APPARATUS AND METHOD FOR OPTICAL BEAM SCANNING MICROSCOPY

专利摘要:
The invention relates to an optical beam scanning microscope apparatus comprising a light source adapted to emit an optical beam (2) and a microscope objective (1) adapted to focus said optical beam (2) in an object plane (11). ). According to the invention, the microscopy apparatus comprises first and second reflective optical means (M-X1, M-X2) arranged in series on the optical path of the optical beam (2) between the light source and the objective microscope (1), first angular inclination means (21, 25) adapted to incline said first reflecting optical means (M-X1, M-XY1) at a first predetermined angle of rotation (RX1), and second means angular tilt device (22, 26) adapted to incline said second reflecting optical means (M-X2, M-XY2) at a second rotational angle (RX2) to angularly tilt the axis (12) of the optical beam (2) by pivoting about the center (O) of the pupil of the microscope objective (1).
公开号:FR3020141A1
申请号:FR1453479
申请日:2014-04-17
公开日:2015-10-23
发明作者:Emmanuel Fretel；Damien Andrezejeusky；Rene Boidin；Bettignies Philippe De
申请人:Horiba Jobin Yvon SAS；
IPC主号:

专利说明:

[0001] The present invention generally relates to the field of apparatus and methods for scanning optical beam scanning microscopy or optical beam angular displacement. It relates more particularly to a Raman micro-spectrometry apparatus and scanning laser beam. The invention is also applicable to other forms of optical scanning optical microscopy such as photoluminescence, fluorescence or cathodoluminescence microscopy. In these scanning optical microscopy devices, the scanning optical beam may be a laser beam or a beam emitted by a light emitting diode (LED), such as for example in a spectrofluorometer of TCSPC type (time-correlated single photon counting). Patent document EP1983332A discloses in particular a spectroscopic imaging method and a system for scanning the surface of a sample. EP1983332A discloses a spectroscopic imaging apparatus comprising a scanning device, also called a scanner, for exploring the surface of a fixed sample by angular displacement of a laser excitation beam in orthogonal directions. Specifically, EP1983332A discloses a scanning device placed in the tube of a confocal microscope so as to be inserted between the microscope objective and the injection-rejection filter of a Raman spectrometer. The scanning device comprises two galvanometric mirrors arranged in series on the optical path of the laser beam. The two galvanometric mirrors have transverse axes of rotation between them to angularly move the laser beam along orthogonal directions on the surface of the sample. The two-mirror optical system operates in one direction to angularly move the excitation laser beam to position it at different points on the surface of the sample. By inverse light return, this optical system with two mirrors operates in the opposite direction to collect a Raman backscattering beam and transmit it towards a detection system, for example a Raman spectrometer. The advantage of this system is that the laser source and the detection system remain fixed. This device makes it possible to acquire an image by Raman spectrometry of a portion of the surface of a sample with a resolution of approximately 50x50 points in about ten minutes. The size of the swept area on the sample depends in particular on the magnification of the microscope objective used. For the same amplitude of rotation of the mirrors, the change of magnification of the microscope objective makes it possible to modify the extent of the swept surface on the sample.
[0002] The microscope objectives used can be of different types: standard, Long-Long Distance (LWD), suitable for the visible and / or ultraviolet. However, regardless of the magnification of the microscope objective, it is found in practice that the extent of the area accessible by angular displacement of the laser beam on the surface of the sample is significantly less than the optical field of the objective of microscope. In the present document, the object field is understood to mean the optical field in the plane of focus of the microscope objective. Thus, by way of example, different microscope objectives such as 100X, 50X and 10X magnification objectives are used. Each microscope objective is defined by a Numerical Aperture (NA), Focal Length, Field Number (FN), and Diameter. A maximum optical field width is calculated as a function of the frontal distance which corresponds to the distance between the front face of the objective and the sample. In practice, the maximum optical field width of a microscope objective is calculated by applying the following formula: Field Width = Field Number / Magnification. The following table shows the parameter values of various OLYMPUS brand lenses of type M lan N 100X, 50X and 10X respectively: Olympus MPLAN N 100X Olympus MPLAN N 50X Olympus MPLAN N 10X Digital Aperture 0.90 0.75 0.25 Distance focal length 1,8mm 3,6mm 18mm Field count 22mm 22mm 22mm Lens diameter 3,24mm 5,4mm 9mm Maximum optical field width 220μm 440μm 2200μm Table 1: optical properties of different microscope objectives The maximum optical field width indicated in the table above corresponds to the optical field width of imaging through the microscope lens. However, in practice, the width of field accessible by scanning or angular displacement of a laser beam through each of these microscope objectives is in practice much less than the maximum field width of the objective considered.
[0003] Thus, for an Olympus MPLAN N 50X lens, it is experimentally measured that the field width of the two-axis, DuoScan laser scanning microscopy apparatus, effectively accessible is about + - 27 microns, while the maximum width of the Optical field of this lens is 440 microns. Similarly, for an Olympus MPLAN N 10X lens, the Duoscan laser scanning field is approximately 200 microns, while the maximum optical field width of this lens is 2200 microns. This limitation of the laser scannable field width is due to the vignetting of the laser beam on the apertures of the optical components. To limit this effect, it is necessary to reduce the diameter of the laser beam, which has the detrimental effect of reducing the spatial resolution (lambda / NA) because the effective numerical aperture of the microscope objective is reduced by under-covering the pupil.
[0004] In order to extend the spatial area of exploration of a laser scanning beam on a sample, various solutions have been proposed. A first solution is to change the microscope objective to reduce the magnification. A disadvantage of the change in magnification is that the spatial resolution of the measurements is proportional to the magnification of the lens. Another solution is to combine an angular tilt scan of the laser beam axis with a relative displacement of the sample relative to the microscope objective. However, changing the microscope objective or moving a sample table takes time. Moreover, these operations induce a discontinuous modification of the imaged field by the microscopy apparatus. In general, a series of contiguous images are obtained that are difficult to recombine to form a complete image of the sample over an extended area with good spatial resolution. Another limitation is the quality of the Raman spectrometry measurements obtained by scanning. Indeed, it is observed that the quality of the Raman microspectrometry scanning measurements is lower than the quality of the measurements taken without scanning, for otherwise identical measurement acquisition parameters. In addition, it is not possible to view directly on the image of a camera, the position of the scanning beam on the sample. It is therefore difficult to control the location of the laser beam, for example in applications measuring biochips.
[0005] One of the aims of the invention is to increase the accessible optical field width by scanning an optical beam in a scanning microscope to get closer to the maximum optical field width of this microscopy apparatus. One of the aims of the invention is to increase the spatial extent of the measurement field without modifying the spatial resolution of the measurements or the quality of the measurements.
[0006] Another object of the invention is to improve the quality of Raman microspectrometry scanning measurements while decreasing the measurement acquisition time. Another object of the invention is to limit the intensity losses on an incident laser beam and on a Raman scattering beam. In order to overcome the aforementioned drawbacks of the state of the art, the present invention proposes an optical beam scanning microscope apparatus comprising at least one light source adapted to emit an optical beam, a microscope objective having a pupil. input, the microscope objective being disposed along a longitudinal optical axis of the microscopy apparatus, the pupil having a center on the longitudinal optical axis, and the microscope objective being adapted to focus said optical beam in an object plane transverse to the longitudinal optical axis and means for angular displacement of the optical beam in at least one spatial direction (X, Y) in the object plane. More particularly, according to the invention, an optical beam scanning microscope apparatus is provided wherein said means for angular displacement of the optical beam comprise: first reflecting optical means and second reflecting optical means arranged in series on the optical path of the optical beam. laser beam between the laser source and the microscope objective, - first angular inclination means adapted to incline said first reflecting optical means at a first predetermined angle of rotation, and - second angular inclination means adapted to incline said second reflecting optical means at a second predetermined angle of rotation as a function of said first angle of rotation, so as to angularly incline the axis of the optical beam by pivoting about the center of the pupil of the microscope objective, said optical beam remaining centered on the center of the pupil of the microscope objective in a range of angles of inclination of the axis of the optical beam with respect to the longitudinal optical axis, so as to move the optical beam along said at least one direction in the plane object. The invention advantageously makes it possible to increase the amplitude of the displacement of the optical beam in the focal plane of the microscope objective in an optical beam scanning microscope apparatus. In a particular embodiment, said means for angular displacement of the optical beam further comprise: third reflecting optical means and fourth reflecting optical means arranged in series on the optical path of the laser beam between the laser source and the objective of microscope; third angular inclination means adapted to incline said third reflecting optical means at a third predetermined angle of rotation; and fourth angular tilting means adapted to incline said fourth reflecting optical means at a fourth predetermined angle of rotation. according to said third angle of rotation so as to angularly tilt the axis of the optical beam by pivoting about the center of the pupil of the microscope objective, said optical beam remaining centered on the center of the pupil of the microscope objective in a gamm e angles of inclination of the optical beam axis with respect to the longitudinal optical axis so as to move the optical beam in another direction in the object plane. Other non-limiting and advantageous features of an optical beam scanning microscope apparatus according to the invention are the following: the first reflecting optical means and the third reflecting optical means are formed by the same first mirror; the second reflecting optical means and the fourth reflecting optical means are formed by the same second mirror; the first mirror is mounted on an actuator with two axes of rotation, for example of the piezoelectric type or an acoustic coil, and / or the second plane mirror is mounted on an actuator with two axes of rotation, for example of piezoelectric or coil type acoustic ; the first reflecting optical means are formed of a first mirror and the second reflecting optical means are formed of a second mirror; the third reflecting optical means are formed of a third mirror and the fourth reflecting optical means are formed of a fourth mirror; the first mirror is mounted on an actuator with an axis of rotation, for example of the galvanometric scanner type, the second mirror is mounted on an actuator with an axis of rotation, the third mirror is mounted on an actuator with an axis of rotation, and / or the fourth mirror is mounted on an actuator to an axis of rotation; the actuator of the first mirror comprises a position sensor supplying a position signal and the actuator of the second mirror comprises a position sensor, the apparatus comprising a phase-locked loop system adapted to control a control signal of the actuator of the second mirror according to the position signal of the actuator of the first mirror and / or the actuator of the third mirror comprises another position sensor providing another position signal and the actuator of the fourth mirror comprises another position sensor, the apparatus comprising a phase lock loop system adapted to slave a control signal of the actuator of the fourth mirror according to the position signal of the actuator of the third mirror; the second angle of rotation is a function of the first angle of rotation, the distance B between the first reflecting optical means and the second reflecting optical means, the distance A between the second reflecting optical means and the center of the entrance pupil; the microscope objective; the microscopy apparatus comprises a plurality of microscope objectives having different magnifications; said at least one light source comprises one or more sources of the laser source and / or light emitting diode type.
[0007] In particular embodiments of an optical beam scanning microscope apparatus according to the invention, the apparatus further comprises: - a beam expander disposed between said at least one light source and the microscope objective the beam expander having a fixed and / or variable magnification; a viewing camera adapted to form an image of the object plane of the microscope objective and / or to display an area of a scanned optical beam scanning sample; a white light source adapted to illuminate a sample in the object plane; a confocal hole disposed in a plane optically conjugated with the object plane and means for collimating the optical beam arranged between the at least one light source and the microscope objective to form a collimated optical beam, the first reflecting optical means and the second reflective optical means being arranged in series on the optical path of the collimated optical beam. In a particular and advantageous embodiment, the optical beam scanning microscopy apparatus is combined with a Raman spectrometer, a coherent anti-Stokes Raman spectrometer (CARS), a fluorescence spectrometer, a photoluminescence spectrometer, or a spectrometer. cathodoluminescence sensor adapted to measure and analyze a signal by reflection, transmission and / or scattering of the laser beam on the sample during the angular displacement of the laser beam. The invention also provides an optical beam scanning microscopy method comprising the steps of: emitting an optical beam by means of at least one light source; optical reflection of said optical beam on first reflective optical means and second reflective optical means arranged in series on the optical path of the optical beam between said at least one light source and a microscope objective, inclination of said first reflecting optical means according to a first predetermined angle of rotation, inclining said second reflective optical means at a second predetermined angle of rotation in accordance with the first angle of rotation, so as to angularly incline the axis of the optical beam by pivoting about the center of the pupil of the objective microscope, in a range of angles of inclination of the axis of the optical beam with respect to a longitudinal optical axis; and focusing said optical beam in an object plane by means of said microscope objective, so as to move said optical beam in at least one spatial direction in the object plane. Thus, the method of the invention makes it possible to control the position of the scanning optical beam on the center of the pupil of the microscope objective, regardless of the inclination of the optical beam with respect to the optical axis of the microscope. microscope objective. In a particular embodiment, the optical beam scanning microscopy method further comprises the following steps: optically reflecting said optical beam on third reflecting optical means and then on fourth reflecting optical means arranged in series on the optical path of the beam optically between said at least one light source and said microscope objective; inclining said third reflecting optical means to a third predetermined angle of rotation, inclining said fourth reflecting optical means to a fourth predetermined angle of rotation in accordance with the third angle of rotation, so as to angularly incline the axis of the optical beam by pivoting about the center of the pupil of the microscope objective, in a range of angles of inclination of the axis of the optical beam with respect to a longitudinal optical axis; and focusing said optical beam in the object plane by means of said microscope objective, so as to move said optical beam in at least one other spatial direction in the object plane.
[0008] The invention will find a particularly advantageous application in angular displacement laser beam microscopy imaging, so as to scan the surface of a sample to form an image of the sample, for example Raman microspectrometry, photoluminescence, Raman microspectrometry of CARS type (Coherent anti-Stokes Raman scattering), micro-CARS, Raman probe or two-photon microspectrometry. The invention will also find a particularly advantageous application in microscopy, where the displacement of an optical beam, for example a laser beam is carried out in discrete steps in order to point the laser beam at predetermined points of a surface, for example in biochip analysis applications. A discontinuous laser beam scan, in steps, makes it possible to probe samples, for example biological samples (bio-chips), every 100 microns on the same surface, then to perform a measurement and a point analysis (eg Raman spectrometry). or by local scanning of a microsample. In these applications, the invention makes it possible, without displacement of the bio-chip, to explore a larger field and thus to probe a larger number of micro-samples measured, with a greater precision of the displacement steps of the laser beam. The invention will also find applications in microscopy with a continuous scanning of the optical beam. In a particular and advantageous embodiment, the continuous scanning of an optical beam is synchronized with a CCD type detector for example, to quickly transfer the recording of a scanning line to an electronic memory, so as to quickly form an image of the surface of a scanned sample. In another embodiment, called macrospot, the continuous scanning of an optical beam is combined with an integration of the signal detected on a detector, for example of the photomultiplier (PMT) type, so as to average the measurement over a predetermined zone of the sample to be analyzed, and possibly analyze more precisely an area of the sample where a particular signal is detected. The system and method of optical beam scanning microscopy of the invention are compatible with all forms of scanning on the sample along lines, a square, a circle ...
[0009] The present invention also relates to the features which will emerge in the course of the description which follows and which will have to be considered individually or in all their technically possible combinations. This description given by way of nonlimiting example will better understand how the invention can be made with reference to the accompanying drawings in which: - Figures 1-2 show schematically the principle of scanning a laser beam to move the position of a laser beam on a sample or to scan a sample according to the prior art; FIGS. 3 and 4 illustrate vignetting phenomena of the laser scanning beam in a two-axis scanning laser beam scanning microscopy apparatus according to the prior art; FIG. 5 schematically represents the scanning of a laser beam on the objective of a scanning electron microscope according to the invention; FIG. 6 represents a laser beam scanning system according to a first embodiment of the invention; FIG. 7 schematically represents a Raman micro-spectrometry apparatus comprising a device with two scanning axes according to a second embodiment of the invention; FIG. 8 represents an alternative configuration of the mirrors in the second embodiment of the invention; FIG. 9 represents a ray tracing scheme in a two-axis scan system of the mirror system of FIG. 8; FIGS. 10-15 illustrate different mirror configuration variants in a two-axis laser beam scanning system according to the second embodiment of the invention; FIGS. 16-18 illustrate a laser beam scanning system according to two scanning axes according to a third embodiment of the invention; FIGS. 19-22 represent various measurements obtained with a laser scanning microscopy apparatus according to the invention.
[0010] Figures 1-2 show schematically the principle of scanning a laser beam to move the position of a laser beam on a sample or to scan a sample. A microscope objective 1 is disposed on the optical axis 10 of a microscope. A sample 4 is placed on a sample holder 3 at a distance d from the microscope objective 1. A laser source emits a collimated laser beam 2. A planar mirror (not shown) reflects the laser beam towards the microscope objective 1. The microscope objective 1 focuses the laser beam in the focal plane 11 of the microscope objective 1.
[0011] By convention in this document, the optical axis 10 of the microscope objective 1 is parallel to the Z axis of an orthonormal XYZ and the focal plane 11 of the microscope objective 1 is in an XY plane. The axis of the laser beam is defined as the longitudinal optical axis of propagation of the beam. For a Gaussian spatial distribution laser beam, the axis 12 of the laser beam is located in the center of the laser beam. In FIG. 1, the axis 12 of the laser beam 2 is parallel and centered on the axis 10 of the microscope objective 1. The laser beam is focused at the focus XO of the microscope objective.
[0012] In FIG. 2, the axis 12 of the laser beam 2 is inclined angularly, for example by means of a plane mirror disposed in the path of the laser beam 2, this mirror being rotatable so that the laser beam is focused in a second point X1 of the focal plane 11. During the scanning of the laser beam, the laser source (not shown) and the microscope objective are generally fixed, only the mirror being movable in rotation. The axis of rotation of the mirror is for example parallel to the Y axis and generally close to the reflecting surface of the mirror. A rotation of the mirror causes an angular displacement of the laser beam 2. This angular displacement of the laser beam 2 with respect to the optical axis 10 of the microscope objective 1 thus makes it possible to scan or scan the surface of the sample 4 between the points XO and X1, continuously or not stepwise. However, this angular displacement due to the rotation of the mirror produces an off-centering of the axis 12 of the laser beam relative to the center O of the pupil of the microscope objective 1. For an angle of inclination of the upper laser beam 2 at a first threshold value, a vignetting phenomenon is observed, a portion of the laser beam being closed off by the edges of the pupil of the microscope objective. The vignetting phenomenon increases with the angle of inclination of the laser beam, until a complete closure of the laser beam for a second threshold value of inclination angle. The partial and complete shutter thresholds of the laser beam depend on the aperture of the pupil of the objective and the extent of the laser beam. Partial blocking of the beam is observed which progressively reduces the intensity of the excitation laser beam and, by reverse light return, the intensity of the detected Raman beam. It can thus be seen that the vignetting phenomena limit the accessible area by angular displacement of the beam on the sample. In order to limit vignetting in a one-axis scanning system, one possibility is to reduce the diameter of the excitation laser beam. However, a decrease in the diameter of the laser beam produces an increase in the beam diameter at the focal point, which results in a decrease in the spatial resolution of the beam scanning microscope. In a one-scan system, as shown in FIGS. 1-2, the vignetting effects can be reduced by moving the moving mirror closer to the microscope objective 1.
[0013] However, beam scanning microscopy devices are generally not limited to a single scan axis. Thus, most beam scanning microscopy devices combine beam inclinations around two orthogonal axes of rotation to angularly shift the beam over the surface of a sample in two transverse directions. Figures 3-4 schematically show a side view of a microscopy apparatus comprising a two-axis scanning system to illustrate the principle and analyze the limits of the two-axis beam scanning. The same reference signs designate the same elements as in FIGS. The scanning system comprises a first plane mirror MX and a second plane mirror MY arranged in series on the optical path of the laser beam 2. The first mirror MX, equipped for example with a galvanometric motor 15, is rotatable around a first axis, for example parallel to the Y axis, so as to induce an angular displacement of the laser beam 2 along the X axis in the focal plane 11. The second mirror MY, equipped with a galvanometric motor 16, is movable in rotation about a second axis, for example parallel to the axis X, so as to induce an angular displacement of the laser beam 2 along the axis Y in the focal plane 11. The motors 15 and 16 are controlled to perform predetermined rotations and perform a defined shape course on the surface of the sample. In Raman microscopy, the laser scanning beam is also the excitation beam that induces Raman emission by the sample. In the back scattering configuration, the Raman scattering beam is collected in the direction of the incident excitation beam, this transmission-reception direction being fixed. The Raman beam is generally separated from the Raman scattering beam by means of rejection filters, of the notch filter type, the edge filter, or the Bragg grating filter (Volume Bragg Grating or VBG). ). It is known that the very low intensity of Raman signals with respect to Rayleigh scattering requires an excellent signal-to-noise ratio. It is therefore essential to illuminate the sample with a sufficient beam of light intensity and to collect most of the Raman scattering beam. However, the signal-to-noise ratio in scanning Raman microspectrometry seems limited, which leads to increasing the acquisition time to obtain a complete image. In addition, the object field on the sample is also limited to a much smaller field than the nominal field of the microscope objective. In the context of the present invention, the signal-to-noise and sweep-field limits are analyzed as follows.
[0014] As illustrated in FIGS. 3-4, the first mirror MX and the second mirror MY are arranged in series on the optical path of a laser beam 2, between a laser source (not shown) and a microscope objective 1. The axis of the microscope objective is here confused with the optical axis 10 of the microscope. It is assumed that at rest, that is to say with zero inclination angles, the first and second mirrors MX, MY are arranged so that the axis 12 of the laser beam coincides with the axis optical 10 of the microscope objective 1, that is to say that the optical axis of the laser beam is centered and parallel to the optical axis 10 of the microscope objective 1. It seeks to move the laser beam on the sample of a point X0, located at the intersection of the optical axis 10 and the focal plane 11 of the microscope objective 1, towards a point X2, along the axis X. To move the laser beam 2, the galvanometric motor 15 is controlled to induce a DELTA-X angular inclination of the first mirror MX around the Y axis. The incident beam from the source remains stationary. The beam reflected on the surface of the mirror M-X is rotated by an angle equal to 2xDELTA-X around the Y axis. The beam reflected by the first mirror M-X thus moves on the surface of the second mirror M-Y. The second M-Y mirror reflects the laser beam back to the microscope objective. The beam reflected by the second mirror MY moves angularly and laterally on the pupil of the microscope objective 1. The axis of the incident laser beam on the microscope objective is inclined at an angle equal to 2xDELTA-X relative to to the optical axis 10 of the microscope objective 1. The microscope objective 1 thus focuses the laser beam at the point X2, located at the intersection of the focal plane of the microscope objective 1 and a line 22 passing through the center O of the pupil of the lens and parallel to the axis 12 of the collimated laser beam incident on the lens. Similarly, a rotation of the second mirror M-Y of an angle of rotation RY about an axis parallel to the X axis produces an angular displacement of the laser beam equal to 2xDELTA-Y. Thus, the rotation of the second mirror MY produces an angular displacement of the laser beam on the pupil of the lens 1 and a displacement of the focused beam in the Y direction. However, for an angle of inclination DELTA-X greater than a threshold value , it is observed in Figure 3 that a ray 13 of the laser beam, located outside the pupil of the lens, is not focused at the point X2. As a result, the intensity of the incident laser beam on the sample is reduced. This vignetting phenomenon may explain a drop in the signal-to-noise ratio of the points measured on the edges of the field, which correspond to angles of inclination greater than a certain threshold value. For an angle of inclination of the first mirror M-X greater than another threshold value, the laser beam is completely closed by the pupil of the microscope objective. Similar limitations arise from the inclination of a DELTA-Y angle of the laser beam by the second mirror MY on the microscope objective 1. In a similar way to the single-axis scanning system, the two-axis scanning system can thus be limited by vignetting phenomena due to angular displacements of the first axis and / or the second axis on the pupil of the microscope objective. On the other hand, Figure 4 illustrates another vignetting effect of the laser beam in a two-axis scanning system. FIG. 4 shows the laser beam inclined at an angle DELTA-X by means of the first mirror MX and the first galvanometric motor 15. The displacement of the laser beam on the surface of the second mirror MY is such that a beam 14 of the laser beam is outside the pupil of the second mirror MY. The second mirror M-Y can not then reflect the beam 14 towards the microscope objective. This ray 14 is not focused at the point X3 on the sample. By extrapolating the inclination of the laser beam of FIG. 4, it can be seen that the laser beam is completely closed by the pupil of the second mirror MY when the inclination angle DELTA-X is greater than a second threshold value of the angle of inclination. . Depending on the size of the second mirror M-Y, a two-axis scanning system can therefore also be limited by vignetting phenomena due to the angular displacement of the beam relative to the pupil of the second mirror M-Y. Similarly, the angular inclination of the first mirror M-X with respect to the excitation laser beam may produce vignetting phenomena, when the diameter of the laser beam is greater than the apparent diameter of the pupil of the first mirror M-X. It emerges from this analysis that, in a two-axis scanning microscopy apparatus, the displacements of the laser beam in the focal plane along the X axis and / or respectively the Y axis, are thus limited by effects of vignetting due to the pupil of the first mirror MX, the second mirror MY and / or the pupil of the microscope objective. More generally, the displacement of a laser beam by scanning in a microscopy apparatus is limited in transverse field and in intensity by vignetting phenomena due to the optical system formed by the different optical components arranged in series on the optical path of the beam laser. These vignetting phenomena appear in particular due to the scanning mirrors MX, MY and / or to the microscope objective 1. However, in a system with two scanning axes, the size of the two reference mirrors MX, MY disposed in series on the optical path of the laser beam, does not effectively reduce the distance between the first mirror and the microscope objective, so that vignetting effects remain important. It follows from the present analysis that the main problem, when using a two-axis beam scanning Raman microscope, is at the pupil at the entrance to the microscope objective 1, as illustrated in connection with Figures 3 and 4.
[0015] Part 13 of the beam arriving on the pupil of the microscope objective does not pass through the opening of the objective because this part 13 of the beam is moved beyond the physical limit of the pupil (Fig.3). Part of the excitation laser beam is thus lost. In a Raman backscattering measurement configuration, by applying the reverse-return of light, a portion of the backscattered beam is also occluded by the pupil of the microscope objective. The intensity reduction of the excitation laser beam and the Raman scattering beam induces a reduction in intensity of the detected Raman scattering signal. On the other hand, another part 14 of the beam reflected by the first mirror M-X is deflected outside the pupil of the second mirror and is not reflected towards the microscope objective. Likewise, part of the Raman backscattering beam is closed off by the edges of the second M-Y mirror.
[0016] This other part of the excitation laser beam 14 and the corresponding backscattered beam also induces a reduction in the detected Raman scattering signal. On the other hand, the beams 13 and 14 which are not reflected in the direction of the sample, can be reflected on other surfaces and thus be at the source of parasitic beams which also contribute to reducing the signal-to-noise ratio of the signal Raman scattering detected. We will now describe the principle of the solution proposed in the context of the present invention in connection with Figure 5. In this figure, the angular inclination of the laser beam is effected by pivoting the axis of the laser beam around the center. O of the entrance pupil of the microscope objective 1. Thus, the laser beam remains centered on the pupil of the microscope objective during the scanning of the beam. This angular inclination makes it possible to reduce the vignetting phenomena in order to limit the intensity losses on the incident laser beam and to increase the area of field accessible by beam scanning. This displacement is obtained by the implementation of two mirrors for each scanning axis, the two mirrors being arranged in series on the optical path of the optical beam 2.
[0017] For example, the first mirror M-X1 is inclined angularly so as to induce an X-ray scan in the focal plane and the second mirror M-X2 is inclined angularly along the same X-ray axis so as to refocus the beam on the pupil of the microscope objective 1. The displacement X of the beam in the focal plane on the sample for an inclination angle θ of the axis 12 of the bundle with respect to the optical axis 10 of the objective microscope is calculated by the following formula: X = f. tan (0) (I) From the following table, we deduce the X displacement of the beam as a function of the angle of inclination for different microscope objectives: O (degrees) 100X 50X 10X 1 31pm 62pm 314pm 1,5 47pm 94pm 471pm 2 63pm 125pm 628pm 2.5 78pm 157pm 785pm 3 94pm 189pm 943pm Table 2: Displacement as a function of the angle of inclination of the beam on the objective Table 1 indicates, for a 10X objective, a width of field maximum optic of 2.2 mm which corresponds to a half-width of field or to a lateral displacement of beam X of 1,1mm. In Table 2, it can be seen that an inclination angle θ of 3 degrees of the axis of the beam centered on the axis of this objective 10X makes it possible to cover a field width of 2 × 943 microns, ie about 1886 microns, c that is, to reach almost the limit of the optical field width. Or an angle of inclination of the axis of a beam of 3 degrees can be obtained by reflection on a mirror and rotation of the mirror by an angle of 1.5 degrees. FIGS. 6 to 18 illustrate different embodiments that make it possible to obtain a beam scan along one or two axes by pivoting the laser beam around the center O of the entrance pupil of the microscope objective, while retaining the centering of the laser beam on the center O of the entrance pupil of the microscope objective. FIG. 6 represents a system with a laser beam scanning axis according to a first embodiment of the invention. The scanning system comprises a first plane mirror M-X1 and a second plane mirror M-X2. The first mirror M-X1 and the second mirror M-X2 are arranged in series on the optical path of the laser beam 2 between the source of the laser beam and the microscope objective 1, for example in the confocal tube of a confocal microscope. The first mirror M-X1 is rotatable about an axis, for example parallel to the Y axis. The second mirror M-X2 is rotatable about an axis which is preferably parallel to the axis of rotation of the first mirror M-X1 and therefore parallel to the axis Y. Advantageously, a first motor 21 controls the rotation of the first mirror M-X1 and a second motor 22 controls the rotation of the second mirror M-X2. The motors 21, 22 are for example galvanometric motors or motors step by step. Preferably, a control system (not shown) controls the combined angular displacements of the first mirror M-X1 and the second mirror M-X2.
[0018] Illustratively and in no way limiting, there is shown in Figure 6 different angles of inclination of the first mirror M-X1 and the second mirror M-X2. In a first orientation of the mirrors of the scanning system, the first mirror M-X1 has an inclination angle RX1-0 and the second mirror M-X2 has an inclination angle RX2-0. In this first orientation of the mirrors, the incident laser beam 2 is reflected on the first mirror M-X1 in the direction 120 and then on the second mirror M-X2 in the direction 200. The angles of inclination RX1-0 of the first mirror M X1 and RX2-0 of the second mirror are such that the laser beam in the direction 200 is aligned with the optical axis 10 of the microscope objective 1 and centered on the center O of the entrance pupil of the objective 1. In this first configuration, the microscope objective focuses the laser beam at the focal point X0-0. By inverse return, the beam backscattered by the point X00 propagates along the axis 200, is reflected by the second mirror M-X2 and then by the first mirror M-X1 in the direction of the incident laser beam 2. In a second orientation of the mirrors shown in Figure 6, the first mirror M-X1 has a tilt angle RX1-1 and the second mirror M-X2 a tilt angle RX2-1. In this second orientation of the mirrors, the incident laser beam of axis 12 is reflected on the first mirror M-X1 in the direction 121 and then on the second mirror M-X2 in the direction 211. The angles of inclination RX1-1 of the first mirror M-X1 and RX2-1 of the second mirror are such that the laser beam in the direction 211 is inclined with respect to the optical axis of the microscope objective 1 while remaining centered on the center O of the pupil 1. Advantageously, the first mirror M-X1 produces an inclination of the beam axis and the second mirror M-X2 centers the inclined axis of the beam 211 on the center of the pupil of the microscope. 'goal. In this second configuration, the microscope objective 1 focuses the laser beam at point X11. This results in an angular displacement of the beam axis from point X00 to point X11 on the sample. By inverse return, the beam backscattered by the point X11 propagates in the direction 211 is reflected successively by the mirror M-X2 in the direction 121, then by the mirror M-X1 in the direction of the incident beam 2. Similarly, in a third orientation of the mirrors shown in Figure 6, the first mirror M-X1 has an angle of rotation RX1-2 and the second mirror M-X2 a rotation angle RX2-2. In this third orientation of the mirrors, the incident laser beam 2 is reflected on the first mirror M-X1 in the direction 122 and then on the second mirror M-X2 in the direction 222. The angles of inclination RX1-2 of the first mirror M X1 and RX2-2 of the second mirror are such that the laser beam in the direction 222 is inclined with respect to the optical axis of the microscope objective 1 while remaining centered on the center O of the entrance pupil of the microscope objective 1. Thus, the first mirror M-X1 produces an inclination of the beam axis and the second mirror M-X2 centers the inclined axis of the beam 222 on the center of the pupil of the objective. In this third configuration, the microscope objective 1 focuses the laser beam at point X22. This results in an angular displacement of the beam axis to point X22 on the sample. By inverse return, the beam backscattered by the point X22 propagating in the direction 222 is reflected successively by the mirror M-X2 in the direction 122, then by the mirror M-X1 in the direction of the incident beam 2. The combination of an angle of rotation of the first mirror M-X1 and a rotation angle of the second mirror M-X2 thus makes it possible to obtain an angular offset of the beam which remains centered on the center O of the pupil of the microscope objective.
[0019] The inclination angle θ of the axis 211 of the beam with respect to the optical axis 10 is equal to twice the rotation angle RX2 of the second mirror M-X2. In order to calculate the angle of rotation of the mirror M-X2 as a function of the inclination of the mirror M-X1, we use the following equation: RX2 = ((ArcSIN (-B x SIN (2 x RX1) / A) - 2 x RX1 + rr / 2) / 2 - rr / 4 (II) Where: RX1 represents the angle of rotation of the mirror M-X1 (in radians), RX2 represents the angle of rotation of the mirror M-X2 ( in radians) At the convergence distance of the rays (in mm), or focal length of the lens 1, and B the distance between the mirrors M-X1 and M-X2 (in mm).
[0020] In the particular case where the angles RX1, RX2 are small (in practice less than about a few degrees), it is shown that there is a linear relationship between the movement of the two mirrors. In this case, the electronic system for controlling the rotation of the mirrors is also a linear system and therefore simple.
[0021] Finally, in the particular case where B is equal to A, the ratio of the angles of rotation between the mirror M-X1 and the mirror M-X2 is equal to 2, regardless of the angle of inclination O. electronic system may be configured to jointly control the rotation angle RX1 of the first mirror M-X1 and the rotation angle RX2 of the second mirror M-X2, in order to obtain the centering of the axis of the inclined beam on the axis of the microscope objective. The electronic system is adapted according to the configuration of the M-X1 and M-X2 mirrors and the distances A and B. As indicated in Table 2, an inclination angle θ of the axis 12 of the limited laser scanning beam a few degrees is enough to move the beam angularly over the entire optical field of the most common objectives. However, as indicated above, the rotation angle RX2 of the second mirror is equal to half the angle of inclination 0 of the beam. And the rotation angle RX1 of the first mirror is equal in absolute value to twice the rotation angle RX2 (application of the approximate formula (III) above). The angles of rotation of the first and second mirrors are therefore limited to a few degrees to cover the entire optical field of the microscope objective while remaining centered on the pupil of the microscope objective. However, a low angle of rotation of the first mirror makes it possible to limit the amplitude of displacement of the beam on the face of the second mirror and thus to limit the vignetting effect. It is observed that the size of the mirrors M-X1 and M-X2 may be different. Preferably, the second mirror M-X2 is larger than the first mirror M-X1. Indeed, the first mirror M-X1 is centered on incident laser beam which remains fixed direction while the second mirror M-X2 compensates for the displacement of the laser beam on its surface during the rotation of the first mirror M-X1. The principle detailed in Figure 6 for an axis of angular displacement (X) of the beam is generalized to a scanning system along two axes (XY). For this, for example, a first optical system with two mirrors movable in rotation, for example around a Y axis to produce a displacement in a first direction X (as detailed in FIG. 6) and a second optical system similar to two mirrors movable in rotation, for example around an axis X to produce a displacement in a transverse direction Y. The four mirrors are arranged in such a way that the angular displacement of the beam by the the first two mirrors remain centered on the entrance pupil of the second optical system with two mirrors, and in such a way that an angular displacement along one or the other or both transverse axes remains centered on the center O of the entrance pupil of the microscope objective. Preferably, the microscope is of the confocal type and the beam scanning system is advantageously arranged on the common laser-detection path, and more precisely between the injection-rejection filter 18 and the objective 1 of the microscope. Alternatively, in a less advantageous non-confocal microscope, the beam scanning system is disposed on the laser path only.
[0022] FIG. 7 shows a side view of a microscopy apparatus comprising a laser beam scanning device according to two scanning axes according to a second embodiment of the invention. The laser beam scanning apparatus comprises a laser source 20, a filter wheel 30, a mirror optical system 32 in the path of the laser beam, a beam expander 31, an injection-rejection filter 18. The laser source 2 emits a laser beam 2, comprising one or more wavelengths. Advantageously, the filter wheel 30 makes it possible to select a particular wavelength for the excitation beam. The microscope also has a microscope objective 1 having a center entrance pupil O. A sample holder 3 supports a sample 4 disposed in the focal plane of the objective 1. Advantageously, the apparatus of FIG. Microscopy comprises a focusing lens 33 and a confocal hole 34 disposed in a plane optically conjugated with the focal plane of the microscope objective 1. The apparatus of FIG. 7 comprises a spectrometer 35, a detector 36 and another optical system with mirrors 38 on the path of the Raman scattering beam. Finally, the apparatus of FIG. 7 comprises an optical system 19 and a display camera 9. The apparatus of FIG. 7 applies in particular to Raman microspectrometry. More particularly, the microscopy apparatus comprises an optical device 29 of angular displacement or scanning of the laser beam. This optical beam scanning device 29 is placed between the injection-rejection filter 18 and the microscope objective 1.
[0023] The optical scanning system of the beam 29 with two scanning axes (X, Y) comprises a plane mirror M-Y1, a plane mirror M-X1, a plane mirror M-Y2 and a plane mirror M-X2 arranged in series on the optical path of the laser beam 2. The mirrors M-X1, M-X2, M-Y1 and M-Y2 are respectively actuated by actuators 21, 22, 23 and 24. As described in detail above, the movements of rotation of the mirrors M-X1 and M-X2 about an axis parallel to the axis Y make it possible to angularly move the axis of the laser beam by rotation around an axis parallel to the axis Y and passing through the center O of the pupil of the objective. Similarly, the combined rotational movements of the mirrors M-Y1 and M-Y2 about an axis parallel to the axis X make it possible to angularly move the axis of the laser beam by rotation around an axis parallel to the axis X axis and passing through the center O of the pupil of the microscope objective. Thus, the mirror optical system M-X1, M-X2, M-Y1, M-Y2 makes it possible to angularly move the laser beam in one or two transverse directions over a larger surface of the sample without vignetting the laser beam. staying centered on the pupil of the microscope objective. In FIG. 7, a beam expander 31 is used as an example. A beam expander is an optical system for multiplying the size of an optical beam. For example, a beam expander is formed of an afocal optical system of magnification greater than 1. Two beam expanderers arranged in series on the optical path of the source beam, upstream of the optical scanning system 29, may also be used. the following notions of optics: Vf 2 + D2 / 4 2) When a laser enters a microscope objective 1, it focuses at a point at the distance to the focus. The size of this point may depend on three factors: the size of the laser beam, the diameter of the lens of the lens and its numerical aperture (NA). In the case where the laser beam can cover the entire aperture of the lens, ie when the diameter of the beam is greater than or equal to the diameter of the lens, the size of the beam at the focal point depends only on the diameter of the lens and its numerical aperture (NA). In this case, the minimum diameter of the focal spot is defined by the formula of Airy as being equal to: (0.51 * A) / NA (IV) By applying formula (IV), in the case where the laser beam diameter is greater than or equal to the diameter of the lens, the larger the diameter of the lens, the smaller the focal spot. In the case where the diameter of the laser beam is smaller than the diameter of the lens, the larger the diameter of the laser beam, the smaller the focal spot, with the formula (IV) as the limit. The formula (IV) can also be applied by considering that the effective diameter of the lens is defined by the diameter of the laser beam.
[0024] The effect of a beam expander 31 is to enlarge the diameter of the laser beam on the entrance pupil of the objective. The size of the beam in the focal plane of the lens is determined by applying the limit by diffraction. Therefore, the larger the diameter of the collimated laser beam on the objective entrance pupil, the smaller the beam size in the focal plane. The use of a beam expander thus makes it possible to increase the spatial resolution of the microscopy apparatus and the signal-to-noise ratio of the Raman signal for a confocal microscope. Indeed, the smaller the spot of Airy, the more light can be coupled in a small confocal hole. In microscopic resolution imaging applications, it is possible to do imaging faster. The magnification of the beam expander is selected to increase the diameter of the laser beam so that the diameter at 1 / e 2 of the laser beam reaches the diameter of the pupil of the microscope objective used, which corresponds to a compromise between spatial resolution and signal on noise. Advantageously, different types of beam expander are used: a fixed magnification beam expander and a variable magnification beam expander. For example, two expanders being arranged in series on the path of the incident beam 2, the first beam expander has a fixed magnification equal to x2 and the second variable magnification beam expander has a variable magnification of x1 to x4.5. 1) the numerical aperture (NA) of an objective, for example a microscope, depends on the diameter of its lens and the distance to the focus according to the following formula: nDI2 NA = n.sin (0) - (III) By For example, a 10X lens has a diameter of 9mm, a 50X lens has a diameter of 5.4mm, and a 100X lens has a diameter of 3.24mm. A variable magnification beam expander adjusts the diameter of the laser beam according to the diameter of the pupil of the microscope objective used, in a microscope with several microscope objectives. Advantageously, the variable magnification beam expander is of the achromatic type in the visible range (400-700nm). Preferably, the variable magnification beam expander 31 is motorized. Advantageously, a self-alignment mirror, arranged on the optical path just after the beam expander, makes it possible to correct the pointing error of a variable magnification beam expander. The diameter of the laser beam emitted by the laser source can be measured, for example by means of a camera of the Gentec brand "Laser Beam Imager" and its processing software. The transverse dimensions of the laser beam are measured by the so-called 4 Sigma method, without the beam expander: 1183 μm along the X axis and 1261 μm along the Y axis.
[0025] The diameter of the laser beam at the output of the variable magnification beam expander is then measured by the same method, the magnification being adjusted to the maximum (X4.5) according to the data of the manufacturer. The transverse dimensions of the laser beam at the exit of the beam expander are measured: 5494 μm along the X axis and 5346 μm along the Y axis. These measurements correspond to an average multiplication of 4.44 times, which is consistent with the value indicated by the manufacturer, which is 4.5. The use of a beam expander is particularly easy in a confocal type microscopy apparatus, where the beam expander 31 can be inserted directly into the confocal tube of the microscope without further optical adaptation, the beam expander being disposed on the laser path only or on the common Raman laser-signal path.
[0026] The combination of a beam expander 31 and a beam scanning system 29 by pivoting about the center of the pupil of the microscope objective makes it possible to benefit from the combined advantages to increase the width of the angular displacement zone of the microscope objective. beam on the sample while increasing the spatial resolution of the laser beam at the focal point. This combination thus makes it possible to solve the two main limitations of the laser beam scanning system of the prior art. A laser beam scanning microscopy apparatus according to any embodiment is advantageously used in an application to Raman microspectrometry. In this application, the angular beam displacement system is arranged on the optical path of the excitation laser beam, preferably between an injection-rejection filter and the microscope objective. On the excitation beam, the injection-rejection filter 18 directs the incident laser beam 2 towards the mirror scanning system 29 towards the microscope objective 1. The mirror scanning system 29, for example M- X1, M-Y1, M-X2, M-Y2, makes it possible to angularly move the laser beam on the sample 4 along one or two scan axes. In a backscattering configuration, the microscope objective 1 collects the backscattered beam that has Rayleigh scattering at the wavelength of the incident laser beam, and the Raman scattering beam, which is wavelength shifted. The beam collected by the microscope objective 1 is transmitted to the mirror scanning system 29 (M-X1, M-Y1, M-X2, M-Y2), then to the injection-rejection filter 18. By construction, the backscattering beam follows the reverse optical path of the incident laser beam and thus emerges from the mirror scanning system exactly in the direction of the incident laser beam, this direction remaining fixed regardless of the angle of inclination of the scanning beam on the laser beam. microscope objective. Advantageously, the injection-rejection filter 18 spatially separates the Rayleigh scattering beam from the Raman scattering beam. An optical mirror system 38 then directs the Raman scattering beam to a Raman spectrometer 35 which spectrally separates the Raman scattering beam in the direction of a detector 36 to detect and analyze the Raman backscattering signal. This Raman microspectrometry apparatus enables the analysis of a larger sample surface, while improving the signal-to-noise ratio and the spatial resolution of the laser excitation beam on the sample. In the apparatus of FIG. 7 which comprises an injection-rejection filter 18 (of the notch, edge, beam splitter or epifluorescence filter type) and a confocal hole 34, the scanning mirrors are arranged on the confocal path which makes it possible to remain in a confocal microscope configuration. Another beam expander can be inserted on the confocal path to fully cover the objective pupil. The apparatus of FIG. 7 further comprises a camera 9, provided with a focusing lens 19. A beam splitter 8, for example a splitter cube, is disposed on the optical path of the laser beam between the optical mirror system 29 and the microscope objective 1. This beam splitter 8 makes it possible to direct a beam 7 formed by reflection and / or diffusion on the sample 4 towards the camera so as to form an image of the surface of the sample and / or the laser beam. Advantageously, the apparatus also comprises a white light source (not shown), the white light beam being inserted on the optical axis of the microscope, for example between the beam splitter 8 and the objective of the microscope 1, in order to illuminate the object field of the sample 4 in white light. This illumination in white light makes it possible, by reflection and / or diffusion, to better visualize the sample 4 via the camera 9. In this way, the camera 9 makes it possible to simultaneously view the sample and the position of the laser beam during its angular displacement in the optical field of the camera. Advantageously, the magnification of the lens of the camera is selected so as to allow viewing of the entire angular displacement zone of the laser beam and / or the entire optical field of the microscope objective. In a variant, the lens of the camera is a lens of variable focus. FIG. 8 is a top view of a two-axis beam scanning optical system according to a first variant of the second embodiment of the invention. In this variant, the incident laser beam 2 is directed and reflected successively by the first mirror M-X1, the second mirror M-X2, the third mirror M-Y1 and the fourth mirror M-Y2, the axis of the beam reflected by the fourth mirror M-Y2 being perpendicular to the plane of FIG. 8. FIG. 9 represents, by a ray tracing scheme, the optical system with two scanning axes of FIG. 8. This arrangement of mirrors makes it possible, starting from a horizontal source laser beam, to form a scanning laser beam having an axis 12 close to the axis 10 of the microscope objective 1, this optical axis 10 being generally vertical. The advantage of this variant is to be very compact and avoid the addition of an additional mirror return plane. Figures 10 and 11 illustrate respectively in top view and in side view a second mirror configuration variant in a two-axis laser beam scanning system according to the second embodiment of the invention. In this variant, the incident laser beam 2 is reflected successively by the plane mirror M-X1, the plane mirror M-Y1, the plane mirror M-X2 and the plane mirror M-Y2. The angle of incidence of the laser beam 2 on the first mirror M-X1 is chosen to be less than about 45 degrees and preferably less than 22.5 degrees relative to the normal surface of the mirror M-X1 . Advantageously, the angles of incidence on the other mirrors M-Y1, M-X2 and M-Y2 are also chosen to be as small as possible, so as to increase the apparent surface of the mirrors. In addition, limiting the angle of incidence makes it possible to reduce the apparent diameter or the spread of the laser beam on each of the mirrors M-X1, M-Y1, M-X2 and M-Y2. This variant thus makes it possible to use an incident laser beam 2 of larger diameter, which makes it possible in particular to improve the spatial resolution of the scanning microscope. This closed-angle variant also reduces the effect of anamorphosis due to the inclination of the mirror. Indeed, a 45-degree inclined mirror scanning angularly symmetrically along the two axes produces a rectangular figure of square root ratio of 2 between the two axes. This applies in particular to two-axis mirrors with voice coil type actuator. Figures 12 and 13 respectively illustrate in top view and in side view a third configuration variant of the mirrors in a two-axis laser beam scanning system according to the second embodiment of the invention. In this variant, the incident laser beam 2 is reflected successively by the plane mirror M-X1, the plane mirror M-Y1, the plane mirror M-X2 and the plane mirror M-Y2, the axis 12 of the scanning beam being located in a direction generally parallel to the direction of the incident beam 2. This variant makes it possible to fold the laser scanning beam and thus reduce the bulk of the beam scanning optical system.
[0027] Figures 14 and 15 respectively show in top view and in side view a fourth configuration variant of the mirrors in a two-axis laser beam scanning system according to the second embodiment of the invention. In this variant, the incident laser beam 2 is reflected successively by the plane mirror M-X1, the plane mirror M-Y1, the plane mirror M-X2, the plane mirror M-Y2 and a plane mirror 5 to direct the beam to the microscope objective 1. This variant allows both a space saving by folding of the laser scanning beam and a reduction of the angle of incidence of the beam on the mirrors which reduces the spreading and / or to increase the diameter of the laser beam. Figures 16 to 18 show a laser beam scanning system along two scanning axes according to a third embodiment of the invention. Figure 16 is a top view, Figure 17 is a side view of a first variant of the third embodiment. Figure 18 is a perspective view of a second variant of the third embodiment. In this embodiment, a first plane mirror M-XY1 and a second plane mirror M-XY2 are used. The first mirror M-XY1 is mounted on an actuator 25 with two axes of rotation, for example of the piezoelectric type or a voice coil (Moving coil or Voice Coil). Thus, the first actuator 25 makes it possible to rotate about an axis X and / or about a axis Y. Similarly, the second plane mirror M-XY2 is mounted on an actuator 26 with two axes of rotation, for example of piezoelectric type or an acoustic coil, the actuator 26 for rotating about an axis X and / or about a Y axis. The rotational movements around each axis are combined between the first actuator and the second actuator so that the beam reflected on the two mirrors M-XY1 and M-XY2 pivots about a point aligned with the center O of the pupil of the microscope objective. This configuration makes it possible to reduce the number of mirrors to only two mirrors, instead of four as in the embodiments described above. The reduction in the number of mirrors makes it possible to bring more laser light to the sample and to collect more scattered Raman light, thus obtaining an image more quickly. In addition, this third embodiment makes it possible to use mirrors of larger size, which allows angular displacement of the laser beam of greater amplitude and better spatial resolution in X, Y and / or Z. Finally, this third embodiment makes it possible to use thicker mirrors, for example dielectric mirrors, which have a better efficiency. By comparison, in an earlier beam scanning system, duoscan said, in which the mirrors are small, and are mounted so as to be removable to allow to collect more Raman flow and not vignette the field of the camera of visualization. On the contrary, with the system of the invention, the mirrors do not limit the collection of the Raman signal or the image field of the display camera, and do not need to be mounted on removable media. The assembly is thus simplified. In the first variant illustrated in FIGS. 16-17, the axis of the incident laser beam 2 is generally parallel to the axis 12 of the laser scanning beam at the output of the mirror optical system. In the second variant illustrated in FIG. 18, the axis of the incident laser beam 2 is generally transverse to the axis 12 of the laser scanning beam at the output of the optical mirror system.
[0028] An advantage of this third embodiment is to reduce the number of mirrors used to two instead of four in the previous embodiments, which reduces the intensity losses on the laser scanning beam and on the collected signal. This results in the possibility of using mirrors M-XY1 and M-XY2 larger than the mirrors M-X1, M-X2, M-Y1 and M-Y2 used in the embodiments described with reference to FIGS. -15. Another advantage of this third embodiment is to have an extremely small footprint. Particularly advantageously, the mirrors M-X1, M-Y1, M-X2, M-Y2, M-XY1 and M-XY2 are of dielectric type, the dielectric treatment being adapted to increase the efficiency in reflection. Preferably, the dielectric mirrors are broadband spectral (eg 325nm -1100nm, or 325-1700, or 325-2200nm), which allows to use the same mirrors for the entire spectrum of ultraviolet (UV) near infrared (NIR). The system and method of scanning a laser beam can be combined with different components to provide additional benefits.
[0029] However, at high scanning speed (of the order of 30 Hz for a voice coil actuator or scanner), the different scanners can undergo an unmaintained phase shift, the re-centering on the center O of the pupil of the lens does not work. more and the laser scan is then irregular, vignette. One way to correct this defect while operating at a higher scanning speed (ie up to a few hundred Hz) is to set up a phase locked loop using the signals from the position sensors of the first mirror (for example M -X1 or M-XY1) generally supplied with each scanner, in order to slave the phase of the control signal of the second mirror (M-X2 or M-XY2), and this for each scanning axis. Particularly advantageously, the Raman scattering signal is integrated on several measurement points during the angular displacement of the beam, so as to record a Raman signal averaged over several points, as described in patent document W0002008128971A2. The use of the one- or two-axis scanning according to one embodiment of the present invention makes it possible to extend the scanning area over the sample and / or to increase the spatial resolution of the Raman microspectrometry measurements and / or the increase the signal-to-noise ratio of Raman microspectrometry measurements. In the case where a beam expander is used in a laser beam scanning Raman microspectrometry apparatus, the beam expander is disposed in the path of the excitation laser beam, but outside the optical path of the Raman scattering beam. . Advantageously, the beam expander is disposed between the laser source and a separating filter, for example of the injection-rejection filter or notch filter type. The beam scanning system is compatible with different microscope objectives. In particular, it is possible to use a mirror microscope objective, for example a Cassegrain or Schwartzfield type lens. A mirror lens has the advantage of being achromatic, which allows better spectrometry measurements. It is thus easier to separate an excitation laser beam and a Raman scattering beam. On the other hand, in microscopy, the achomatism of the microscope objective provides axial detection at the same point as the laser excitation, which is important especially in the case of a transparent sample.
[0030] The two-axis scan makes it possible to better couple the laser light to a Cassegrain-type lens because it is possible to illuminate the edge of the primary mirror and not the center. Indeed, the laser rays passing in the center of the primary mirror are retroreflected and do not reach the sample to be analyzed, resulting in significant losses. The present invention therefore advantageously makes it possible to bring more laser light to the sample by using a Cassegrain or Schwartzfield type lens. The scanning device of the invention can also be advantageously combined with a conical lens system, as described for example in WO / 2013 / 014379A, to form a conical or cylindrical laser beam. Preferably, the opening of the conical or cylindrical beam is sufficient to cover the pupil of the objective and thus allow the intensity of the output beam to be increased. This device can also replace a conical lens system, as described in document FR1156687, to form with rapid scanning a hollow cylindrical laser beam of arbitrary section (for example annular or otherwise) which presents little or no of light on the axis of the cylinder. This has the advantage, in particular, of suppressing the central rays and of illuminating the sample only with out-of-axis inclined rays. This type of lighting greatly reduces the contribution of the substrate to the confocal Raman signal. This type of illumination also makes it possible to greatly reduce the optical aberration termed longitudinal spherical aberration, which appears during refraction in a medium of index and which induces a degradation of the spatial resolution of a confocal microscope.
[0031] FIGS. 19-22 show different scanning width measurements obtained with a laser scanning microscope apparatus according to the embodiment described with reference to FIG. 7. In place of the sample 4, a calibration pattern certified by FIG. United Kingdom Accreditation Service (UKAS) in accordance with the requirements of the National Institute of Standards and Technology (NIST). This pattern has a scale of 20mm along with graduations spaced 0.01mm. The test pattern makes it possible to measure the maximum displacement of the beam in the focal plane of the microscope objective during a scan along an axis parallel to the axis of the test pattern.
[0032] To measure the area of displacement in a two-axis scanning microscope, the maximum displacement is measured successively by orienting the pattern along the X axis and then along the Y axis. Figure 19 shows a measurement of the scale pattern. on a beam scanning microscopy apparatus equipped with a 10X microscope objective during a scan along an axis parallel to the X axis, the pattern being oriented parallel to the X axis. More precisely, the curve 50 represents measuring the intensity of the signal reflected at the wavelength of the laser according to an angular displacement of the beam along the X axis on the pattern. The local maxima surrounded 40, 41, ... 49 in FIG. 19 correspond to a reflection of the laser on a bar of the scale of the chart. It is observed that the maxima 40, 41, ... 49 are spaced by 50pm. The scan width of the beam on the X-axis pattern corresponds to the distance between the first maximum 40 and the last maximum 49, about 450 microns. In addition, the average level of the curve 50 is representative of the homogeneity of the optical system. The higher the average level, the better the measure.
[0033] FIG. 20 illustrates a measurement of the same pattern on the same microscope with the same 10X microscope objective when scanning along an axis parallel to the Y axis, the pattern being oriented parallel to the Y axis. The curve 150 represents the measurement of the intensity of the signal reflected at the wavelength of the laser following an angular displacement of the beam along the Y axis on the test pattern. The local maxima surrounded 140, 141, ... 149 in FIG. 20 correspond to a reflection of the laser on a bar of the scale of the chart. We check that the maxima 140, 141, ... 149 are spaced by 50pm. The scan width of the beam on the pattern along the Y axis corresponds to the distance between the first maximum 140 and the last maximum 149, ie about 450 microns. Screen shots on a viewing camera confirm that the scan width along the X axis is approximately 460pm and the sweep width along the Y axis is approximately 470pm. Compared with a scan width of about 200 microns obtained with a prior art Duoscan apparatus equipped with a 10X objective, the scanning system of the invention thus makes it possible to increase the field width by a factor of about 2.2 times higher in each direction X, Y, and therefore to increase the scanned area by a factor of about 4.9. FIG. 21 illustrates a measurement of the same scale pattern on a beam scanning microscope apparatus equipped with a 50X microscope objective when scanning along an axis parallel to the X axis, the pattern being oriented parallel to The local maxima surrounded 240, 241, ... 248 on the curve 250 of Figure 21 correspond to a reflection of the laser on a bar of the scale of the test pattern. It is observed that the maxima 241, ... 248 are spaced by about 10 μm. The scan width of the beam on the X-axis pattern corresponds to the distance between the first maximum 241 and the last maximum 248, about 70 microns. FIG. 22 illustrates a measurement of the same pattern on the same microscope with the same 50X microscope objective when scanning along an axis parallel to the Y axis, the pattern being oriented parallel to the Y axis. 341, 342 ... 348 surrounded premises on the curve 350 of Figure 22 correspond to a reflection of the laser on a bar of the scale of the staff. It is observed that the maxima 341, 342 ... 348 are spaced by about 10 μm. The scan width of the beam on the Y-axis pattern corresponds to the distance between the first maximum 341 and the last maximum 348, about 70 microns. Screen shots on a viewing camera confirm that the scan width with the 50X lens along the X axis is about 70pm and the sweep width along the Y axis about 70pm. Compared with a scanning width obtained with a prior art Duoscan device equipped with a 50X objective, the scanning system of the invention therefore makes it possible to increase the field width by a factor of about 2.7 times higher in each direction X, Y, and therefore increase the scanned area by a factor of about 7.6.
[0034] Alternatively, instead of a one-dimensional scale pattern, a two-dimensional plane pattern consisting of 0.5 * 0.5mm squares, themselves composed of 0.01 * 0.01mm squares, is used. This square pattern is used to form an image of the reflection-scanned surface. The image makes it possible to visualize the squares of the pattern and to observe the scanning of the laser beam on the pattern. Advantageously, the square pattern is illuminated in white light to allow an image to be made regardless of the position of the laser beam. With a 10X objective, it is estimated that the extent of the beam displacement is about 440pm * 450pm. A darkening of the image on the edges of the scan is due to vignetting on the edges of the mirrors mounted on the scanners, the intensity of the beam decreasing when the beam reaches the edge of a mirror or the edge of the pupil of the goal.
[0035] For a 50X objective, it is observed with the square pattern that the usable scanning area is about 80 * 75pm.

权利要求:
Claims (15)
[0001]
REVENDICATIONS1. An optical beam scanning microscope apparatus comprising: - at least one light source (20) adapted to emit an optical beam (2); a microscope objective (1) having an entrance pupil, the microscope objective (1) being arranged along a longitudinal optical axis (10) of the microscopy apparatus, the pupil having a center (0) on the microscope longitudinal optical axis (10) and the microscope objective (1) being adapted to focus said optical beam (2) in an object plane (11) transverse to the longitudinal optical axis (10); means for angular displacement of the optical beam (2) in at least one spatial direction (X, Y) in the object plane (11); characterized in that said means for angular displacement of the optical beam (2) comprise: - first reflecting optical means (M-X1, M-XY1) and second reflecting optical means (M-X2, M-XY2) arranged in series in the optical path of the optical beam (2) between the light source (20) and the microscope objective (1), - first angular inclination means (21, 25) adapted to incline said first reflecting optical means ( M-X1, M-XY1) at a first predetermined angle of rotation (RX1), and - second angular inclination means (22, 26) adapted to incline said second reflecting optical means (M-X2, M-XY2) at a second predetermined angle of rotation (RX2) according to said first angle of rotation (RX1), so as to angularly incline the axis (12) of the optical beam (2) by pivoting about the center (0) of the pupil of the microscope objective (1), said beam opti that (2) remaining centered on the center (0) of the pupil of the microscope objective (1) in a range of angles of inclination of the axis (12) of the optical beam (2) with respect to the longitudinal optical axis (10), so as to move the optical beam along said at least one direction (X) in the object plane (11).
[0002]
An optical beam scanning microscopy apparatus according to claim 1 wherein said means for angularly displacing the optical beam (2) further comprises: - third reflective optical means (M-Y1, M-XY1) and fourth means reflective optics (M-Y2, M-XY2) arranged in series on the optical path of the optical beam (2) between the light source and the microscope objective (1), - third angular inclination means (23, 25) adapted to incline said third reflective optical means (M-Y1, M-XY1) to a third predetermined angle of rotation (RY3), and - fourth angular inclination means (24, 26) adapted to incline said fourth means reflective optics (M-Y2, M-XY2) at a fourth rotation angle (RY4) predetermined according to said third rotation angle (RY3) so as to angularly incline the axis (12) of the optical beam (2) by pivot around the center (0) of the pupil of the microscope objective (1), said optical beam (2) remaining centered on the center (0) of the pupil of the microscope objective (1) in a range of angles of inclination of the axis (12) of the optical beam (2) with respect to the longitudinal optical axis (10) so as to move the optical beam in another direction (Y) in the object plane (11) .
[0003]
Optical beam scanning microscopy apparatus according to one of Claims 1 to 2, in which the first reflecting optical means (M-XY1) and the third reflecting optical means (M-XY1) are formed by the same first mirror ( M-XY1) and / or wherein the second reflecting optical means (M-XY2) and the fourth reflecting optical means (M-XY2) are formed by the same second mirror (M-XY2).
[0004]
Optical scanning microscopy apparatus according to claim 3, wherein the first mirror (M-XY1) is mounted on an actuator (25) with two axes of rotation, for example of the piezoelectric or acoustic coil type, and / or in which the second mirror (M-XY2) is mounted on an actuator (26) with two axes of rotation, for example of the piezoelectric type or voice coil.
[0005]
An optical beam scanning microscopy apparatus according to claim 1 or 2 wherein the first reflecting optical means (M-X1, M-XY1) are formed of a first mirror (M-X1) and the second reflecting optical means (M-X2, M-XY2) are formed of a second mirror (M-X2) and / or in which the third reflecting optical means (M-Y1, M-XY1) are formed of a third mirror (M- Y1) and the fourth reflecting optical means (M-Y2, M-XY2) are formed of a fourth mirror (M-Y2).
[0006]
6. optical scanning scanning microscope apparatus according to claim 5 wherein the first mirror (M-X1) is mounted on an actuator (21) to an axis of rotation, for example galvanometric scanner type, the second mirror (M -X2) is mounted on an actuator (22) to an axis of rotation, the third mirror (M-Y1) is mounted on an actuator (23) to an axis of rotation and / or the fourth mirror (M-Y2) is mounted on an actuator (24) to an axis of rotation.
[0007]
7. Optical scanning microscope apparatus according to one of claims 4 or 6 wherein the actuator (21, 25) of the first mirror (M-XY1, M-X1) comprises a position sensor providing a signal of position and in which the actuator (22, 26) of the second mirror (M-XY2, M-X2) comprises a position sensor, the apparatus comprising a phase-locked loop system adapted to slave a control signal of the actuator (22, 26) of the second mirror (M-XY2) as a function of the position signal of the actuator (21, 25) of the first mirror (M-XY1) and / or in which the actuator (23) of the third mirror (M-Y1) comprises another position sensor providing another position signal and wherein the actuator (24) of the fourth mirror (M-Y2) comprises another position sensor, the apparatus comprising a system phase lock loop adapted to slave a control signal of the actuator (24) of the fourth mirror (M-Y2) according to the position signal of the actuator (23) of the third mirror (M-Y1).
[0008]
8. Optical scanning microscopy apparatus according to one of claims 1 to 7 wherein the second rotation angle (RX2) is a function of the first angle of rotation (RX1), the distance B between the first reflecting optical means (M-X1, M-XY1) and the second reflecting optical means (M-X2, M-XY2) and the distance A between the second reflecting optical means (M-X2, M-XY2) and the center (0) the entrance pupil of the microscope objective (1).
[0009]
An optical beam scanning microscopy apparatus according to one of claims 1 to 8 wherein said at least one light source (20) comprises one or more sources of the laser source and / or light emitting diode type.
[0010]
An optical beam scanning microscope apparatus according to one of claims 1 to 9, further comprising a beam expander (31) disposed between the light source (20) and the microscope objective (1), beam expander (31) having a fixed and / or variable magnification.
[0011]
An optical beam scanning microscopy apparatus according to one of claims 1 to 10, further comprising a viewing camera (9) adapted to form an image of the object plane (11) of the microscope objective and / or to visualize an area of a scan sample by optical beam scanning.
[0012]
The laser optical beam scanning microscopy apparatus according to one of claims 1 to 11, wherein the microscopy apparatus comprises a confocal hole (34) disposed in a plane optically conjugated with the object plane (11) and comprising means for collimating the optical beam (2) arranged between the at least one light source and the microscope objective to form a collimated optical beam, the first reflecting optical means (M-X1, M-XY1) and the second means reflective optics (M-X2, M-XY2) being arranged in series on the optical path of the collimated optical beam.
[0013]
13. Optical beam scanning microscopy apparatus according to one of claims 1 to 12 wherein the microscopy apparatus is combined with a Raman spectrometer, a coherent Raman anti-Stokes spectrometer, a fluorescence spectrometer, a photoluminescence spectrometer. , or a cathodoluminescence spectrometer adapted to measure and analyze a signal by reflection, transmission and / or scattering of the optical beam (2) on the sample as a function of angular displacement of the optical beam.
[0014]
14. Optical beam scanning microscopy method comprising the following steps: - emission of an optical beam (2) by means of a light source; - Optical reflection of said laser beam (2) on first reflecting optical means (M-X1, M-XY1) then on second reflecting optical means (M-X2, M-XY2) arranged in series on the optical path of the laser beam (2) between the light source and a microscope objective (1), - inclining said first reflecting optical means (M-X1, M-XY1) at a first predetermined angle of rotation (RX1), - inclining said second optical means reflectors (M-X2, M-XY2) at a second predetermined angle of rotation (RX2) as a function of the first angle of rotation (RX1), so as to angularly tilt the axis (12) of the optical beam (2) by pivoting around the center (0) of the pupil of the microscope objective (1), in a range of angles of inclination of the axis (12) of the optical beam (2) with respect to a longitudinal optical axis (10). ); and - focusing said optical beam (2) in an object plane (11) by means of said microscope objective (1), so as to move said optical beam (2) in at least one spatial direction (X) in the object plane ( 11).
[0015]
15. optical scanning scanning microscopy method according to the preceding claim further comprising the following steps: - optical reflection of said optical beam (2) on third reflecting optical means (M-Y1, M-XY1) and on fourth means reflective optics (M-Y2, M-XY2) arranged in series on the optical path of the laser beam (2) between the light source and said microscope objective (1); - inclining said third reflecting optical means (M-Y1, M-XY1) according to a predetermined third rotation angle (RY1), - inclining said fourth reflecting optical means (M-Y2, M-XY2) at a fourth angle of rotation ( RY2) according to the third angle of rotation (RY1), so as to angularly incline the axis (12) of the optical beam (2) by pivoting about the center (0) of the pupil of the microscope objective (1). ), in a range of angles of inclination of the axis (12) of the optical beam (2) with respect to a longitudinal optical axis (10); and - focusing said optical beam (2) in the object plane (11) by means of said microscope objective (1), so as to move said optical beam (2) in at least one other spatial direction (Y) in the object plane (11).

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优先权:

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