• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    Apparatus and method of online measurement of laser pulses with time-dependent polarization. An apparatus and method for online measurement of laser pulses with time-dependent polarization are described, which make it possible to carry out an online measurement of laser pulses whose polarization depends on time. For this, one or more polarization projections are selected: the spectrometer detects the projection on the extraordinary propagation axis of a birefringent system to measure the spectrum in said component, the projection on the ordinary propagation axis, to measure the spectrum in said component and finally a projection in an intermediate direction that allows to measure the interferential spectrum between the two components. The method allows extracting the temporal evolution of the pulse and its polarization state as a function of time, amplitudes and spectral phases of the various polarization projections of the beam. (Machine-translation by Google Translate, not legally binding)
    公开号:ES2680045A1
    申请号:ES201730215
    申请日:2017-02-20
    公开日:2018-09-03
    发明作者:Iñigo SOLA LARRAÑAGA；Benjamín ALONSO FERNÁNDEZ
    申请人:Universidad de Salamanca；
    IPC主号:
    专利说明:

    APPLIANCE AND METHOD OF MEASUREMENT IN LINE OF LASER PULSES WITH POLARIZATION DEPENDENT ON TIME
    DESCRIPTION
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    OBJECT OF THE INVENTION
    The object of the invention is framed in the field of Physics.
    More specifically, this document is directed to the online measurement of laser pulses 10 with time-dependent polarization and a method of in-line measurement of laser pulses with time-dependent polarization that allow an online measurement of laser pulses to be carried out whose polarization It depends on time, that is, it is variable over time over the duration of said pulse.
    15 BACKGROUND OF THE INVENTION
    In recent decades it has been possible to generate pulses of laser light of extremely short duration (over the range of the femtosecond, 10-15 s). This has led to the development of new techniques for measuring these pulses (autocorrelation, 20 SPIDER, FROG or d-scan, among others). These techniques have in common that they assume that the light is linearly polarized and that said state of polarization does not change along the pulse. Although this is common in these light sources, there are situations, in increasing number and interest, in which the light has a certain polarization that changes over time.
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    The first time polarization characterization technique in ultrafast range (femtosecond), known as "POLLIWOG", appears in 1997 in WJ Walecki, DN Fittinghoff, AL Smiri, and R. Trebino, "Characterization of the polarization state of weak ultrashort coherent signals by dual-channel spectral interferometry, "Optics 30 Letters 22, 81-83 (1997). In this work, use is made of spectral interferometry to obtain the phase difference between vertical and horizontal polarization components of the pulse under study by referring them to an auxiliary reference pulse (both in spectral phase and in polarization). This phase difference between components, together with the spectral amplitudes (measured with a spectrometer, for example), allow the
    polarization reconstruction as a function of time. The technique is based on a double channel configuration, measuring in each shot in each of these channels the phase difference of each pulse polarization component under study with the corresponding auxiliary reference pulse components.
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    Subsequently, another approach to the problem was presented using tomographic reconstruction in P. Schlup, O. Masihzadeh, L. Xu, R. Trebino, and RA Bartels, “Tomographic retrieval of the polarization state of an ultrafast laser pulse,” Optics Letters 33, 267 -269 (2008) It is based on measuring the temporal reconstruction of the pulses 10 in various linear polarization projections by means of some of the standard reconstruction techniques suitable only for said polarization, that is, they are not able to see the evolution of the polarization For example, two perpendicular projections and one at 45 ° are measured with respect to these, knowing the perpendicular, the phase between said components is adjusted to obtain the result of the intermediate projection at 15 45 ° In this adjustment process it is determined the phase that, with the previous data,
    allows to reconstruct the temporal evolution of polarization.
    Other optical techniques proposed in the literature are based on Talbot effect such as the detailed technique in CC Chen, and SD Yang, "All-optical self-referencing 20 measurement of vector optical arbitrary waveform," Optics Express 22, 28838-28844 (2014) , in polarimetry based on non-linear phase modulation as detailed in E. Lopez-Lago, and R. de la Fuente, "Measurement of the polarization dynamics of ultrashort pulses by using nonlinear phase modulation and channelled spectroscopic polarimetry," Journal of Optics A-Pure and Applied Optics 7, 400-403 (2005), or in 25 angle-multiplexed spatial-temporal interferometry as the detailed technique in A. Rakhman, MW Lin, and I. Jovanovic, "Angle-multiplexed spatial-spectral interferometry for simultaneous measurement of spectral phase and polarization state, "Optics Express 21, 26896-26907 (2013). Recently a technique based on attosecond streaking experiments using a reaction microscope has been proposed. This technique is detailed in R. Boge, S. Heuser, M. Sabbar, M. Lucchini, L. Gallmann, C. Cirelli, and U. Keller, "Revealing the time-dependent polarization of ultrashort pulses with sub-cycle resolution, "Optics Express 22, 26967-26975 (2014), besides being very complex and expensive, is very far from the concept of which it is presented.
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    The technique and apparatus of the present invention are based on an online configuration, in contrast to the dual configuration described above of WJ Walecki, DN Fittinghoff, AL Smirl, and R. Trebino, "Characterization of the polarization state of weak ultrashort coherent signals by dual-channel spectral interferometry, "Optics Letters 22, 8183 (1997). In the present invention, a second auxiliary reference beam is dispensed with, while one of the pulse polarization components under study plays the role of said reference. This allows an online configuration of the device, robust and simple, avoiding noise and instability (vibrations, drafts, etc.) associated with classic interferometers.
    DESCRIPTION OF THE INVENTION
    This document describes an apparatus that allows the characterization of light with polarization depending on the time that overcomes the disadvantages and disadvantages of the aforementioned, while providing not only greater stability against vibrations, but also is easier to align than the Known devices so far.
    In this way there is a first aspect of the invention corresponding to an apparatus for in-line measurement of laser pulses with time-dependent polarization that allows, among others:
    • Studies of dichroism, chirality and optical activity of species.
    • Studies of nonlinear polarization phenomena.
    • Application of nanoscale optical spectroscopy.
    • Studies of molecular systems through pulses modulated in polarization.
    • Quantum well studies.
    • Characterization of pulse trains in telecommunications.
    • Analysis of non-linear effects on light with time-dependent polarization.
    Also, there is a second aspect of the invention corresponding to a method of measuring laser pulses in line with time-dependent polarization. This measurement method is first carried out with a known polarization beam, in order to calibrate the spectral phases introduced by the measurement system. Next, the procedure to measure the beam to be analyzed is reproduced. Through a
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    auxiliary non-vector pulse reconstruction system (that is, presenting only one linear polarization component), the spectral phase of one of the two components of the beam (ordinary or extraordinary) is determined, which will act as a reference. Thanks to the delay between ordinary and extraordinary components introduced by a birefringent element and by means of a spectral interferometry reconstruction procedure using the previously measured data, the amplitudes and spectral phases of the two polarization components, ordinary and extraordinary, are extracted from the beam to analyze. Subsequently, by applying Fourier transformation to said spectral amplitudes and phases, the evolution of the ordinary and extraordinary components of the beam to be analyzed is temporarily reconstructed, thereby obtaining the polarization state of the time-dependent pulses of light.
    In order to carry out the method of the second aspect of the invention, a measurement process must be carried out which can be put into operation as follows:
    1. A measurement of the pulse spectrum is made with the linear polarizer positioned so that only the ordinary polarization component of the birefringent system (120) can pass through. In this way the spectrum of said component is known.
    2. A measurement of the pulse spectrum is made with the linear polarizer positioned so that only the extraordinary polarization component of the birefringent system can pass through. In this way the spectrum of said component is known.
    3. A measurement of the pulse spectrum is made with the linear polarizer placed at an angle between the vibration directions of the ordinary and extraordinary polarization components of the birefringent system (for example, 45 °). The spectral interferences in said spectrum contain information of the phase difference between both components.
    4. One of the two pulse polarization components is selected and its spectral phase is characterized by measuring it with a standard technique for pulse reconstruction with constant linear polarization (eg FROG, SPIDER, d-scan). In this way the reconstruction of the reference pulse is obtained. This selection can be made in several ways, for example, a linear polarizer can be used, which allows only the component to be measured to pass through.
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    Another example would be to measure it with the polarizer of the assembly by selecting the reference and measurement component by subtracting the dispersion that the birefringent element can provide or it can also have a Brewster angled surface, so that the reflected light will be polarized in perpendicular direction to the plane of incidence.
    5. With the data previously acquired, spectral interferometry reconstruction algorithms are used, such as those described in L. Lepetit, G. Cheriaux, and M. Joffre, "Linear techniques of phase measurement by femtosecond spectral interferometry for applications in spectroscopy, "Journal of the Optical Society of America B-Optical Physics 12, 2467-2474 (1995). In said reconstruction the reference pulse will be the previously reconstructed polarization component. In this way, the spectral phase of the second component will be obtained without ambiguity with respect to the first. This allows to know, by Fourier transformation, the state of polarization of the pulse as a function of time.
    Prior to a measurement, the device can be calibrated. For this, a pulse with known polarization will be measured (for example, a pulse with a linear polarization at 45 ° between the ordinary and extraordinary directions of the birefringent system). After carrying out the measurement process, the relative phase extracted between both components will be the calibration of the device, which must be subtracted from the measurements that are made. This calibration will be valid as long as the measurements are made with the beam aligned in the device in the same way and provided that the pulse to be measured does not have new spectral components with respect to the pulse used in the calibration.
    As indicated above to carry out a measurement of a problem pulse, the beam is aligned, ensuring that it is the same alignment as the calibration. Subsequently, and in a manner similar to that described above, a measurement is made with the polarizer parallel to the direction of the ordinary component of the birefringent element, a measurement with the polarizer parallel to the direction of the extraordinary component of the birefringent element and a measured with the polarizer in the middle direction (typically 45 °, but it could be another).
    It should also be noted that when assembling the device, it may be necessary to calibrate the spectrometer response (or monochromator, optical spectrum analyzer, spectral characterization system, etc.) preferably with polarization. For this, a linearly polarized beam can be used, to which the polarization is rotated (for example, by means of a half-wave delay sheet) and the signal measured by the spectrometer for the various orientations is recorded. This calibration can be done only once, it would be valid later, provided that the pulse to be measured does not have new spectral components with respect to the pulse used in the calibration.
    DESCRIPTION OF THE DRAWINGS
    To complement the description that is being made and in order to help a better understanding of the characteristics of the invention, according to a preferred example of practical implementation thereof, a set of said description is attached as an integral part of said description. Drawings where, for illustrative and non-limiting purposes, the following has been represented:
    Figure 1.- In Figure 1 a flow chart of the method of the second aspect of the invention can be seen while the different components to be used of the apparatus of the first aspect of the invention are appreciated.
    PREFERRED EMBODIMENT OF THE INVENTION
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    In a preferred embodiment of a first aspect of the invention there is an apparatus for in-line measurement of laser pulses with time-dependent polarization, apparatus comprising one or more, preferably one, sheets of birefringent material defining a birefringent system (120) , preferably with the optical axis 30 perpendicular to the direction of propagation of the beam, a linear polarizer (130) and a spectrometer (140) in the range of the spectrum of the beam to be measured acting as a spectral characterization system; in such a way that when passing light through the sheet its extraordinary and ordinary polarization components show a delay between them.
    In this way, the apparatus object of the first aspect of the invention is included, which comprises a sheet of birefringent material, with the optical axis perpendicular to the direction of propagation of a beam to be measured, means of spectral characterization of the light, such as it can be a spectrometer, in the range of the beam to be measured, and a linear polarizer adapted to select several polarization projections. The operation or implementation of said apparatus can be seen in Figure 1 where there is an incident beam (101) to be analyzed, which passes through a selection unit (110) to select a polarization component, which is a reference component (112) and lead it to a linear measurement unit (160) of linearly polarized pulses; by way of example, but not limitation, the selection unit (110) can be a surface that can be introduced into the optical path on which the beam (101) strikes Brewster's angle, a mirror that reflects the beam (101) and pass it through a non-linear polarizer with calibrated dispersion, etc.
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    This selection will be made only when you want to measure the reference component (112). When this selection is not made and a polarization measurement is made, an outgoing beam to analyze (111) arrives at a birefringent system (120) that decomposes into two polarization components, ordinary and extraordinary, traveling at different speeds 20 through the birefringent system (120). A resulting beam (121) of the passage through the birefringent system (120) crosses a linear polarizer (130) which will be oriented to select one or more polarization projections. The resulting light (131), which is linearly polarized with respect to certain directions of interest, will be coupled to a spectral analysis unit (140), such as a spectrometer (140), to carry out a spectral analysis in the range of the beam spectrum (101) incident to analyze. The resulting data (141) will be analyzed in a processing module (150).
    Said operation makes use of said linear polarizer (130) by means of which one or several polarization projections can be selected which the spectrometer 30 (140) will detect:
    • Projection in extraordinary wave direction: it allows measuring the spectrum in said component.
    • Projection in ordinary wave direction: allows to measure the spectrum in said component.
    • Projection in an intermediate direction (typically 45 °): it allows measuring the spectrum by presenting interference between the two delayed components that, through a Fourier filtering process, provides the phase difference between them, essential for the phase determination spectral of 5 each of the components, ordinary and extraordinary.
    In a preferred embodiment of a second aspect of the invention corresponding to a method of measuring laser pulses in line with polarization dependent on the time that the apparatus of the first aspect of the invention uses, the incident beam (101) must be passed to be analyzed through the birefringent system (120), to subsequently select the polarization projection in the ordinary direction of the birefringent medium by rotating the linear polarizer (130).
    Next, the polarization projection in the ordinary direction of the birefringent medium is then detected and measured by means of the spectrometer (140), to subsequently select the polarization projection in the extraordinary direction of the birefringent medium or birefringent system (120) by rotation of the linear polarizer (130). Once this is done, the polarization projection can be detected and measured using the spectrometer (140)
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    Once the polarization projection in a direction with ordinary and extraordinary components (for example, forming an angle of 45 ° with respect to them) of the birefringent medium by rotation of the linear polarizer (130) has been selected, it is then detected and measure the polarization projection with the interference structure between the two components by means of the spectrometer in order to be able to extract, using a spectral interferometry reconstruction algorithm, also using the spectra of the projections of the ordinary and extraordinary components measured in the previous steps, the amplitude of the ordinary and extraordinary components of the beam to be analyzed and the difference between its spectral phases 30 after having passed through the birefringent system.
    Additionally, the device can be calibrated with a polarized beam in a known way, for example, linearly with projections in the ordinary and extraordinary propagation components in the birefringent medium, to determine
    the lags of the two components, ordinary and extraordinary, in said birefringent material.
    Additionally, the method of inline measurement of laser pulses with time-dependent polarization of the invention may comprise eliminating the contribution due to the birefringent system to the difference in spectral phases between the ordinary and extraordinary components after the birefringent material, obtained as and as detailed above, thus extracting the difference of spectral phases between the ordinary and extraordinary polarization components before passing through the birefringent material.
    Next, it is preferably selected, by way of example, but not limitation, prior to the birefringent system (120) one of the polarization components, these being an ordinary component and an extraordinary component with respect to the birefringent system, to subsequently measure the spectral phase of the reference component selected above. The measurement of the spectral phase of the reference component of the step can be carried out by means of a constant polarization pulse reconstruction technique, such as FROG, SPIDER and d-scan
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    Additionally, the difference in spectral phases between the ordinary and extraordinary components before passing through the birefringent material, obtained as previously indicated, is added to the spectral phase of the reference component, thus calculating the spectral phase of the Another 25 polarization component. From these spectral phases and the spectra of the projections of the ordinary and extraordinary polarization components of the beam (101) measured as previously detailed, the complex spectral amplitudes of the projections of the ordinary and extraordinary polarization components are calculated of the beam (101). Once this is done, the evolution of the ordinary and extraordinary components of the beam to be analyzed can be temporarily reconstructed (101) with the Fourier transformation of said complex spectral amplitudes, obtaining the polarization state for each moment of the pulse.
    权利要求:
    Claims (5)
    [1]
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    1. Laser pulse line measuring device with time-dependent polarization, an apparatus characterized in that it comprises:
    - a selection unit (101) intended to select a polarization component that is a reference component (112) and lead it to a standard characterization unit (160) of linearly polarized pulses for temporal characterization,
    - a birefringent system (120) which in turn can comprise at least one sheet of birefringent material, with the optical axis preferably perpendicular to the direction of propagation of a beam to be analyzed incident (111), so that it decomposes in two polarization components, ordinary and extraordinary, traveling at different speeds through the birefringent system (120),
    - a linear polarizer (130) adapted to select several polarization projections,
    - a spectral analysis unit (140) in the range of the spectrum of the beam to be measured, and
    - a module for processing (150) of resulting data (141) of the spectral analysis unit (140).
    [2]
    2. Method for measuring laser pulses in line with time-dependent polarization using the apparatus described in claim 1, the method being characterized in that it comprises:
    i. pass incident beam (101) to be analyzed through the birefringent system (120),
    ii. select the polarization projection in the ordinary direction of the birefringent medium by rotating the linear polarizer (130),
    iii. detect and measure the polarization projection by means of the spectral analysis unit (140),
    iv. select the polarization projection in the extraordinary direction of the birefringent system (120) by rotating the linear polarizer (130),
    v. detect and measure the polarization projection by means of the spectral analysis unit (140),
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    saw. select the polarization projection in one direction with ordinary and extraordinary components of the birefringent system (120) by rotating the linear polarizer (130),
    vii. detect and measure the projection of polarization with the spectral interference structure between the two components using the spectrometer,
    viii preferably, prior to the birefringent system (120), select one of the polarization components, these being an ordinary component and an extraordinary component defined with respect to the birefringent system,
    ix. measure the spectral phase of the reference component selected from the previous step, and
    x. extract, using a spectral interferometry reconstruction algorithm, using the data obtained in the previous steps, the amplitude of the ordinary and extraordinary components of the beam (121) and the difference between its spectral phases after having passed through the birefringent system (120 ).
    [3]
    3. In-line measurement method of laser pulses with time-dependent polarization according to claim 2, wherein the measurement of the reference component of step ix is carried out by a pulse reconstruction technique with constant linear polarization, such as for example FROG, SPIDER and d-scan.
    [4]
    4. In-line measurement method of laser pulses with polarization dependent on
    time, according to claim 2, the method being characterized in that
    It further comprises carrying out a calibration of the apparatus described in claim 1 with a polarized beam in a known manner, for example linearly with projections in the ordinary and extraordinary propagation components in the birefringent medium, to determine the phase shifts of the two components, ordinary and extraordinary , introduced by the birefringent material of the birefringent system (120).
    [5]
    5. In-line measurement method of laser pulses with polarization dependent on
    time, according to claim 2, the method being characterized in that
    Additionally it includes the following steps:
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    i. subtract the spectral phase difference between ordinary and extraordinary beam components (121) after the birefringent system (120), obtained by means of a spectral interferometry reconstruction algorithm according to step x, the contribution to the spectral phase corresponding to a delay between the components and their dispersion due to the birefringent system (120), obtained by calibration, thereby isolating the phase difference between ordinary and extraordinary beam components (101) before the birefringent system (120),
    ii. add to the difference of spectral phases between ordinary and extraordinary components obtained in the previous step, the spectral phase of the reference component, with which the spectral phase of the ordinary component and / or extraordinary component is calculated,
    iii. calculate the spectral amplitudes and phases of the two polarization components, ordinary and extraordinary, of the beam to be analyzed (101) from the data obtained in the previous step and the measurements of the spectral intensities of each beam component (101) ,
    iv. temporarily reconstruct the evolution of the ordinary and extraordinary components of the beam to be analyzed (101) from the results of the previous step and its Fourier transform and,
    v. Obtain, from the data obtained in the previous step, the temporal evolution of the incident pulse (101) and its polarization state by means of the vector sum of the evolution of the ordinary and extraordinary components obtained for the beam to be analyzed (101) .
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    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    WO2011117873A1|2010-03-24|2011-09-29|Yeda Research And Development Co. Ltd|System and method for polarization measurement|
    US5936732A|1997-07-24|1999-08-10|Smirl; Arthur|Apparatus and method for characterizing ultrafast polarization varying optical pulses|
    EP1417449A1|2001-07-23|2004-05-12|University of Rochester|Optical pulse measurement|
    GB0510338D0|2005-05-20|2005-06-29|Isis Innovation|Electromagnetic radiation pulse measurement apparatus and method|
    WO2013161282A1|2012-04-26|2013-10-31|大学共同利用機関法人自然科学研究機構|Optical pulse intensity and phase measurement device and method|
    EP3062075A1|2015-02-06|2016-08-31|Universitat Politécnica De Catalunya|Optical system and method for ultrashort laser pulse characterization|
    WO2018029615A1|2016-08-10|2018-02-15|Sphere Ultrafast Photonics, S.A.|Ultrashort laser pulse characterization and compression method|CN110646102B|2019-10-17|2021-05-11|南昌大学|full-Stokes single photon compression polarization imaging device and method|
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    ES201730215A|ES2680045B1|2017-02-20|2017-02-20|APPARATUS AND METHOD OF MEASUREMENT IN LINE OF LASER PULSES WITH POLARIZATION DEPENDENT ON TIME|ES201730215A| ES2680045B1|2017-02-20|2017-02-20|APPARATUS AND METHOD OF MEASUREMENT IN LINE OF LASER PULSES WITH POLARIZATION DEPENDENT ON TIME|
    PCT/ES2018/070116| WO2018150071A1|2017-02-20|2018-02-20|Apparatus and method for the online measurement of laser pulses with time-dependent polarisation|
    US16/484,605| US11105687B2|2017-02-20|2018-02-20|Apparatus and method for in-line measurement of laser pulses with time-dependent polarization|
    EP18719956.7A| EP3584552A1|2017-02-20|2018-02-20|Apparatus and method for the online measurement of laser pulses with time-dependent polarisation|
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