• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    The invention relates to a method for detecting defects of a set of test leads (25) comprising at least two wires each having an input end and an output end. The method comprises successively a step of connecting (10) at least one wire being analyzed to the signal generator (26) and grounding the other wires, a step of generating (12) a signal of test on the channel being analyzed by the signal generator (26), a step of acquiring and measuring (13) the power of a first feedback signal on at least one wire connected by the signal unit acquisition (29), and a step (14) for analyzing the integrity of the yarn being analyzed from the power of the yarn return signal in question and the analysis unit (31). These steps are repeated automatically by changing each time wire to test.
    公开号:FR3020877A1
    申请号:FR1454089
    申请日:2014-05-06
    公开日:2015-11-13
    发明作者:Patrick Gontier；Jerome Daurelle；Lionel Rodriguez
    申请人:Nexeya Systems；
    IPC主号:
    专利说明:

    [0001] The present invention relates to a method for detecting permanent and intermittent defects of a set of son to be tested. It relates generally to the field of electrical tests. It relates more particularly to the detection of electrical cable defects.
    [0002] The invention finds applications, in particular, in various sectors such as aeronautics, automotive, rail and industry. In thirty years, the length of the cables on board an aircraft as well as the number of connections are more than tenfold. In addition, the arrival of "by wire" technology and all-electric gives a crucial importance to electrical connections since they tend to become the unique link between the driver, his actions, and the vehicle. The reliability of the wiring is therefore predominant in the aeronautical field but also in any type of industry. Subject to the passage of time and to various constraints, a wire is caused to degrade and to present defects. These defects modify the electrical behavior of the wire and may eventually lead to more or less significant failures of the systems it connects. For issues of quality of service, cost and security, it is necessary to prevent these failures and thus to be able to diagnose the condition of the cables, that is to say to detect and characterize the faults of the wiring. OTDR is a diagnostic method used for the electrical characterization of cables. It consists of injecting a signal into a wire to be diagnosed. This signal propagates along the wire and when it encounters a mismatch, part of its energy is sent back to the injection point.
    [0003] The analysis of the reflected signal makes it possible to deduce information on the wire such as a defect. It is known to use a reflectometry method when it comes to detecting permanent damage to a wire. However, the detection as well as the location of intermittent defects are much more difficult because of the very short period during which these defects disturb the system and also the variation of said period in time.
    [0004] The most common intermittent defects are usually crimping problems or damaged wires that short circuit each other during vibration. These defects are usually seen by surrounding systems.
    [0005] In addition, current methods for detecting defects by OTDR can only diagnose one wire at a time. But a wire is rarely alone and is instead grouped in a structure called beam, cable or harness. Current methods therefore require long and tedious manual manipulations by a user to detect defects on a set of son. The invention aims to eliminate, or at least mitigate, all or part of the disadvantages of the prior art mentioned above. The object of the present invention is therefore to propose a method for diagnosing cable faults that makes it possible to detect faults on electrical wires of beams. In particular, the present invention aims at providing a fault detection method that is fast and efficient. Indeed, in the case of an aeronautical application, the detection method advantageously allows the detection of permanent and intermittent defects for example on 512 son of a length of approximately 100m in a period of about 1 ms. The method will preferably detect intermittent and permanent type defects, in particular open-circuit and / or short-circuit-type and / or short-circuit faults between two wires of the same beam. The invention also aims at providing a simple diagnostic method which limits the number of manual manipulations. A fault detection method according to the invention will also preferably be easy to regulate and / or a high reliability and / or a moderate cost. For this purpose, the present invention proposes a method for detecting defects of a set of test leads comprising at least two wires each having a so-called first input end and a so-called second output end.
    [0006] According to the invention the method uses: - a signal generator, - an electrical mass, - a switching matrix having a set of channels respectively connected to the input ends of the son to be tested, and whose function is to switch on the test leads are either the electrical ground or the signal generator and select only one of the channels for analyzing a return signal; - a set of end loads connected to the output ends of each wire; acquisition adapted to measure the return signal, - an analysis unit, and - a control unit, and successively comprises the following steps: - selection and connection of at least one wire being analyzed to the signal generator and grounding the other wires, - generating a test signal on the wire being analyzed by the signal generator, - measuring the power of a feedback signal on at least one of the wires connected to the acquisition unit, - analysis of the power of the return signal of the wire considered by the analysis unit, and - determination of the integrity of the wire being analyzed, the steps of said process being automatically repeated in changing each time wire to test. A first test phase is thus defined by the generation step, the measurement step and the determination step. It has been found that this method of detecting faults makes it possible to limit the intervention of a user by successively testing the different wires automatically. In addition, tests have shown that such a method is particularly well suited for the detection of intermittent defects and furthermore comprises good reliability. In particular, this method makes it possible to detect non-permanent defects by reflectometry in a reliable and rapid manner. An embodiment here provides that the detection method comprises, if at least one thread of the set of threads is diagnosed as non-integral, the following successive steps: - generation of a locating signal on a wire diagnosed not integrated by the signal generator, - measurement of a second feedback signal on said unintegrated wire diagnosed by the acquisition unit, - analysis of said nonintegrated wire diagnosed by reflectometry by the analysis unit, and - determination of the position of the defect in said diagnosed non-integral wire.
    [0007] A second test phase is thus defined by the generation step and the measurement step. Advantageously, this second test phase as well as the analysis step and the determination step make it possible, by reflectometry, to precisely locate along the wire considered the fault detected during the first test phase. Thus, the invention contributes to facilitating the maintenance of wire bundles. In an alternative embodiment of the invention, the determination of the position of the defect is carried out by: - shift processing of the frequency feedback signal from a frequency modulated localization signal and / or - offset processing of the propagation of the time return signal from a pulse localization signal and / or - pulse compression processing of the return signal from a frequency modulated localization signal truncated by a door function. Advantageously, the second phase comprises a location signal having a bandwidth of the order of 320 MHz.
    [0008] In addition, according to one embodiment of the invention, the generated test signal is a low frequency signal, in particular between 500 kHz and 5 MHz. Advantageously, the test signal is in particular of the order of 1 MHz.
    [0009] There is also provided here a detection method capable of recording for each test wire a measurement of the return signals with respect to the test signals. Also, said detection method may be able to compare the current measurement with already recorded measurements allowing preventive maintenance of the set of wires.
    [0010] Advantageously, the fact of recording and comparing the different measurements of the same wire made separately in time prevents potential defects. This makes it easier to maintain the cables. The proposed detection method may further be capable of characterizing a set of wires. To do this, the method uses for example a RLC-meter and a switching matrix RLC having a set of channels respectively connected to the input ends of the son to be tested, and whose function is to switch on the son to be tested is the electric mass, ie the RLC-meter and successively comprises the following steps: - selection and connection of at least two wires being analyzed at the RLC-meter and grounding of the other wires, - generation of a signal of measurement by the RLC-meter, - measurement of resistance and / or measurement of inductance and / or capacity measurement, and - characterization of the wires being analyzed. The present invention further relates to a mobile device comprising the means necessary for the implementation of all the steps of a defect detection method as described above. Such a device according to the invention then comprises for example: a signal generator, an electrical ground, a switching matrix having a set of channels respectively connected to the input ends of the wires to be tested, and whose function is directing on the test leads either the electrical ground or the signal generator and selecting only one of the channels for analyzing a return signal, - a set of end loads connected to the output ends of each wire, - an acquisition unit adapted to measure the return signal, - an analysis unit, and - a control unit. Such a device may be such that the switching matrix is a high-frequency switching matrix having a set of channels respectively connected to the input ends of the test leads whose function is to switch on the test leads or the electrical mass. either the signal generator and select only one of the channels to analyze a feedback signal. The switching matrix advantageously comprises at least one FET transistor operating as a switch, thus enabling very fast switching.
    [0011] Advantageously, such a switching matrix enables a fault detection method according to the invention to automatically change the wire to be tested without any intervention by a user. This matrix therefore contributes to the automation of a method according to the invention.
    [0012] In addition, the speed of switching of this matrix also allows a method according to the invention to detect defects in a set of son very quickly. The implementation of such a device makes it possible, for example, to detect defects on 1024 wires with a length of approximately 100 m in a duration of approximately 2 ms or to detect defects on 512 wires of an approximate length of 100m in a duration of about 1 ms. In an advantageous embodiment of the invention, the matrix, the acquisition unit, the analysis unit and the control unit are positioned on the same electronic card. In one embodiment, a device further includes a computer having a software interface for controlling the remote fault detection method. This advantageously makes it possible to move the box while controlling it remotely using a software interface and thus to facilitate its use. Finally, the present invention relates to a box also comprising a RLC-meter connected via a switching matrix RLC to all the test leads allowing the detection of defects by resistance measurements, inductance measurements. and measures of capacity. Advantageously, a measurement of the RLC type makes it possible to accurately characterize the permanent type defects. A defect detection device as described above can be included in a mobile case that can be used on several devices or be included in-situ embedded in an apparatus. Details and advantages of the present invention will appear better on reading the following description, made with reference to the attached schematic drawings in which: - Figure 1 is an activity diagram illustrating an embodiment of the present invention, - FIG. 2 is an activity diagram illustrating an alternative embodiment of the mode illustrated in FIG. 1; FIG. 3 is a diagram showing a defect detection and localization process according to an embodiment of the present invention, and FIG. 4 is a block diagram illustrating a defect detection device according to the present invention. Fig. 1 illustrates the general operation of an embodiment of a defect detection method according to the present invention. The invention relates to a method for detecting defects. The detected faults are liable to cause faults and are, for example, intermittent, non-permanent or transient types. The detection method also advantageously detects permanent defects. This method applies to a set of wires 25 (shown in FIG. 4) to be tested. This method advantageously applies to all the son of the same beam. In this embodiment, it will be assumed that the yarns are of monofilament type, but the detection method according to the invention can also be applied to any type of yarn. The wires each have a first end called input and a second end called output. Each output end is connected to a suitable end load, for example a resistive load, and each input end is connected to a device included in a housing 24 (shown in Figure 4) for the detection of defects. There is therefore, preferably, as many loads as son to test. Each load is connected on the one hand to an output end of a test wire and on the other hand to an electrical ground 36 (shown in FIG. 4). The present defect detection method proposes a first connection step 10 during which each input end of the different test leads is connected to a signal generator 26 or to the electrical ground 36 or an acquisition unit 29 via a switching matrix 27 (these components being shown in FIG. 4) as well as, on the other hand, each output end of these wires at each end load. Thus in this exemplary embodiment, an input end of a first test lead receives a first test signal while the other input ends of the other leads of the set of test leads are connected to the ground. 36. The wire receiving the first test signal is the wire whose integrity will be determined and is said wire being analyzed. The fact of connecting the wires which are not the wire being analyzed to the ground 36 advantageously makes it possible to avoid creating parasitic capacitances and thus makes the measurements more reliable. This allows, in addition, to increase the number of son to test automatically without degrading the measurement.
    [0013] Once the connections are put in place, the method has a first test phase 11 which makes it possible to detect whether the set of wires 25 has defects or not. The first phase 11 comprises a plurality of fault detection subphases, each having a generation step 12, an acquisition and measurement step 13 and an analysis step 14. Whenever the method changes wire to test a detection sub-phase applies to the wire being analyzed. To do this, the generation step 12 sends a test signal to the wire being analyzed. This test signal is for example a low frequency signal, in particular between 500kHz and 5MHz, and preferably of the order of 1MHz. The first test signal propagates along the wire being analyzed to the end load. A first feedback signal corresponds to the superposition of the signals reflected in the wire being analyzed and on the end load. The proposed method then presents the acquisition and measurement step 13 of this first feedback signal. During this measurement step 13, the power of the first feedback signal is measured. According to an alternative embodiment, at least one input end of one of the son that is not being analyzed is not connected to the ground 36. The acquisition of the first wire return signal in progress analysis can then be done on the wire whose input end is not connected to ground 36 even if this wire is not the wire being analyzed. It is thus possible to detect a coupling between two son of the set of son 25.
    [0014] The first feedback signal is then analyzed, in the analysis step 14, to determine if the wire being analyzed has a fault. This analysis is done by comparing the power of the test signal with that of the first feedback signal. Depending on a certain predetermined threshold of power difference between the two signals, the wire being analyzed is diagnosed with integrity or not. After the analysis is performed, the input end of the first wire is connected by the switching matrix 27 to ground, thereby defining a wire change step. A second test signal having the same characteristics as the first test signal is then transmitted to an input end of a second wire of the set of son 25 to be tested. Another detection sub-phase comprising a generation step 12, an acquisition and measurement step 13 and an analysis step 14 is then performed. A thread change step is repeated automatically as many times as necessary, i.e., at least as many times as there are threads to be tested.
    [0015] When a fault has been detected during the first phase 11, the detection method proposes a second test phase 16 making it possible to locate the defect by reflectometry. This second phase 16 is applied only to the wires that the first phase 11 has determined to be ungrateful. This second test phase 16 comprises a plurality of defect localization subphases. Each sub-phase of location successively has a generation step 17 and an acquisition and measurement step 18. Whenever the method changes the wire to be tested, a sub-phase of localization is applied to the current wire. 'analysis. The different sub-phases of the second phase 16 can advantageously implement at least one of the following three reflectometry methods: frequency shift processing (FDR), time shift processing (TDR) and / or pulse compression . During the generation step 17, a location signal is sent on the wire being analyzed including a fault. The location signal preferably has a frequency band of the order of 320 MHz. During the acquisition and measurement step 18, a second feedback signal, corresponding to the superposition of the signals reflected in the wire under analysis and on the end load, is acquired at the end of input of the wire being analyzed. After each localization sub-phase, the method allows either to continue to detect faults in a so-called continuous mode of the method via the wire change step, or to stop the detection at the first fault detection in a so-called stop mode on process defect. The present method may further include a step of analyzing the second feedback signal to locate the fault on the wire being analyzed. Reflectometry by a TDR method consists of sending a pulse or voltage step as a locating signal in the wire during the generation step 17. The second return signal is then in the form of a succession of peaks, corresponding to reflections of the localization signal on discontinuities or defects of the wire being analyzed. Thus during the analysis step 19, the nature and the position of the defect are respectively determined by the amplitude and the propagation delay of the detected peaks, the signal propagation speed being known. The nature and position of the defect can also be determined by comparing the measurement made at the acquisition and measurement step 18 with an initial measurement without any defect serving as a reference, the length of the wire being known. Advantageously, several types of signals may be used, for example a gate function or a Heaviside step or a Gaussian pulse.
    [0016] In the FDR method of reflectometry, the location signal is a frequency-modulated signal. The acquisition and measurement step 18 and the analysis step 19 may consist of either the measurement of the frequency shift between the location signal and the corresponding second feedback signal, or the measurement of the phase shift between the location signal and the corresponding second return signal to locate the fault. In the pulse compression method, the location signal used is advantageously a sinusoidal signal modulated in frequency and truncated by a gate function.
    [0017] The first test phase 11 therefore makes it possible to detect defects on the wire assembly 25. Once the presence of at least one defect has been demonstrated, the second test phase 16 makes it possible to locate the defects along the wire tested. . Figure 2 illustrates the general operation of a variant of the defect detection method presented above. In this alternative embodiment, the defect detection method further comprises a first step of storing each power measurement of the first feedback signal during each detection sub-phase. The measurement storage step 20 makes it possible subsequently to perform a first comparison step 21 of the current measurement of the wire being analyzed with the different measurements already recorded for the same cable during previous tests. Similarly, the defect detection method may also advantageously comprise a second storage step 22 of each measurement of the second return signal made by reflectometry at each location sub-phase, as well as a second comparison step 23 of the current measurement of the thread being analyzed to the different measurements already recorded for the same thread in previous tests. Fig. 3 is a timing diagram showing a defect detection and localization process according to an embodiment of the present invention.
    [0018] In this embodiment, a total duration T1 of the process comprises the first phase 11 of a duration T2 allowing the detection of defects followed by the second phase 16 of a duration T3 allowing the location of the defects. T represents the duration of a first detection sub-phase on a cable. As described above, a first detection sub-phase is performed on a first test wire, here on a channel 1, then successively a second detection sub-phase is carried out on a second test wire, here on a channel 2, and so on until all the threads are tested. In the example of FIG. 3, a fault is detected on channel 2 by a decrease in the power of the feedback signal with respect to the corresponding test signal. The second phase 16 is then performed on the channel 2 once the first phase 11 is completed. FIG. 3 illustrates a TDR reflectometry method followed by an FDR reflectometry method for locating the fault. As a purely illustrative and non-limiting numerical example, for a set of wires 25 comprising 512 single wires with a length of 100 m, T1 is approximately equal to 1 ms, T is of the order of 1.4ps, T2 is of the order of 700ps and T3 is therefore of the order of 300ps. Indeed, with a propagation time of approximately 7ns in 1m of electrical wire, we obtain a total propagation time back / forth along a wire of 100m of the order of 1.4ps. Thus the first test phase for 512 wires lasts approximately 716ps. A sub-phase of locating a defect lasts less than 80ps. FIG. 4 is a block diagram illustrating a device making it possible to implement a detection method described above. To be implemented, the defect detection method comprises a set of test leads 25 connected to an output end to a set of loads 28 and to the input end to the housing 24 for detecting and locating the defaults. The detection device is comprised in the case 24 and comprises: a part intended for the detection of non-permanent and permanent defects, comprising the signal generator 26, the electrical ground 36, the switching matrix 27, the unit of acquisition 29 and an analysis unit 30, and - a part intended for the characterization of the son set 25, comprising a RLC-meter 34, the mass 36 and a switching matrix 35. The box 24 further comprises a control unit 31 for the two parts above. The signal generator 26 included in the housing 24 has the function of generating the test signals and the location signals used respectively during the first phase 11 of detecting intermittent faults and the second phase 16 of locating the detected faults. The generator 26 is connected via the switching matrix 27 to the input ends of each wire of the set of wires 25. The switching matrix 27 has an input channel which connects the input ends of the wires to the generator 26 or 36. It also has a set of output channels comprising at least as many channels as son to test. The switching matrix 27 further has an output path to the acquisition unit 29. The switching matrix 27 is a high frequency switching matrix and advantageously comprises a plurality of FET transistors operating in switching mode.
    [0019] Each output end of the test leads is connected to a load of the set of charges 28. These charges intended to adapt each wire to be tested are of the resistive type. It is preferably resistive loads of a given value of 500. The acquisition unit 29 performs the acquisition and measurement steps 13 and the acquisition and measurement steps 18. The purpose of the analysis 30 is to carry out the analysis steps 14 and the analysis steps 19. It also has the function of determining the integrity of the wire being analyzed and of locating the defects. The control unit 31 is a processor for centralizing, controlling and synchronizing, preferably, all the components of the device. The control unit 31, also called processing unit, is based on an FPGA structure that allows it to perform these functions in parallel. One embodiment provides that a computer 32 including a software interface can control the remote fault detection method. The device and the computer 32 are connected by a wired or wireless WIFI network. This computer 32 makes it possible to simplify the implementation of the method while controlling the type of measurement, the number and the length of the son to be tested. In a particular embodiment, the computer 32 is a tablet. In another advantageous embodiment of the invention, a memory 33 external or internal to the computer 32 is configured to allow the realization of the storage step 20 and the storage step 22. This memory 33 is connected to the computer 32 to enable it to perform the comparison step 21 and the comparison step 23. Also an embodiment of the invention makes it possible to perform an RLC type measurement to determine the integrity and to characterize a set of son 25, and thus to determine the presence of permanent defect. To do this, the housing 24 comprises for example a RLC-meter 34. The RLC-meter 34 is connected to each first input end of the son of the set of son 25 via a switching matrix RLC 35 comprising at least as much output channels than son to test. The RLC matrix 35 further comprises two input channels for connecting the RLC-meter 34 to two son to be characterized. The matrix RLC 35 also makes it possible to connect the wires which are not characterized to ground 36 thus avoiding the creation of parasitic capacitances. The output ends of the son of the set of son 25 are not connected to loads but left in their environment. In one embodiment, the RLC matrix 35 comprises a plurality of static relays. The RLC-meter 34 and the RLC matrix 35 are advantageously controlled by the control unit 31.
    [0020] The RLC-meter 34 advantageously makes it possible to carry out resistive measurements, inductance measurements and / or capacitive measurements. The method of characterizing the son set 25 using the RLC-meter 34 preferably comprises a generation step, an acquisition and measurement step and an analysis step.
    [0021] The housing 24 also comprises, according to an advantageous embodiment of the invention, an internal power supply (not shown), for example a battery. Thus the housing 24, which can be in the form of a transportable suitcase, can advantageously be transported in the field, for example on airport runways.
    [0022] The fault detection device may advantageously be configured in a self test mode, allowing it to calibrate itself and to determine if any of its own components have faults.
    [0023] The present invention thus makes it possible to detect intermittent defects in a set of wires. In addition, the invention advantageously makes it possible to detect permanent defects. In an advantageous embodiment, the present invention also makes it possible to locate the defects. The method and the means described make it possible to perform fault detection without any manual manipulation or even intervention of the user being necessary between the different test steps. The invention makes it possible to efficiently and inexpensively prevent the prevention of a set of wires. Thus, the recording of the measurements makes it possible, on the one hand, to detect a weakening of a wire and, on the other hand, to identify if a fault returns too often to the same place. Indeed, if the power of the first feedback signal of a current measurement differs from the power of the return signals of the previous measurements that have been stored but without reaching the default detection threshold, the user can then be informed that it is possible for a fault to occur quickly on this cable. Advantageously, a first power measurement is made for the production of the cable. We can then from the first test of the set of son 25 already have a reference in memory.
    [0024] In addition, if several faults appear too often at the same place, the user can then be informed and check why this place is generating defects. According to the foregoing description, the detection of defects is done on a set of son comprising single-wire son but the present invention also makes it possible to detect defects on other types of son such as twisted son or coaxial cables or even single-wire shielded cables using the wire and shield as connection points. One embodiment of the invention provides for carrying out the first test phase on all the son of the set of son to be tested, as soon as a fault is detected the second test phase is directly performed on the non-integral wire, once the fault is located, the first test phase can resume on the next wire. However, in an alternative embodiment of the present invention, the first test phase could be continuous and test all the son of the set of son and then perform the second test phase on ungrateful characterized son. The present invention can find its application for example in wire testing applications in the field of aeronautics but it can also find applications in various fields such as industrial equipment, energy, transport. Of course, the present invention is not limited to the preferred embodiment and embodiments described above by way of non-limiting examples. It also relates to the variants within the scope of those skilled in the art within the scope of the claims below.
    权利要求:
    Claims (14)
    [0001]
    REVENDICATIONS1. A method for detecting defects of a set of test leads (25) comprising at least two wires each having a first input end and a second output end, characterized in that it uses: - a generator ( 26), - a mass (36) electrical, - a switching matrix (27) having a set of channels respectively connected to the input ends of the son to test, and whose function is to switch on the son to testing either the electrical ground (36) or the signal generator (26) and selecting only one of the tracks for analyzing a return signal; - an end load set (28) connected to the output ends of each wire an acquisition unit adapted to measure the return signal, an analysis unit, and a control unit, in that the method successively comprises the following steps: selecting and connecting (10) at least one n wire being analyzed at the signal generator (26) and grounding the other wires, - generating (12) a test signal on the wire being analyzed by the signal generator (26) - measuring (13) the power of a first feedback signal on at least one wire connected by the acquisition unit (29), - analyzing (14) the power of the return signal of the wire considered by the analysis unit (30), and - determination of the integrity of the yarn being analyzed, and in that these steps are repeated automatically, each time changing thread to be tested.
    [0002]
    2. Detection method according to claim 1, characterized in that it comprises, if at least one son of the set of son (25) is diagnosedenon integrates, the following successive steps: - generation (17) of a signal locating on a wire diagnosed not integrated by the signal generator (26), - measuring (18) a second feedback signal on said non-integrity diagnosed wire by the acquisition unit (29), - analysis (19) ) said non-integrating wire diagnosed by reflectometry by the analysis unit (30), and - determining the position of the defect in said unrecognized wire.
    [0003]
    3. Detection method according to claim 2, characterized in that the determination of the position of the defect is achieved by: - shift processing of the frequency return signal from a frequency modulated localization signal and / or - offset processing of the propagation of the time-feedback signal from a pulse-shaped localization signal and / or - pulse compression processing of the return signal from a modulated localization signal frequency and truncated by a gate function.
    [0004]
    4. Detection method according to any one of claims 1 to 3, characterized in that the generated test signal is a low frequency signal, in particular between 500kHz and 5MHz.
    [0005]
    5. Detection method according to any one of claims 1 to 4, characterized in that it records for each test wire a measurement of the return signals relative to the test signals.
    [0006]
    6. Detection method according to any one of claims 1 to 5, characterized in that it compares the acquired measurement measurements already recorded in previous tests for preventive maintenance of the set of son.
    [0007]
    7. Detection method according to any one of claims 1 to 6, characterized in that it uses, in addition, a RLC-meter (34) and a switching matrix RLC (35) having a set of respectively connected channels at the input ends of the son to be tested, and whose function is to switch on the son to be tested either the electric mass (36) or the RLC-meter (34), and in that the method successively comprises the following steps : - selection and connection of at least two wires being analyzed at the RLC-meter (34) and grounding of the other wires, - generation of a measurement signal by the RLC-meter (34), - measurement of resistance and / or measurement of inductance and / or measurement of capacitance, and - characterization of the wires being analyzed.
    [0008]
    8. Device for detecting defects, characterized in that it comprises the means necessary for the implementation of all the steps of a defect detection method according to any one of claims 1 to 7.
    [0009]
    9. Device according to claim 8, characterized in that it comprises: - a signal generator (26), - an electrical ground (36), - a switching matrix (27) having a set of channels respectively connected to the ends input of the son to be tested, and whose function is to switch on the son to be tested either the electric mass (36) or the generator (26) of signals and select only one of the channels to analyze a return signal a set of end loads (28) connected to the output ends of each wire, an acquisition unit (29) adapted to measure the return signal, an analysis unit (30), and a control unit (31).
    [0010]
    10. Device according to claim 9, characterized in that the switching matrix (27) is a high frequency switching matrix having a set of channels respectively connected to the input ends of the son to test whose function is to switch on the wires to be tested either the electrical ground (36) or the signal generator (26) and to select only one of the channels to analyze a return signal.
    [0011]
    11. Device according to claim 9 or claim 10, characterized in that the switching matrix (27) comprises at least one FET transistor operating as a switch.
    [0012]
    12. Device according to any one of claims 8 to 11, characterized in that it comprises a computer (32) having a software interface for controlling the remote fault detection method.
    [0013]
    13. Device according to any one of claims 8 to 12, characterized in that it comprises a RLC-meter (34) connected via a switching matrix RLC (35) to all the son ( 25) to allow the characterization of the set of wires (25) by resistance measurements and / or inductance measurements and / or capacitance measurements.
    [0014]
    14. Mobile suitcase, characterized in that it comprises a device for detecting defects according to any one of claims 8 to 13.
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    同族专利:
    公开号 | 公开日
    EP3140666A1|2017-03-15|
    EP3140666B1|2020-09-23|
    FR3020877B1|2016-07-01|
    WO2015170055A1|2015-11-12|
    US20170153283A1|2017-06-01|
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    法律状态:
    2015-04-17| PLFP| Fee payment|Year of fee payment: 2 |
    2015-11-13| PLSC| Search report ready|Effective date: 20151113 |
    2016-04-29| PLFP| Fee payment|Year of fee payment: 3 |
    2017-03-29| PLFP| Fee payment|Year of fee payment: 4 |
    2018-04-27| PLFP| Fee payment|Year of fee payment: 5 |
    2019-04-19| PLFP| Fee payment|Year of fee payment: 6 |
    2020-08-27| PLFP| Fee payment|Year of fee payment: 7 |
    2021-03-30| PLFP| Fee payment|Year of fee payment: 8 |
    优先权:
    申请号 | 申请日 | 专利标题
    FR1454089A|FR3020877B1|2014-05-06|2014-05-06|METHOD FOR DETECTING PERMANENT AND INTERMITTENT DEFECTS IN A SET OF WIRES TO BE TESTED|FR1454089A| FR3020877B1|2014-05-06|2014-05-06|METHOD FOR DETECTING PERMANENT AND INTERMITTENT DEFECTS IN A SET OF WIRES TO BE TESTED|
    US15/308,927| US20170153283A1|2014-05-06|2015-05-06|Method for detecting permanent and intermittent faults in a set of wires to be tested|
    EP15724343.7A| EP3140666B1|2014-05-06|2015-05-06|Method for detecting permanent and intermittent faults in a set of wires to be tested|
    PCT/FR2015/051205| WO2015170055A1|2014-05-06|2015-05-06|Method for detecting permanent and intermittent faults in a set of wires to be tested|
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