• 专利附录
  • 专利说明
  • 权利要求
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    • 专利摘要:
    inspection system and methods based on high energy x-ray spectroscopy to determine the atomic number of materials. The application reveals systems and methods for x-ray scanning to identify material composition of an object being scanned. the system includes at least one x-ray source for projecting an x-ray beam onto the object, where at least a portion of the projected x-ray beam is transmitted through the object, and an array of detectors for measuring ray energy spectra. x transmitted. the measured energy spectra are used to determine the object's atomic number to identify the object's material composition. the x-ray scanning system can also have a set of collimated high-energy backscattered x-ray detectors to measure the energy spectrum of x-rays scattered across the object at an angle greater than 90 degrees, where the measured energy spectrum is used in combination with the energy transmission spectrum to determine the object's atomic numbers to identify the object's material composition.
    公开号:BR112012021520B1
    申请号:R112012021520-5
    申请日:2011-02-23
    公开日:2021-06-22
    发明作者:Joseph Bendahan；Craig Mathew Brown；Tsahi Gozani；Willem Gerhardus Johannes Langeveld；John David Stevenson
    申请人:Rapiscan Systems, Inc.；
    IPC主号:
    专利说明:

    CROSS REFERENCE
    [001] This descriptive report relies on provisional patent application US 61/308,152, filed on February 25, 2010 for priority and is incorporated into this application in its entirety by reference. FIELD OF THE INVENTION
    [002] This descriptive report generally concerns the field of radiant energy imaging systems, and more specifically to a system that makes use of the full spectrum of transmitted or emitted and scattered X-ray energies for improved determination of the number atomic of materials, such as objects in cargo containers. BACKGROUND OF THE INVENTION
    [003] X-ray inspection systems are currently limited in their ability to detect and distinguish contraband, drugs, weapons, explosives and other items of interest hidden in cargo from benign materials. There is additionally an interest in inspecting cargo for manifest verification purposes to ensure that proper customs duty is paid.
    [004] The intensity of the transmitted X-rays is related to the areal density (ie density x thickness) and the atomic number (Z) of the materials they pass through. Radiographs produced by conventional X-ray systems are often difficult to interpret because objects are superimposed and no Z information is provided. Therefore, a trained operator must study and interpret each image to give an opinion as to whether a target of interest, or threat, is present or not. When a large number of such radiographs are to be interpreted, such as at high traffic transit points and ports, these inherent difficulties, combined with operator/examiner fatigue and distraction, can compromise detection performance. There is a need for automatic detection and/or examiner aid tools for detecting threats and other targets, in order to improve the efficiency and accuracy of operators, and to reduce the number of operators required for detection.
    [005] Methods known to those skilled in the art to obtain useful Z information include the use of dual energy X-ray sources, and dual-species technologies (X-ray inspection combined with neutron inspection). However, these methods do not readily allow accurate determination of the actual Z of charge contents, but instead produce a Z average that represents a mixture of the various materials in the X-ray beam path. Thus, these methods are not efficient.
    [006] Therefore, X-ray inspection systems currently available in the art provide limited accuracy for detecting items of interest. Additionally, these systems do not effectively detect high atomic number (“High Z”) materials. Detecting such materials, particularly smuggled special nuclear materials (SNM) that could potentially be used to make a weapon, or materials used to protect their radioactive emissions, is a very complex task. One of the materials of greatest concern, highly enriched uranium (HEU), has a relatively low level of radioactivity. Plutonium, another material suitable for nuclear weapons, has a higher specific activity and higher energy emissions. However, it can be protected by employing a combination of high Z materials for gamma ray absorbers and low atomic number ("low Z") shielding neutrons to protect neutrons produced by spontaneous fission. Thus, it is very difficult to detect protected or hidden material.
    [007] Therefore, it is desirable to have improved methods and systems to effectively detect high Z materials, particularly considering the possibility that such materials may be protected by a combination of high Z materials to low Z neutron and gamma ray absorbers. protection to protect neutrons. SUMMARY OF THE INVENTION
    [008] In one embodiment, the application reveals an X-ray scanning system to identify the material composition of an object being scanned. The system comprises: [We will incorporate claims literally once approved]
    [009] The aforementioned modalities and others herein will be described in greater depth in the drawings and detailed description provided below. BRIEF DESCRIPTION OF THE DRAWINGS
    [0010] These and other features and advantages of this descriptive report will be further realized as they become better understood by reference to the detailed description when considered in connection with the accompanying drawings:
    [0011] Figure 1 illustrates the normalized intensity of an X-ray beam transmitted per unit of energy in relation to the energy, in MeV, for different absorbers;
    [0012] Figure 2 illustrates a spectral ratio of the amplitudes of the low and high energy regions in the transmission spectrum shown in Figure 1, plotted against atomic number;
    [0013] Figure 3 illustrates the X-ray transmission spectroscopy system scanning a cargo container, according to an embodiment of the present invention;
    [0014] Figure 4 illustrates the X-ray transmission spectroscopy system scanning a cargo container, according to another embodiment of the present invention; and
    [0015] Figure 5 illustrates an exemplary data stream for said X-ray transmission spectroscopy system. DESCRIPTION OF THE INVENTION
    [0016] The present specification is an improved method of examining cargo that uses spectroscopic information only from the transmitted high-energy X-ray beam, or from both the transmitted and the scattered, to provide improved detection capabilities for contraband, threats and other targets of interest, which are difficult to detect with current X-ray methods and/or by passive radiation detection techniques known in practice. The system of the present invention provides improved detection performance for objects of interest automatically or as a tool to assist an operator, while at the same time reducing the false alarm rate.
    [0017] In general, for a given thickness of an absorber, the greater the atomic number, the greater the attenuation of the high quality of the X-ray spectrum. Therefore, the transmitted X-ray spectrum is affected by variations in the atomic number of items of various materials within the load.
    [0018] This descriptive report detects and measures the total energy spectrum of X-rays transmitted or emitted and scattered, and identifies materials that are in the beam path and their likely atomic numbers and areal density. The energy spectrum of X-rays transmitted through a charge and scattered through it contains an abundance of information regarding the material properties of the charge they traversed. Theoretical analysis and real-world measurements demonstrate that the X-ray spectrum of transmitted X-rays is very sensitive to the Z of charge materials.
    [0019] The present invention relates to multiple embodiments. The following disclosure is provided in order to enable a person having ordinary knowledge in the art to practice the invention. The language used in this descriptive report should not be construed as general disapproval of any specific modality or used to limit the claims beyond the meaning of the terms used in them. The general principles defined in this document can be applied to other modalities and applications without departing from the spirit and scope of the invention. Also, the terminology and phraseology used are for the purpose of describing exemplary modalities and should not be considered limiting. Thus, the present invention is to be accorded the broadest scope encompassing numerous alternatives, modifications and equivalences consistent with the disclosed principles and features. For purposes of clarity, details relating to technical material which is known in the technical fields relating to the invention have not been described in detail in order not to unnecessarily obscure the present invention.
    [0020] Referring to Fig. 1, the normalized intensity of the beam of X-rays transmitted per unit of energy 115 is shown in relation to the energy, in MeV, 105 for different absorbers. As shown, for 9 MV X-ray transmission spectra, carbon (Z=6) has a very different spectrum from that of uranium (Z=92). Referring to Figure 2, a spectral ratio 205 of the amplitudes of the low and high energy regions in the transmission spectrum (shown in Figure 1), plotted against the atomic number 215, is shown, demonstrating a very high sensitivity 225.
    [0021] Referring to Figure 3, the X-ray transmission spectroscopy system 300 of the present invention is shown sweeping a cargo container 305. The system 300 employs a collimated X-ray source 335 and measures the energy spectra of the 315 transmitted X-rays using the 325 fast spectroscopic detectors with predetermined energy resolution. The greater the energy of the 335 X-ray source, the stronger the effect. In another embodiment, system 300 measures the energy spectrum of X-rays 315 scattered at a small angle to the original X-ray direction. It should be noted that the X-ray source can be of any energy level, but preferably it is an energy level of 1 MeV or more. Additionally, the X-ray source may be a pulsed source such as a linear electron accelerator, a continuous X-ray emission source, an intensity modulated X-ray source such as that disclosed in US patent application 12/484,172 which is incorporated herein by reference, or any other type of X-ray source, and may use any beam geometry, including pencil, fan, cone, or other beam geometry.
    [0022] Referring to Figure 4, in another embodiment of the present invention, a system 400 measures both the transmitted X-ray energy spectrum and the wide angle scattered energy spectrum (>90°). Measuring both sets of spectra simultaneously further improves the Z sensitivity of system 400. In Figure 4, X-ray transmission spectroscopy system 400 is shown sweeping a cargo container 405. System 400 employs the ray sources X 435 and measures the energy spectra of transmitted X-rays 415 using the 425 fast spectroscopic detectors with predetermined energy resolution. System 400 also measures the energy spectra of the 465 backscattered X-rays with respect to the original X-ray direction, as determined using 445 X-ray shielding and collimation, using the 495 collimated high-energy backscattered X-ray detectors. Energy spectra of part of the X-rays scattered at an angle greater than 90 degrees are measured in addition to the transmitted energy spectra. Information from the two sets of X-ray-derived spectra 415, 465 can be combined to greatly increase the sensitivity of Z. In this modality, collimated detectors 495 are used, which measure the energy spectra of high-backscattered X-ray radiation. energy 465. By way of example, it may be necessary to move the cone of vision up or down in order to sweep a full slice of the charge illuminated by the fanned X-ray beam. Other scanning approaches are possible.
    [0023] The proposed method can be used with pulsed X-ray sources, using, for example, linear electron accelerators (linacs), as well as CW (continuous wave) X-ray sources. Conventional linacs produce X-rays in short bursts of radiation (usually less than 5 µs). In this case, the instantaneous rate of X-rays arriving at the detector during the pulse can be very high. This rate is especially high when charge is not present (“in the air”) and for lightly loaded containers where X-ray transmission is high. If the counting rate is high enough, it is possible that the signals in the X-ray detector because of two or more X-rays overlap in time in such a way that the energy of the individual X-rays cannot be reliably measured. This effect is exacerbated if X-ray detectors and their reading systems are not fast enough. Even in this case, however, material discrimination is still possible within the range of X-ray attenuations by load where the count rate does not exceed this threshold. Alternatively, a shield can be placed in front of the detectors in order to reduce the counting rate, but this can be done at the cost of being able to perform spectroscopy at high attenuation.
    [0024] CW sources produce X-rays continuously in time. For such sources, the instantaneous count rate is less than for pulsed sources with the same (integrated) output. This allows to extend the applicability of the present method to a wider range of load attenuations.
    [0025] In an embodiment of the present invention, a secondary set of very fast detectors is used to obtain spectral information, in addition to the set of primary detectors used for radiography. The first set of detectors, which generates a high-resolution radiographic image, may be slower than the second set of detectors and does not need to measure spectra. In this way, very fast detectors can be used for transmission spectroscopy, eg plastic scintillators with photomultiplier tubes. In a system like this, the spatial resolution of the spectroscopic system may not match that of the radiography system, for example, because if photomultiplier tubes are used they tend to be relatively large compared to photodiodes typically used for radiography. The spectroscopic set can be placed beside the radiographic set, or behind it. In this modality, the traditional high resolution radiographic image is maintained with a lower resolution spectroscopic image. This can provide a good trade-off between capacity and cost.
    [0026] In another modality of the system, for example, in a mobile system with a much lower penetration requirement, lower but more dense scintillating materials can be used, such as LaBr3 (Lanthanum Bromide) or LYSO (Orthosilicate of Yttrium Lutetius). This allows to make compact transmission spectroscopy detectors with better spatial resolution. In this modality, the imaging and transmission spectroscopy sets can be combined into a single set, as these scintillating materials are also suitable for use in the primary imaging system.
    [0027] Detector sets that are used only for imaging usually employ slow scintillators, such as CsI (Cesium Iodide) or CdWO4 (Cadmium Tungstate), with polarized PIN photodiodes that are used in "integration" mode, i.e., they measure the total amount of energy deposited on them during an accelerating pulse when a pulsed source is used, or during a fixed period of time when a CW source is used. Imaging detector sets that are also used for transmission spectroscopy should use dense but faster scintillators, such as the aforementioned LaBr3 or LYSO, and a faster light detector, such as a polarized PIN diode. Alternative modalities include use of avalanche photodiodes and/or silicon drift detectors. It should be noted, however, that any detector material and reading method can be used as long as they are fast enough for the intended purposes as described in this document. This includes any scintillator/photodetector combination, as well as any semiconductor device suitable for detecting X-rays and measuring their energy, provided they are fast enough for the intended purposes as described in this document.
    [0028] Combining the sets of detectors enables high resolution radiography and transmission spectroscopy with a single set of detectors. One disadvantage is the potentially high cost of a large number of spectroscopic channels. If high resolution radiographic images are not required, large detectors can be used.
    [0029] Regardless of the detectors used, the spectroscopic information is analyzed using one of at least two analysis methods. In the first case, material separation is achieved employing various spectral features. X-ray transmission spectra are normalized by dividing each spectrum by the transmitted X-rays or total measured energy flow. Using a normalization method like this, the spectral shapes are unique for each Z of material. This approach provides a good separation of high Z materials from lower Z materials, as the spectra have distinctively different peak locations, intensities, widths, statistical skew, and other features. For example, the average spectral energies of high-Z materials are smaller, and the peaks are narrower and have greater amplitudes. There is very good separation between medium Z (eg iron) and high Z materials, and between medium Z and hydrogenated materials. An example of the Z-dependence of a spectral feature (in this case the ratio of the amplitudes of the lowest and highest energy regions of the spectrum) is shown in Figure 2. There is a very strong correlation between the feature selected here and the atomic number.
    [0030] In an alternative analysis method, the spectrum for at least one detector is fitted into an expected spectrum. The expected spectrum is computed from the incident X-ray spectrum produced by the source by calculating the X-ray spectrum attenuated through specific materials and correcting the data as a function of the detector response. The areal densities of the candidate materials are fitting parameters. In this approach, an initial material composition estimate is computed based on the observed transmission. With a list of constraints, including non-negative thickness, a least squares (or other) statistical minimization is performed until the difference between the computed and observed spectra is minimized. In some embodiments, minimization is performed in two or more steps. In the first step, a small number of material parameters are used to serve as an estimate, and in subsequent iterations an increasing number of material parameters are used. In the final iteration all materials in the considered set are used.
    [0031] In both methods of analysis, results are given as combinations of areal densities of materials that are likely to be present in the load, for example, and not limited to such values or materials, 100 grams/cm2 of wood and 50 grams/cm2 of steel.
    [0032] In principle, employing detectors with sufficient energy resolution and with high count statistics, it is possible to determine the complete elementary composition of the charge along the beam path. In practice (with current technology), materials with similar atomic numbers cannot be easily distinguished. Typical detection groups include organic materials, or low Z: (Z<10), medium-low Z: 11<Z<19, medium Z: 20<Z<39, medium-high Z: 40<Z<72, and High Z: (Z>73) . The number of Z groups and their limits can be chosen in different modes, based on the energy of the X-ray generating source, whether it is pulsed or continuous, its intensity, the type and size of the spectroscopic detectors, inspection time, etc. .
    [0033] The technology described above provides a system and methods for achieving improved material discrimination employing X-rays. The system and methods of this invention improve detection of contraband, threats and other targets, allow easier cargo manifest verification and facilitate detection automatic. These technical advantages translate to increased operator accuracy and efficiency, resulting in a reduction in human resources, increased smuggling interdiction and increased customs duty revenues.
    [0034] The above examples are only illustrative of the many applications of the system of the present invention. Although only a few embodiments of the present invention have been described herein, it is to be understood that the present invention may be incorporated in many other specific forms without departing from the spirit or scope of the invention. Therefore, the present examples and embodiments are to be considered as illustrative and not restrictive, and the invention may be modified within the scope of the appended claims.
    权利要求:
    Claims (20)
    [0001]
    1. X-ray scanning system (400) for identifying material composition of an object (405) being scanned, comprising: a) at least one X-ray source (435) for projecting an X-ray beam (415) onto the object, at least a portion of the projected X-ray beam (415) being transmitted through the object; b) at least one set of detectors (425) for measuring energy spectra of transmitted X-rays; and c) a processor for identifying the material composition of said object, characterized in that said processor determines the material composition using said spectra by: i. receive said energy spectra, ii. normalize said energy spectra using a value, and iii. determine the material composition of the object based on said normalized energy spectra and a plurality of known spectra, or i. receiving said energy spectra; ii. fitting at least one of said energy spectra into an expected energy spectrum, wherein said expected energy spectrum is at least one of a plurality of previously measured X-ray spectra generated by transmitting and detecting X-rays through known materials and correcting said detected X-rays to account for variations in detectors; and iii. identify the material composition of the object based on said fitting.
    [0002]
    2. System (400) according to claim 1, characterized in that said identification of the material composition comprises at least one of determining an atomic number of at least one material in said object, determining a range of atomic numbers of at least one material in said object or determining an areal density of at least one material in said object.
    [0003]
    3. System (400) according to claim 1, characterized in that said normalized energy spectra are compared to the plurality of known spectra and in which the material composition is identified based on said comparison.
    [0004]
    4. System (400) according to claim 1, characterized in that the at least one set of detectors (425) also detects said transmitted X-rays and generates a transmission image.
    [0005]
    5. System (400) according to claim 4, characterized in that the processor determines the composition of material using said spectra and said transmission image.
    [0006]
    6. System (400) according to claim 4, further comprising a set of collimated X-ray detectors (425) (495) for measuring X-ray energy spectra scattered by the object at an angle greater than 90 degrees to detect and measure backscattered X-rays and generate backscatter data from it.
    [0007]
    7. System (400) according to claim 6, characterized in that the processor determines the composition of material using said spectra, said backscatter data and said transmission image.
    [0008]
    8. System (400) according to claim 1, characterized in that it further comprises a second set of detectors (425) to detect said transmitted X-rays and generate a transmission image.
    [0009]
    9. System (400) according to claim 8, characterized in that the at least one set of detectors (425) has a spatial resolution lower than that of the second set of detectors (425).
    [0010]
    10. System (400) according to claim 8, characterized in that data generated by the second set of detectors (425) are not subject to spectroscopic analysis.
    [0011]
    11. System (400) according to claim 8, characterized in that the processor determines the composition of material using said spectra and said transmission image.
    [0012]
    12. System (400) according to claim 8, characterized in that the at least one set of detectors (425) is positioned behind, in front of or beside the second set of detectors (425).
    [0013]
    13. System (400) according to claim 8, further comprising a set of collimated backscatter X-ray detectors to measure X-ray energy spectra scattered by the object at an angle greater than 90 degrees and generate backscatter data from this.
    [0014]
    14. System (400) according to claim 13, characterized in that the processor determines the composition of material using said spectra, said backscatter data and said transmission image.
    [0015]
    15. System (400) according to claim 1, characterized in that the at least one set of detectors comprises at least one of fast spectroscopic detectors, a scintillating material comprising plastic, a scintillating material comprising LaBr3 (Lanthanum Bromide) or a scintillating material comprising LYSO (Yttrium Lutetium Orthosilicate).
    [0016]
    16. System (400) according to claim 1, characterized by the fact that the X-ray beam (415) has a pencil shape, fan shape or conical shape.
    [0017]
    17. System (400) according to claim 1, characterized in that the x-ray source comprises at least one of a continuous x-ray source, pulsed x-ray source, intensity-modulated x-ray source, accelerator linear electron or X-ray source having an energy level of 1 MeV or more.
    [0018]
    18. System (400) according to claim 1, characterized in that said processor generates a first estimate of said material composition based on at least one of said transmitted X-ray spectra and not based on said socket .
    [0019]
    19. System (400) according to claim 1, characterized in that said processor identifies the material composition of the object by minimizing differences between at least one of said transmitted X-ray spectra and said expected energy spectrum.
    [0020]
    20. System (400) according to claim 1, characterized by the fact that each of said expected energy spectra is specific for a particular material.
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    法律状态:
    2019-01-08| B06F| Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]|
    2019-08-13| B06U| Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]|
    2020-03-31| B07A| Technical examination (opinion): publication of technical examination (opinion) [chapter 7.1 patent gazette]|
    2020-10-27| B07A| Technical examination (opinion): publication of technical examination (opinion) [chapter 7.1 patent gazette]|
    2021-04-20| B09A| Decision: intention to grant [chapter 9.1 patent gazette]|
    2021-06-01| B350| Update of information on the portal [chapter 15.35 patent gazette]|
    2021-06-22| B16A| Patent or certificate of addition of invention granted|Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 23/02/2011, OBSERVADAS AS CONDICOES LEGAIS. PATENTE CONCEDIDA CONFORME ADI 5.529/DF, , QUE DETERMINA A ALTERACAO DO PRAZO DE CONCESSAO. |
    优先权:
    申请号 | 申请日 | 专利标题
    US30815210P| true| 2010-02-25|2010-02-25|
    US61/308,152|2010-02-25|
    PCT/US2011/025969|WO2011106463A1|2010-02-25|2011-02-23|A high-energy x-ray spectroscopy-based inspection system and methods to determine the atomic number of materials|
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