric type one-way autocorrelation trace at the fundamental optical frequency (ω) or intensimetric type of order two to the double optical frequency (2ω).
    公开号:FR3040828A1
    申请号:FR1558223
    申请日:2015-09-04
    公开日:2017-03-10
    发明作者:Antoine Dubrouil
    申请人:Centre National de la Recherche Scientifique CNRS；Universite de Bordeaux；
    IPC主号:
    专利说明:

    Technical field to which the invention relates
    The present invention generally relates to the field of ultrashort laser pulse measurement systems and methods, in particular, for time measurement, for measuring the pulse spectrum or for the complete reconstruction of the time profile in intensity and in phase. .
    In the present document, an ultrashort laser pulse is understood to mean a pulse having a duration of the order of one picosecond to the femtosecond. These ultrashort laser pulses generally extend over a wide spectral band, from a few nanometers for picosecond pulses to a few tens or even hundreds of nanometers for femtosecond pulses. The spectral band may be in the range of ultraviolet, visible and / or infrared. The invention more particularly relates to a system and a method for measuring the duration or the time profile of an ultrashort laser pulse and possibly the spectrum and / or the ultrashort laser pulse phase.
    Technological background
    Different technologies and different light pulse measurement systems are already known. These systems fall into two main categories: autocorrelators and phase measurement systems.
    Autocorrelators measure the duration of the pulses by making an assumption about the shape of their temporal profile. There are multicouple autocorrelators and one-shot autocorrelators. We are particularly interested in single-shot autocorrelators.
    An intensity one-shot one-shot optical autocorrelator generally has a beam splitter to form two replicas of the source pulse beam at a fundamental frequency (co), a second order nonlinear optical crystal in which the two replicas are intersect and a detector measuring the intensity profile of the second harmonic beam (2co) as a function of the delay between the two replicas. Such an intensimetric optical autocorrelator measures the envelope of the second order signal. Combined with a detection system having an interferometric resolution, a second order interferometric one-shot optical autocorrelator is obtained.
    Diels et al. (Control and measurement of amplitude of ultrashort draws shapes -in amplitude and phase with femtosecond accuracy Appl Optics, Vol 24, No. 9, pp. 1270-1282, 1985) have disclosed a method of calculating the temporal shape and the pulse phase from a pulse spectrum recording, a measurement of the intensity autocorrelation function and a measurement of the interferometric autocorrelation function. F. Salin et al. (One-shot interferometric self-correlation of femtosecond pulses, Phys., Rev. Appl., 22, pp. 1613-1618, 1987) have proposed a single-shot interferometric autocorrelator comprising a non-linear frequency-doubling crystal in which two synchronous beams intersect at an angle of low incidence, a UV filter for filtering the frequency doubled beams and a multi-channel detector. The KDP crystal forms three frequency doubled beams which recombine coherently on the detector to form interference fringes whose contrast is modulated. The analysis of these interference fringes makes it possible to extract the duration of a single-shot pulse.
    Different phase measurement systems (Spider, 2DSI, FROG, SRSI ...) allow to reconstruct the temporal profile in intensity and in phase of the pulses and provide a complete temporal characterization. However, phase measurement systems are more complex and more difficult to use than autocorrelators. The FROG type devices use a spectrometer to spectrally resolve the autocorrelation trace and thus produce a spectrogram that groups the spectral information for each delay between the two replicates of a pulse. The analysis of the spectrogram by an iterative algorithm then makes it possible to extract the temporal profile in intensity and the phase of the pulses. In the case of a frog device, it is the angular phase agreement in a thick non-linear crystal that produces the spectrogram. In the case of Spider and SRSI devices, spectral interferences are measured between two replicas of the impulse having undergone different interactions. An analysis by Fourier transform then makes it possible to extract the phase of the pulse and thus to reconstruct the temporal profile in intensity thanks to the preliminary or simultaneous measurement of the spectrum. Interference is acquired in 2D in the case of 2DSI.
    In general, laser pulse measurement systems require precise alignment and specific expertise to produce reliable results. In particular, phase measurement requires very precise adjustments. The autocorrelators provide a measure of the duration of the laser pulses by making an assumption on the temporal profile of these laser pulses. Nevertheless, the use of an autocorrelator is relatively less complex than that of a phase measurement system. Autocorrelators are therefore extremely useful for optimizing pulse duration in real time or for checking the stability over time of a laser's performance. These two techniques are complementary and an ultrashort laser user must generally acquire two devices: an autocorrelator and a phase measurement system. Nevertheless, whatever the device, it requires specific expertise to use it and a precise adjustment phase is necessary. This adjustment phase can be very time consuming. In addition, the quality and accuracy of the measurements depend on this adjustment phase. Also, this development phase prohibits the use of these devices under vacuum while a need to perform these vacuum measurements exists for certain applications.
    Object of the invention
    In order to overcome the aforementioned drawbacks of the state of the art, the present invention proposes a system for measuring the duration or time profile of ultrashort laser pulse.
    More particularly, according to the invention there is provided a system for measuring the duration or the time profile of an ultrashort laser pulse comprising a single-shot optical autocorrelator comprising a wavefront division optical component arranged to receive a collimated wavefront of fundamental optical frequency (co) from an ultrashort laser pulse source and for spatially dividing the collimated wavefront of an ultrashort light pulse into a first divided wavefront propagating in a first direction and a second direction divided wavefront propagating in a second direction forming a non-zero angle with the first direction, a nonlinear optical crystal, preferably a second harmonic generator, disposed at a determined distance from the optical component having a wavefront division of so that the first divided wavefront and the second divided wavefront are superimposed in the nonlinear optical crystal, an optical system forming an image of the nonlinear optical crystal on a spatially resolved detection system in at least one direction, a filtering device arranged between the nonlinear optical crystal and the detection system, the filtering device and the detection system being configured to detect, on the one hand, a second-order one-shot interferometric autocorrelation trace at the dual optical frequency (2co) and, on the other hand, at least one other trace of interferometric one-to-one autocorrelation at the fundamental optical frequency (ω) or the second order intensimetric type at the dual optical frequency (2ω), and a signal processing system configured to analyze, on the one hand, , the one-shot interferometric autocorrelation trace of order two at the double optical frequency (2ω), and, on the other hand, the other trace of autocorrelation one-shot, and to deduce a measurement of time or time profile ultrashort laser pulse. Other non-limiting and advantageous features of the ultrahigh-resolution laser pulse duration and time profile measuring system according to the invention, taken individually or in any technically possible combination, are the following: wavefront comprises a Fresnel bi-prism or a Fresnel bi-mirror having a fixed or symmetrically adjustable apex angle; the Fresnel bi-prism or the Fresnel bi-mirror has an adjustable angle as a function of the duration of the ultrashort laser pulse to be measured; the distance D between the wavefront division optical component and the crystal; nonlinear optical is between: 0.1 * delta and 0.5 * delta where delta is equal to
    , and where Φ is the input diameter of the device adapted to receive a beam of diameter greater than or equal to 3 mm, and at the angle between the two beams (a is equal to (180 - A) (n-1) in degree where A is the apex of the biprism and n the refractive index of the material of the prism), so that the effect of the diffraction is negligible compared to the signal which one wants to measure; the system may comprise a plurality of Fresnel bi-prisms each having a determined vertex angle and further comprising a switching system adapted to select a Fresnel bi-prism from among the plurality of Fresnel bi-prisms and to arrange the bi-prism selected at a distance D from the nonlinear optical crystal as defined above; the nonlinear optical crystal has a thickness of between 5 μm, for a femtosecond pulse and a few millimeters for a picosecond pulse, and preferably between 5 microns and 50 microns, and a phase tuning adapted to allow doubling of optical frequency by function of the spectral width of the pulse; the second harmonic generating nonlinear optical crystal has an input spectral band for frequency doubling which extends from 400 nm to 2.5 microns, for example for a BBF ultrafine crystal, or 2.5 at 12 microns for an AgGaSe2 crystal, the detector comprises a photodiode array, a CCD array, a CMOS array, or a CCD or CMOS camera having one or two dimensional micrometric spatial resolution; the filtering device comprises a switchable spatial filter in opening between a first and a second opening, the first opening being configured to pass to the detection system on the one hand the propagation direction of the bisector of the first and second second directions and on the other hand the first direction and / or the second direction, so as to form the second order one-shot interferometric autocorrelation trace, and respectively the second opening being configured to pass selectively to the detection system. propagation axis along the bisector of the first and second directions while blocking the first and second directions to form the second one-second intensity type one-shot autocorrelation trace; the filtering device comprises a spectral filter configured to selectively filter the dual optical frequency and to block the fundamental optical frequency; the spectral filter comprises a colored glass filter or a dichroic mirror, a multilayer filter or is produced by spatial separation of the beams; the detection system comprises a camera comprising a first and a second spatially resolved detection zone and the filtering device comprises a spectral filter having a first and a second spectral filtering zone, the first spectral filtering zone being configured to pass selectively the dual optical frequency to the first detection area while blocking the fundamental optical frequency, and the second spectral filtering area being configured to selectively pass the fundamental optical frequency to the second detection area while blocking the dual optical frequency; the detection system comprises a camera comprising first and second spatially resolved detection regions and wherein the filtering device comprises a spatial filter having at least a first spatial filtering zone and a second spatial filtering zone, the first spatial filter being configured to pass, on the one hand, the direction of propagation of the bisector of the first and second directions and, on the other hand, the first and / or second direction, to the first region of detection, so as to form the second order one-shot interferometric autocorrelation trace, and respectively the second spatial filtering area being configured to selectively pass the propagation direction along the bisector of the first and second directions while blocking the first and second directions to the second detection region, to form the other trace of one-shot autocorrelation of intensimetric type of order two;
    In a particular embodiment, the system further comprises a spectrometer configured to record a spectrum of the light pulse, and wherein the signal processing system is configured to derive a measurement of the phase of the light pulse.
    In another particular embodiment, the detection system comprises an imaging spectrometer having an entrance slot, a spectrally dispersive optical system and a spatially resolved detector in two directions, the filtering device (21, 23, 24) and the imaging spectrometer being configured to detect, on the one hand, a spectrally resolved, one-shot, one-shot intensimetric autocorrelation trace and, on the other hand, a spectrally resolved one-shot interferometric autocorrelation trace; the spectrally dispersive optical system comprises a diffraction grating in transmission or in reflection; the optical system forming the image of the nonlinear optical crystal on the input slit of the imaging spectrometer comprises an achromatic optical system comprising a first spherical mirror illuminated at an angle of incidence of less than 4 ° degrees, and a second miioir configured to separate a reflected optical beam from an incident optical beam on the first spherical mirror; the imaging spectrometer comprises another achromatic optical system with mirrors configured to form an image of the entrance slit on the detector, the other achromatic optical mirror system comprising a spherical mirror illuminated at an incidence angle of less than 3 ° degrees, and another mirror configured to separate a reflected optical beam from an incident optical beam on said spherical mirror; the system further comprises an optical alignment diaphragm adjacent to the wavefront division optical component, the alignment diaphragm being positioned vertically to the first foot of the device thus forming a pivot point for the alignment of the device on the optical axis.
    Detailed description of an example of realization
    The following description with reference to the accompanying drawings, given as non-limiting examples, will make it clear what the invention consists of and how it can be achieved.
    In the accompanying drawings: FIG. 1 schematically represents a system for measuring the duration of a laser pulse based on an intensimetric or interferometric autocorrelator according to a first embodiment of the invention; FIG. 2 diagrammatically represents a variant of the first embodiment of the invention; FIG. 3 diagrammatically represents a system for measuring the duration and phase of a laser pulse based on an autocorrelator combined with an imaging spectrometer according to a second embodiment of the invention; - Figure 4 schematically shows a first variant of the second embodiment of the invention; - Figure 5 schematically shows a second variant of the second embodiment of the invention; FIG. 6 schematically represents a particular embodiment of a spectral and spatial filtering device; FIG. 7 schematically represents a variant of a spectral filtering device; FIG. 8 schematically represents a particular embodiment comprising a spectrometer combined with a one-shot optical autocorrelator with another variant of spectral and spatial filtering device.
    Device
    FIG. 1 shows a system for measuring the duration or the temporal profile of a laser pulse, based on an intensimetric or interferometric autocorrelator. This system comprises a first iris 2, a Fresnel bi-prism 10, a non-linear second harmonic generating optical crystal 21, a spectral filter 21, a lens 22, a second selection iris 23, a detector 30 and a connector 40 connected to a signal processing system. Advantageously, the components of the system of FIG. 1 are mounted in a line in a housing, which allows an easy alignment of the system on the longitudinal optical axis 60 of the beam of the ultrashort light pulse source.
    An ultrashort laser pulse forming a collimated incident beam is considered. The ultrashort laser pulse has a wavefront 1. The ultrashort laser pulse has a spectrum that is extended (non-monochromatic) and comprises in particular a fundamental optical frequency co. Generally, the spectrum of the ultrashort laser pulse is defined by a central frequency and a bandwidth, of variable width as a function of the duration picosecond femtosecond of the pulse.
    The first iris 2 defines a first alignment mark of the optical axis for centering the incident beam on the Fresnel bi-prism 10 and limits the spatial extent of the beam. Fresnel bi-prism is a one-piece optical component conventionally used in wavefront division interferometers.
    Particularly advantageously, the system comprises a first height-adjustable foot disposed in the plane of the first iris 2 and a second height-adjustable foot disposed in a plane in the vicinity of the plane of the detector 30. The biprism 10 is placed as close to the first iris 2. Thus the centering of the incident beam on the first iris ensures the centering on the biprism. The first foot is a pivot point at the first iris 2, which forms an alignment mark. Thus it is possible to align the second iris 23 with respect to the light beam, without affecting the alignment with respect to the first iris 2. The system of Figure 1 is thus precisely, easily and quickly aligned.
    Advantageously, the incident beam has an intensity distribution having an axial symmetry with respect to the optical axis 60 of propagation of the beam. The bi-prism 10 is arranged so that the base of the bi-prism receives the incident beam. The edge between the two prisms is arranged transversely to the optical axis of propagation of the incident beam. Thus, each prism forming the bi-prism 10 receives one half of the incident beam or one half of the light pulse 1. The bi-prism 10 makes it possible to divide the wavefront 1 of the incident beam into two divided wavefronts spatially, each divided wavefront being deflected symmetrically with respect to the edge of the bi-prism. Thus, at the output of the bi-prism, a first divided front propagates in a first inclined direction of a deflection angle with respect to the optical axis of the incident beam and a second divided beam propagates in a second inclined direction of a deflection angle symmetrical with respect to the optical axis of the incident beam. In other words, the first direction and the second direction are inclined symmetrically with respect to the longitudinal optical axis 60. The deflection angles conventionally depend on the angles and the refractive index of the bi-prism 10. The first divided beam and the second split beam intersect in an overlap area where interference is formed and particularly in the frequency doubling crystal 20. The split beams are also called the replicas of the incident beam.
    An advantage associated with the use of a Fresnel bi-prism having a small angle, for example of the order of 2.5 degrees (corresponding to an apex angle of 175 degrees), is to increase the interference of the interferometric beam. of autocorrelation, which allows, as detailed below, to spatially solve this interfrange on the image detector 30.
    The bi-prism 10 is specially designed to limit the effects of beam diffraction on the median edge of the bi-prism. The bi-prism is generally symmetrical with respect to the median ridge. The smallest angle of the bi-prism is preferably greater than 1 degree. For example, the bi-prism is in BK7, fused silica, calcium fluoride or any other transparent material at the wavelength of interest. Preferably, the optical quality of the stop of the bi-prism is controlled so as to limit the diffraction.
    A second harmonic generating non-linear optical crystal is disposed at a predetermined distance from the bi-prism transverse to the optical axis of propagation of the incident beam so that the interferences occur within the non-optical crystal. linear 20. A very thin nonlinear optical crystal 20 having a thickness determined as a function of the duration of the pulse, for example between 5 microns and 500 microns for an ultrashort pulse, and between 500 microns and a few millimeters is selected. for a pulse of duration between 500 fs and 10 ps. In one example the nonlinear optical crystal 20 has a thickness of 10 microns. The material of the nonlinear optical crystal 20 is chosen, according to the wavelength of interest, from known materials such as BBO, KDP, KTP, LILO3, BiBO, LBO, AgGaS2, AgGaSe2, ZnGeP2, GaSe, AgGaGeS4 or KTA. The thin non-linear optical crystal is preferably fixed, for example by optical bonding, to a substrate, for example silica glass.
    The nonlinear optical crystal 20 is configured to allow frequency doubling of the fundamental beam. The small thickness of the nonlinear optical crystal 20 makes it possible to perform an optical frequency doubling over a very broad spectral band corresponding to ultrashort light pulses that can reach sub-femtosecond durations. By way of example, a BBO thin non-linear optical crystal makes it possible to double in frequency an incident beam having a fundamental frequency ω in a very wide spectral band, extending from 400 nm to 2500 nm. Other crystals may be used for other spectral ranges.
    Another technical effect of this small thickness is to limit the efficiency of frequency doubling, contrary to what is generally sought in autocorrelators of the prior art, where it is generally sought to maximize the efficiency of frequency doubling.
    One advantage of the small thickness of the nonlinear optical crystal 20 is to increase the threshold of the damage likely to be induced by a high power pulse, compared with a thicker nonlinear optical crystal. In the thin non-linear optical crystal 20 is thus compatible with pulses having a power extending over a range of a few milliwatts to 1 or a few Watts. This technical characteristic makes it possible to use the autocorrelator with a direct beam (without prior attenuation of the glassy reflection type or beam sampler) in most cases.
    The interference zone is very wide. On the other hand, the distance where biprism is placed is much more restricted.
    More precisely, the distance between the nonlinear optical crystal 20 and the bi-prism is determined as a function of the deflection angle of the bi-prism according to a conventional geometric calculation formula.
    This distance is between 0.1 * delta and 0.5 * delta, where delta is equal to 0 / (2xtan (oÆ)), and 0 represents the input diameter of the device, where a is the angle between the first and the second direction divided beams, a is equal to (180 -A) (n-1) in degrees, where A represents the apex angle or apex of the biprism and n is the refractive index of the prism material, in general n ~ 1.5 . Alternatively, the distance between the nonlinear optical crystal 20 and the bi-prism can be determined experimentally. The diameter 0 is selected as a function of the angle of the bi-prism: 0 is greater than 2 mm for a biprism having a large angle, of the order of 150 degrees of apex and Φ is greater than 4-5 mm for a biprism with a weak angle, of the order of 175 degrees of apex.
    At the output of the non-linear optical crystal 20, a trace of autocorrelation of the frequency-doubled incident light pulse, also called a second-order autocorrelation trace having an optical frequency 2co, is obtained. The interferometric autocorrelation trace of second order propagates on the bisector of the first direction and the second direction of the divided beams.
    A spectral filter 21 is disposed between the nonlinear optical crystal 20 and the camera 30. This spectral filter 21 makes it possible to filter the two replicas of the fundamental beam and to receive only the beams doubled on the detector.
    An optical system, for example a lens 22, forms the image of the non-linear optical crystal 20 on a spatially resolved image detector 30. The focal optical system f is preferably in optical conjugation 2f-2f with a magnification of 1 for reasons of compactness, however other magnifications greater than 1 may be used to improve the resolution. If one wishes a very high magnification, it generally becomes necessary to fold the beam at least once to make the system more compact.
    A second iris 23 makes it possible to spatially filter the autocorrelation trace propagating along the axis of propagation of the incident light pulse. Preferably, the second iris 23 is placed in the vicinity of the focus of the lens 22. In a first configuration, the second iris 23 is open, so as to pass, on the one hand, the autocorrelation beam propagating according to the bisector of the first and second direction, and, secondly, at least one of the deflected beams propagating along the first and / or second direction, these deviated beams may be at the optical frequency ω and 2co. In a second configuration, the second iris 23 is partially closed so as to block the beams deviated by the bi-prism propagating along the first and second directions, while allowing the autocorrelation beam propagating along the bisector of the first and the second.
    When the iris 23 passes only the central beam corresponding to the autocorrelation trace, an intensimetric autocorrelation trace is detected. Thus, the image detector receives only the second order autocorrelation trace propagating along the longitudinal optical axis 60. In this case, a second order intensity intensim autocorrelation trace is obtained.
    In the case where the second iris 23 passes through the central beam and at least one of the two lateral beams (which consist of frequencies ω and 2c0 or only 2c0 if the fundamental frequency ω is filtered), an interferometric autocorrelation trace is obtained. . Using only two beams makes it less sensitive to alignment.
    By simply modifying the opening of the iris 23, a one-shot autocorrelation trace measurement in interferometric mode and a single-shot autocorrelation trace measurement in intensimetric mode are thus sequentially performed.
    In interferometric mode, the interfringe dimension on the detector 30 depends on the angle between the beams and the wavelength and magnification. The image detector 30 is spatially resolved along at least one direction transverse to the interferometric image. The optical combination of the optical system 22 and the image detector 30 is configured to provide a spatial resolution adapted to resolve at least one interfringe of the image of the interferometric autocorrelation beam on the image detector 30. For a magnification of 1, an angle between the beams of 2.5 degrees and a wavelength of 400 nm, the interfringe is about 15 microns, or about 3 pixels for a camera having a pixel size of 5 microns. The image detector 30 has a sensitivity over a wide spectral band.
    In an exemplary embodiment, the image detector 30 is a spatially resolved camera in two directions (X, Y) transverse to the longitudinal optical axis 60. The camera is oriented so that the direction X is parallel to the Fresnel bi-prism 10 edge and the Y direction perpendicular to the Fresnel bi-prism 10 edge.
    The detector 30 thus provides a spatially resolved measurement along the X axis representative of the second-order autocorrelation interferometric trace or the first-order or second-order interferometric autocorrelation trace according to the spatial filtering and / or spectral applied.
    Figure 2 illustrates a variant of the first embodiment of the invention. The same elements are indicated in FIG. 2 by the same reference signs as in FIG. 1. In this variant, the Fresnel bi-prism 10 of FIG. 1 is replaced by a Fresnel bi-mirror 11. The ridge the Fresnel bi-mirror 11 is disposed transversely to the longitudinal optical axis 60 of the incident laser beam. The Fresnel bi-mirror 11 thus deviates the longitudinal optical axis. Similarly to the Fresnel bi-prism 10, the Fresnel bi-mirror 11 divides the wavefront of the incident beam into two spatially divided wave fronts, each divided wavefront being deflected symmetrically with respect to the Fresnel bi-mirror edge 11.
    The other elements are configured to operate identically to the same elements described above in connection with Figure 1. The advantage of the Fresnel bi-mirror 11 is to be non-dispersive and achromatic. The use of the Fresnel bi-mirror 11 is particularly advantageous in the case of an ultrashort laser pulse 1 with a duration of less than about 30 fs. Preferably, the angle of the Fresnel bi-mirror 11 is arranged symmetrically with respect to the longitudinal axis of propagation of the incident pulse.
    In one embodiment, the Fresnel bi-mirror is in one piece and the angle of the Fresnel bi-mirror 11 is fixed by construction. The Fresnel bi-mirror 11 has an angle of preferably between 0.5 and 10 degrees. For example, the Fresnel bi-mirror 11 may consist of two flat mirrors glued along an edge and forming an angle between the two mirrors. According to an alternative, the angle of the Fresnel bi-mirror 11 is adjustable, preferably symmetrically, which makes it possible to adjust the resolution of the measurement system as a function of the duration of the pulse to be measured. Advantageously in this case, an opto-mechanical system is configured to produce a symmetrical rotation of the two half-mirrors around the axis of the bi-mirror. In the case where the angle of the Fresnel bi-mirror 11 is adjustable, an automated calibration procedure makes it possible to adjust the output results as a function of this angle.
    A measuring system, as illustrated in FIGS. 1 and 2, based on a bi-prism or on a Fresnel bi-mirror, is easily integrable under vacuum, which is a certain advantage for ultrashort pulses (<15 fs) whose dispersion in the air is sufficient to degrade the temporal properties of the pulse.
    FIG. 3 diagrammatically represents a system for measuring the duration and the phase of a laser pulse based on a one-shot autocorrelator combined with an imaging spectrometer according to a second embodiment of the invention.
    This system comprises a first iris 2, a second iris 3, a Fresnel bi-mirror 11 and a nonlinear optical crystal 20. The operation of this system is similar to that in connection with FIG. 2 up to the non-linear optical crystal. 20. The image detector 30 of FIG. 2 is here replaced by an imaging mini-spectrometer (MSI). More precisely, the system of FIG. 3 comprises a mirror 25, a lens 26, a selection diaphragm 23. The imaging spectrometer 50 comprises an input slot 51, a lens 52, a diffraction grating 53 in transmission, another lens 54, an image detector 35 and a connector 45 connected to a signal processing computer.
    For example, lenses 52, 54 with a diameter of 12 mm and a focal length of 20-50 mm which are not very chromatic or achromatic are used. The lens material 52, 54 is, for example, calcium fluoride or magnesium fluoride or barium fluoride whose refractive index varies slowly as a function of the wavelength. Advantageously, the image detector 35 consists of a camera. By way of example, a CCD camera having 1.5 Mpixels, operating at a frequency of 10-to several hundred images / second, is used. The camera is adapted according to the spectral range of the pulse to be measured. The camera can be a UV, visible and / or infrared camera.
    The mirror 25 serves to fold the optical path and to reduce the size of the system. The lens 26 forms the image of the non-linear optical crystal 20 on the input slot 51 of the imaging spectrometer 50. The input slot 51 is preferably rectangular in shape. The length of the input slot 51 is arranged perpendicular to the image of the autocorrelation trace on this slot and therefore perpendicular to the edge of the bi-mirror. For example, the slot has a width of 10 to 50 microns. Thus, the input slot spatially selects an area of the second order autocorrelation trace. The slot 51 is located at the focus of the lens 52 which thus forms a collimated beam directed towards the diffraction grating 53. Diffraction 53 spectrally disperses the autocorrelation trace on the spatially resolved image detector 35 in two dimensions. The second lens 54 forms the image of the slit 51 on the detector 35. The imaging mini-spectrometer 50 forms the image of the spectrally dispersed input slit. A FROG (frequency-resolved optical gating) type trace is thus obtained which represents a spectrogram having a spectral dimension and a temporal dimension.
    When the iris 23 passes only the central beam corresponding to the autocorrelation trace, an intensity-corrected second order intensimetric autocorrelation trace or intensimetric FROG trace of 2 is detected on the image detector 35.
    In the case where the diaphragm 23 passes through the central beam and at least one of the two lateral beams, a spectrally resolved interferometric autocorrelation trace or an interferometric FROG trace 2 is obtained.
    By simply modifying the opening of the iris 23, a one-shot autocorrelation trace measurement in a spectrally resolved interferometric mode and a one-shot autocorrelation trace measurement in a spectrally resolved intensimetric mode are sequentially performed.
    An application of this measurement system is the measurement of the duration and phase of a pulse.
    The signal processing system makes it possible to determine the spectral, temporal and phase profile of the ultrashort pulse 1 via an iterative algorithm of the PCGPA type (Principal Component Generalized Projections Algorithm, D. Kane, in IEEE J. Quant. , p.421 (1999)) or via another method of calculating the phase from the interferometric frog trace (G. Stibenz and G. Steinmeyer, "Interferometric frequency-resolved optical gating", Opt.Express 13 (7) , 2617 (2005)).
    The same elements are represented in FIGS. 3, 4 and 5 by the same reference signs.
    Figure 4 schematically shows a first variant of the second embodiment of the invention. In this variant, the lens 26 has been replaced by a mirror optical system 27, 28 which forms an image of the nonlinear optical crystal 20 on the input slot 51 of the imaging spectrometer 50. The diffraction grating 56 is here a network in transmission. Another lens 57 forms the image of the trace FROG on the detector 35. Moreover, in this imaging spectrometer 50, the lens 52 has been replaced by a spherical mirror 55, the entrance slit being placed at the focus of this mirror spherical 55. The optical system constituted by the spherical mirror 27 and the extraction mirror 28 (pick-off mirror) makes it possible to direct the beam under an incidence close to zero degrees on the spherical mirror (s) And thus greatly reduce geometric optical aberrations, such as astigmatism. FIG. 4 thus represents a system for measuring the phase and the duration of a pulse comprising a single-shot interferometric autocorrelator combined with an imaging spectrometer, this measuring system being corrected from geometrical and essentially achromatic optical aberrations to the diffraction grating 56.
    Figure 5 shows schematically a second variant of the second embodiment of the invention. In this variant, the spherical mirror 55 of FIG. 3 has been replaced by a mirror system 58, 59. The mirror 58 is a focusing mirror. The mirror 59 is a pick-off mirror which makes it possible to direct the beam at a low incidence in order to limit the geometrical optical aberrations. The system of Figure 5 has the advantage of being both achromatic and compact thanks to the use of extraction mirrors (or pick-off mirror) 27, 59. This configuration makes the system particularly compact.
    FIG. 6 schematically represents a particular embodiment of the invention based on an interferometric and intensimetric autocorrelator simultaneously measuring the first order and the second order. The system of FIG. 6 comprises a first iris 2, a Fresnel bi-prism 10, a nonlinear optical crystal 20, a lens 22, a spatial filter 24, a spectral filter 21 and a spatially resolved image detector 30 following two directions, of the CCD camera type, for example, having an interferometric resolution. The lens 22 forms the image of the three beams propagating respectively in the first direction, the second direction and following the bisector of the first and the second direction. A spatial filter 24 is disposed in the vicinity of the plane of focus of the lens 22. This spatial filter comprises a first zone 241 open and a second zone 242 having two shutters 243, 244. The first zone and the second zone are arranged so as to to be simultaneously on the optical path of the three beams.
    An exemplary configuration is illustrated in the insert 31 which represents a view in the plane of the filter 24. In this example, the first zone 241 is arranged so as to allow the three half-beams 310, 311, 312 to pass in the direction of a first detection region of the detector 30 and the second zone 242 is arranged to pass only the central half-beam 310 the shutters 243 and 244 blocking the side half-beams 311, 312 towards a first region of Detecting the detector 30. Thus, the combination of the first zone 241 of the spatial filter 24 and the first region of the detector makes it possible to detect a trace of interferometric autocorrelation with three beams. More particularly, in this embodiment, the spectral filter 21 is disposed in front of the detector 30. Advantageously, the spectral filter 21 comprises two spectral filtering zones 211, 212. A first zone 211 filters the signal at the fundamental frequency (ω) and a second zone 212 filters the signal at the double frequency (2ω). Preferably, the zone 211 comprises a neutral optical density (OD of 3 to 6) to compensate for the difference in intensity between the beam at the double frequency and the beam at the fundamental frequency. Advantageously, the first spectral filtering area 211 corresponds to 25% of the surface of the spectral filter 21 and the second spectral filtering area 212 corresponds to 75% of the surface of the spectral filter 21.
    Preferably, the first zone 211 and a portion of the second zone 212 are arranged between the spatial filter 24 and the first region of the detector, so as to allow spatially separating on the detector, on the one hand, an interferometric autocorrelation trace. of order one in a first detector detection zone, and secondly, a second order interferometric autocorrelation trace in a second detection zone of the detector. The other part of the second zone 212 of the double frequency spectral filter is arranged between the spatial filter 24 and the second region of the detector, so as to form a second order intensimetric autocorrelation trace in the second region of the detector. . In total, in this first example, the combination of the spatial filter 24, the bi-zone spectral filter 21 and the image detector 30 makes it possible to simultaneously measure the single-order intensimetric autocorrelation trace (SI) in one-shot mode. the interferometric autocorrelation trace with three second-order beams (Sinterf (2u)) and the interferometric autocorrelation trace with three first-order beams (Sinterf (w)).
    A processing of these intensity and interferometric autocorrelation measurements of order one and order two makes it possible to extract a measurement of the duration and the phase of the pulse 1.
    Figure 7 schematically shows another particular embodiment of the invention based on an interferometric autocorrelator. The same reference signs designate the same elements as in FIG. 6. Unlike the system represented in FIG. 6, the system of FIG. 7 does not comprise a spatial filter but only a two-zone spectral filter 21. The filter 21 includes a first spectral filtering area 211 filtering the signal at the fundamental frequency (ω) and a second spectral filtering area 212 filtering the signal at the double frequency (2ω). By way of example, the first spectral filtering area 211 corresponds to 50% of the area of the spectral filter 21 and the second spectral filtering area 212 corresponds to 50% of the area of the spectral filter 21.
    In this variant, the interferometric autocorrelation trace with two first-order beams (SinterfM) (because the central beam is only at the double frequency) and the interferometric autocorrelation trace with three beams are measured simultaneously. order two (Sinterf (2u)) on one and the same sensor resolved spatially in 2 dimensions. A processing of these two first order and second order interferometric autocorrelation measurements makes it possible to extract a measurement of the duration and the phase of the wavefront 1 of the laser pulse in a single shot.
    The signal processing system calculates the spectrum of the ultrashort pulse 1, by applying a Fourier transform operation to the measurement of the first order autocorrelation trace.
    A computer connected to the camera 30 processes the various interferometric and / or intensimetric autocorrelation measurements of order one and order two. The input data are the spectrum (or the first-order autocorrelation trace), and the second-order interferometric autocorrelation trace (Figure 7) on the one hand, or the intensimetric autocorrelation trace of order 2, the spectrum (or the first-order autocorrelation trace), and the second-order interferometric autocorrelation trace (FIG. 6) on the other hand. The output of the processing software includes the display of these inputs and the calculation of the spectral phase and the temporal profile in intensity and in phase.
    In another embodiment, the pulse spectrum may be imported as recorded data from a separate spectrometer device to allow reconstruction of the time profile.
    Alternatively, as illustrated in FIG. 8, a mini spectrometer can be integrated into the measurement system in order to collect the spectrum in real time. The mini spectrometer is integrated in the device after the biprism to collect the spectrum of the ultrashort pulse by diffusion on the optical components or by means of a picking fiber 71 positioned to intercept a portion of the beam that does not intervene thereafter in autocorrelation.
    According to another alternative, the first order autocorrelation trace is used to calculate the fundamental spectrum by Fourier transform. In this latter embodiment, a spectral filter with two spectral zones 21 and 21a is used to filter the fundamental on a part of the detector and the beam doubled on another part of the detector (see Figures 6-7).
    The measurement system takes advantage of the spatial resolution of the image sensor to simultaneously measure, for example, first and second order autocorrelation signals. Therefore, the spectrum and Interferometric autocorrelation can be extracted from the same image acquired from an ultra-short laser pulse. Thus, the single-shot measurement device makes it possible to reconstruct the temporal profile of an ultrashort laser pulse.
    The manufacture and use of this time and phase measurement system is relatively simple compared to prior art systems which are generally complex and difficult to use.
    The system is easily configurable to provide either the duration and phase measurement or a duration measurement only.
    In another exemplary embodiment, the image detector 30 is, for example, a photodiode array resolved spatially in a direction X transverse to the longitudinal optical axis 60. The photodiode array is oriented in such a way that extends in a direction transverse to the edge of the Fresnel biprism 10. In this embodiment, since the detector is not resolved spatially in the direction parallel to the edge of the Fresnel bi-prism 10, it is impossible to measure simultaneously on the image detector an order of autocorrelation of order 1 and order 2.
    The initial calibration of the image detector depends essentially on the magnification of the lens, the resolution of the detector and the angle between the two beams determined by the angle of the bi-prism. The measuring system therefore does not require calibration by the user, the setting made at the factory being valid for the entire lifetime of the device. The interferometer interferometer beam of order 2 autocorrelation corresponds to a wavelength at the optical frequency 2co is 2 fs at 400 nm. Another advantage of the simplicity of the system is that it does not require any adjustment, which makes it possible to have reproducible measurements regardless of the user. In addition, this measurement system is compact and easy to use. The implementation of this measurement system on a laser line can be carried out in a few minutes, while the alignment of a conventional autocorrelator or a phase measuring device can take several hours or more.
    The compactness of the time and phase measurement system makes it easy to integrate into a laser for OEM applications.
    FIG. 8 represents a measurement system according to another embodiment comprising a second order autocorrelator combined with a spectrometer. The same reference signs designate the same elements as in FIG. 6 or 7. In this embodiment, a spectrometer 70 is used, for example, coupled via an optical fiber 71 to record the intensity Ι (λ) of the pulse 1 depending on the wavelength, in other words the spectrum of the light pulse 1.
    A spectral filter 21 is disposed between the nonlinear optical crystal 20 and the focusing lens 22. The spectral filter 21 passes only the signals at the double optical frequency (2ω). Optionally, a spatial filter 29 may be disposed in the focal plane of the lens 22. This spatial filter 29 makes it possible in particular to eliminate the parasitic diffraction on the edge of the bi-prism.
    A first example of configuration of the spatial filter 24, illustrated in the insert 31, is similar to the embodiment described with reference to FIG. 6. In total, in this first example of FIG. 8, the combination of the spectral filter 21, Spatial filter 24 and image detector 30 make it possible to measure simultaneously and in a single shot: a second order intensimetric autocorrelation trace and an interferometric autocorrelation trace with three second order beams.
    A second example of configuration is illustrated in the insert 32 which represents a view in the plane of the filter 24. In this second example, the first zone 241 is arranged so as to let two half-beams 310, 311 in the direction of a first detection region of the shutter detector 244 blocking the half-beam 312. Thus, the combination of the first zone 241 of the spatial filter 24 and the first region of the detector makes it possible to detect an interferometric autocorrelation trace at two beams. As in the first example, the second zone 242 is arranged to pass only the central half-beam 310 in the direction of a first detection region of the detector 30, the shutters 243 and 244 blocking the lateral half-beams 311, 312 In total, in this second example, the combination of the spectral filter 21, the spatial filter 24 and the image detector 30 makes it possible to measure simultaneously and in one-shot mode: the intensimetric autocorrelation trace of second order (SI), the interferometric autocorrelation trace with two second order beams (Sinterf (2oo)).
    A computer collects and performs the processing of the measured spectrum (Ι (λ)) and second order intensimetric and interferometric autocorrelation signals ((Sl (2co), Sinterf (2ω)). extracting a measurement of the duration or the intensity profile and the phase of the wavefront 1 of the input laser pulse.
    权利要求:
    Claims (15)
    [1" id="c-fr-0001]
    A system for measuring the duration or temporal profile of an ultrashort laser pulse, characterized in that the measuring system comprises a single-shot optical autocorrelator comprising: a wavefront division optical component (10, 11) arranged for receiving a collimated wavefront (1) of fundamental optical frequency (ω) from an ultrashort laser pulse source and for spatially dividing the collimated wavefront (1) of an ultrashort light pulse into a first edge divided wave propagating in a first direction and a second divided wave front propagating in a second direction forming a non-zero angle with the first direction; - a nonlinear optical crystal (20) disposed at a predetermined distance from the first direction; wavefront division optical component (10, 11) so that the first divided wavefront and the second divided wavefront are superimposed in the optical crystal n linear (20), - an optical system (22, 25, 26, 27, 28) forming an image of the nonlinear optical crystal on a detection system (30, 50) spatially resolved in at least one direction; a filtering device (21, 23, 24) arranged between the nonlinear optical crystal (20) and the detection system (30, 50), the filtering device (21, 23, 24) and the detection system ( 30) being configured to detect, on the one hand, an interferometric two-order interferometric autocorrelation trace at the dual optical frequency (2ω) and, on the other hand, at least one other interferometric type one-shot autocorrelation trace. of order one at the fundamental optical frequency (ω) or second order intensimetric type at the double optical frequency (2co), and in that - the measurement system comprises a signal processing system configured to analyze, d on the one hand, the two-order one-shot interferometric autocorrelation trace at the double optical frequency (2ω), and, on the other hand, the other one-shot autocorrelation trace, and to deduce a measure of duration or Ultrabr laser pulse time profile Eve (1).
    [2" id="c-fr-0002]
    An ultrashort laser pulse duration or time profile measuring system according to claim 1 wherein the wavefront dividing optical component comprises a Fresnel bi-prism or a Fresnel bi-mirror having an angle of fixed or symmetrically adjustable vertex.
    [3" id="c-fr-0003]
    An ultrashort laser pulse duration or time profile measuring system according to claim 2 wherein the distance D between the wavefront dividing optical component and the nonlinear optical crystal is between: 0.1 * delta and 0.5 * delta, where delta is equal to

    where Φ represents the input diameter of the device and where a is equal to (180 - A) (n-1) where A represents the apex or apex angle of the Fresnel bi-prism and n the refractive index prism material.
    [4" id="c-fr-0004]
    An ultrashort laser pulse duration or time profile measuring system according to claims 2 and 3 comprising a plurality of Fresnel bi-prisms each having a determined vertex angle and further comprising a switching system adapted to select a Fresnel bi-prism among the plurality of Fresnel bi-prisms and for arranging the selected bi-prism at a distance D from the nonlinear optical crystal (20) as defined in claim 3.
    [5" id="c-fr-0005]
    5. A system for measuring the duration or the ultrashort laser pulse time profile according to one of claims 1 to 4 wherein the nonlinear optical crystal (20) has a thickness greater than or equal to 5 microns and a phase matching adapted to allow optical frequency doubling in a spectral range of 0.4 to 12 micrometers.
    [6" id="c-fr-0006]
    6. A system for measuring the duration or time profile of ultrashort laser pulse according to one of claims 1 to 5 wherein the filtering device (21, 23, 24) comprises a switchable spatial filter opening between a first and a second opening, the first opening being configured to pass to the detection system on the one hand the direction of propagation of the bisector of the first and second directions and on the other hand the first direction and / or the second direction, so as to form the second order one-shot interferometric autocorrelation trace, and the second aperture respectively being configured to selectively pass the propagation axis along the bisector of the first and second directions to the detection system while blocking the first and second directions to form the second one-order intensity-type one-shot autocorrelation trace.
    [7" id="c-fr-0007]
    7. A system for measuring the duration or time profile of an ultrashort laser pulse according to one of claims 1 to 6 wherein the filtering device (21, 23, 24) comprises a spectral filter (21) configured to selectively filter the double optical frequency (2ω) and to block the fundamental optical frequency (ω).
    [8" id="c-fr-0008]
    8. system for measuring the duration or the ultrashort laser pulse time profile according to one of claims 1 to 6 wherein the detection system comprises a camera (30) comprising first and second spatially resolved detection zones and in wherein the filtering device (21, 23, 24) comprises a spectral filter (21) having first and second spectral filtering areas, the first spectral filtering area being configured to selectively pass the dual optical frequency (2co) to the first detection zone while blocking the fundamental optical frequency (ω), and the second spectral filtering area being configured to selectively pass the fundamental optical frequency (ω) to the second detection zone while blocking the dual optical frequency (ω); 2ω).
    [9" id="c-fr-0009]
    9. System for measuring the duration or the ultrashort laser pulse time profile according to one of claims 1 to 8 wherein the detection system comprises a camera (30) comprising a first and a second detection region resolved spatially and in wherein the filtering device comprises a spatial filter (24) having at least a first spatial filtering area and a second spatial filtering area, the first spatial filtering area being configured to pass, on the one hand, the propagation direction of the bisector of the first and second directions and, on the other hand, the first and / or second direction, towards the first detection region, so as to form the second order one-shot interferometric autocorrelation trace, and respectively the second spatial filtering area being configured to selectively pass the propagation direction along the bisector of the first e and second directions while blocking the first and second directions towards the second detection region, to form the second one-second intensity-type one-shot autocorrelation trace.
    [10" id="c-fr-0010]
    An ultrashort laser pulse duration or time profile measuring system according to one of claims 1 to 9, further comprising a spectrometer (70) configured to record a spectrum of the light pulse, and wherein the signal processing is configured to derive a measurement of the phase of the light pulse.
    [11" id="c-fr-0011]
    11. System for measuring the duration or the ultrashort laser pulse time profile according to one of claims 1 to 9 wherein the detection system comprises an imaging spectrometer (50) having an entrance slot (51), a system spectrally dispersive optics (53, 56) and a spatially resolved detector (35) in two directions, the filtering device (21, 23, 24) and the imaging spectrometer being configured to detect, on the one hand, a trace of autocorrelation spectrally resolved one-shot intensimetric intensifier and, on the other hand, a spectrally resolved one-shot interferometric autocorrelation trace.
    [12" id="c-fr-0012]
    An ultrashort laser pulse duration or time profile measuring system according to claim 11 wherein the spectrally dispersive optical system (53, 56) comprises a transmission or reflection diffraction grating.
    [13" id="c-fr-0013]
    An ultrashort laser pulse duration or time profile measuring system according to claim 11 or 12, wherein the optical system (22, 25, 26, 27, 28) forming the non-linear optical crystal image on the input slit of the imaging spectrometer (50) comprises an achromatic optical system comprising a first spherical mirror (28) illuminated at an angle of incidence of less than 4 degrees, and a second mirror (27) configured to separate a reflected optical beam from an incident optical beam on the first spherical mirror.
    [14" id="c-fr-0014]
    14. An ultrashort laser pulse duration or time profile measuring system according to one of claims 11 to 13 wherein the imaging spectrometer (50) comprises another achromatic optical mirror system (58, 59) configured to form a image of the entrance slit (51) on the detector (35), the other achromatic optical mirror system (58, 59) comprising a spherical mirror (58) illuminated at an angle of incidence of less than 3 degrees, and another mirror (59) configured to separate a reflected optical beam from an incident optical beam on said spherical mirror (58).
    [15" id="c-fr-0015]
    An ultrashort laser pulse duration or time profile measuring system according to one of claims 1 to 14, further comprising an optical alignment diaphragm (2) adjacent to the wavefront division optical component (10). , 11), the alignment diaphragm being positioned vertically to the first foot of the device thereby forming a pivot point for aligning the device with the optical axis.
    类似技术:
    公开号 | 公开日 | 专利标题
    EP3345264B1|2020-09-23|System for measuring the duration, time profile and spectrum of an ultra-fast laser pulse
    FR2956929A1|2011-09-02|LASER OUTPUT HANDLING SYSTEM
    WO2015193253A1|2015-12-23|Device and method for characterization of a light beam
    EP2852815B1|2017-01-04|Chromatic altimetry converter
    FR2942036A1|2010-08-13|AUTOCORRELATOR DEVICE WITH BIPRISM FOR THE TEMPORAL MEASUREMENT OF ULTRA - BRAKE LIGHT PULSES.
    WO2019220047A1|2019-11-21|Composite multispectral raman spectroscopy method and device
    CA2553743C|2014-07-22|Device and method for measuring the contrast of the fringes in a michelson interferometer and system for examination of the eye comprising such a device
    EP0502752B1|1996-09-18|Spectroscopic apparatus
    EP3644032A1|2020-04-29|Imaging spectrometer and single-pulse optical autocorrelator device comprising such an imaging spectrometer
    FR2976663A1|2012-12-21|DEVICE AND METHOD FOR CHARACTERIZING A LIGHT BEAM.
    EP2078184B1|2021-01-27|Method for correcting a wave front analyser and analyser implementing said method
    FR3072168B1|2019-10-04|METHOD AND OPTICAL ANALYSIS ASSEMBLY OF ULTRA-BRIEF LASER PULSE
    EP3615902B1|2021-04-14|Method for spatio-spectral characterization of a polychromatic pulsed laser source
    FR2974899A1|2012-11-09|MULTISPECTRAL SCANNING TELESCOPE HAVING WAVEN FRONT ANALYSIS MEANS
    FR3053464A1|2018-01-05|SPECTRO-MULTIFIER IMAGER WITH FOURIER TRANSFORM
    BE1027225B1|2020-11-23|Deflectometry measuring system
    WO2020016259A1|2020-01-23|Method and device for characterising optical filters
    WO2021069199A1|2021-04-15|Device and method for imaging and interferometry measurements
    FR3034577A1|2016-10-07|DEVICE AND METHOD FOR CHARACTERIZING A FEMTOSECOND LASER PULSE
    EP2839254B1|2021-06-30|Method and device for reconstructive multi-spectral imaging
    FR3076347A1|2019-07-05|OBSERVATION INSTRUMENT HAVING A STATIC INTERFEROMETRIC DEVICE HAVING DIFFERENCES ON THE MARKET
    同族专利:
    公开号 | 公开日
    WO2017037402A1|2017-03-09|
    FR3040828B1|2018-11-02|
    EP3345264B1|2020-09-23|
    US20180245985A1|2018-08-30|
    LT3345264T|2020-12-10|
    EP3345264A1|2018-07-11|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    US20020180977A1|2001-05-04|2002-12-05|Excel/Quantronix Corp.|Apparatus and method for measuring intensity and phase of a light pulse with an interferometric asymmetric single-shot autocorrelator|
    WO2010089511A1|2009-02-06|2010-08-12|Ecole Polytechnique|Double prism autocorrelation device for the time measurement of ultra-short light pulses|
    US5754292A|1992-10-26|1998-05-19|The Regents Of The University Of California|Method and apparatus for measuring the intensity and phase of an ultrashort light pulse|
    US5530544A|1992-10-26|1996-06-25|Sandia Corporation|Method and apparatus for measuring the intensity and phase of one or more ultrashort light pulses and for measuring optical properties of materials|
    DE10028756B4|2000-06-09|2004-05-06|Forschungsverbund Berlin E.V.|Method and arrangement for spatially and time-resolved interferometric characterization of ultrashort laser pulses|
    US6504612B2|2000-11-14|2003-01-07|Georgia Tech Research Corporation|Electromagnetic wave analyzer|
    US7130052B1|2004-03-24|2006-10-31|Daniel J. Kane|Real-time measurement of ultrashort laser pulses|
    US7379186B2|2005-06-10|2008-05-27|Osaka University|Chirp indicator of ultrashort optical pulse|FR3072168B1|2017-10-06|2019-10-04|Femto Easy|METHOD AND OPTICAL ANALYSIS ASSEMBLY OF ULTRA-BRIEF LASER PULSE|
    CN108593121B|2018-04-03|2020-02-07|上海交通大学|Ultrashort pulse autocorrelation measuring device and measuring method|
    FR3087885B1|2018-10-26|2021-02-19|Femto Easy|IMAGING SPECTROMETER AND SINGLE-SHOT OPTICAL AUTOCORRELATOR DEVICE INCLUDING SUCH IMAGING SPECTROMETER|
    CN111595470B|2020-05-30|2021-05-14|华南理工大学|Intelligent high-repetition-frequency femtosecond pulse real-time full-field measurement method and system|
    法律状态:
    2016-08-19| PLFP| Fee payment|Year of fee payment: 2 |
    2017-03-10| PLSC| Search report ready|Effective date: 20170310 |
    2017-09-15| PLFP| Fee payment|Year of fee payment: 3 |
    2018-09-21| PLFP| Fee payment|Year of fee payment: 4 |
    2019-09-27| PLFP| Fee payment|Year of fee payment: 5 |
    2020-07-08| PLFP| Fee payment|Year of fee payment: 6 |
    2021-09-03| PLFP| Fee payment|Year of fee payment: 7 |
    优先权:
    申请号 | 申请日 | 专利标题
    FR1558223|2015-09-04|
    FR1558223A|FR3040828B1|2015-09-04|2015-09-04|ULTRABRED LASER IMPULSE TIME OR TEMPERATURE MEASUREMENT SYSTEM|FR1558223A| FR3040828B1|2015-09-04|2015-09-04|ULTRABRED LASER IMPULSE TIME OR TEMPERATURE MEASUREMENT SYSTEM|
    US15/757,588| US20180245985A1|2015-09-04|2016-09-05|System for measuring the duration, time profile and spectrum of an ultra-fast laser pulse|
    PCT/FR2016/052191| WO2017037402A1|2015-09-04|2016-09-05|System for measuring the duration, time profile and spectrum of an ultra-fast laser pulse|
    EP16775776.4A| EP3345264B1|2015-09-04|2016-09-05|System for measuring the duration, time profile and spectrum of an ultra-fast laser pulse|
    LTEP16775776.4T| LT3345264T|2015-09-04|2016-09-05|System for measuring the duration, time profile and spectrum of an ultra-fast laser pulse|
    [返回顶部]